Wafer Probers

Integrated Test System - DC test system mounted in left-side bay of RI-EG 2001 class prober. This configuration saves on valuable floor space while still providing full parametric capabilities. Once prober no longer meets wafer size or resolution needs, the tester can be easily moved to an RI-35 cabinet. ...more

Software - Acquire provides production operator interface and control of automatic probers. The Acquire application is also used to setup the die and intradie probing patterns for the wafers; this includes which tests to run at each probe site. ...more

TestEdge offers complete wafer sort solutions. Our range of wafer sort capabilities demonstrates our ability to handle a wide range of devices and device characteristics. State of the art Electroglas probers Sort experience with high probe count Less than 4 mil pitch on probes Experience with C4 Bump and Aluminum pad Experience on Bipolar, CMO ...more

Test your devices at temperatures from 4 to 400 K. Probing as simple as standard wafer-level probers. ...more

SUSS MicroTec has made the fastest wafer-level solution for testing discrete devices even better. The BlueRay™ probe system is now the only probe system in the world that can be upgraded from a semiautomatic to a fully-automated wafer prober in the field and in only a couple of hours. To meet growing production demands, a unique, wafer-handling rob ...more

The Model 323, Wafer Area Prober System is designed to work with wafers up to 300 mm (12"). The system is available with integrated video microscope and specially designed dark box to make for easy access and small footprint. ...more

This is a double side wafer prober, developed to be a low-cost manual version of the WS50. All checks, from mounting the wafer to driving the stages, including checks for the positioning of pins, the pressure of pins on the chip, and scrub mark, can be performed manually.  ...more

SUSS MicroTec has made the fastest wafer-level solution for testing discrete devices even better. The BlueRay probe system is now the only probe system in the world that can be upgraded from a semiautomatic to a fully-automated wafer prober in the field and in only a couple of hours.  ...more

This software tool brings wafer level calibration to a new level. Designed to facilitate, simplify and automate the complicated task of the HF measurement system calibration, it can be used in conjunction with all types of probe systems. 50x faster than manual calibration, SussCal controls the prober for positioning the calibration substrate(s ...more

DTS has a full line of standard PIBs for all major tester platforms. Custom PIB designs can accommodate any test head, prober and manipulator configuration, including probe card changers, overhead direct dock setups and cable interfaces. ...more

Chroma 58153 LED Wafer/Chip Prober System is a precision machine specifically designed for probing applications involving LED or Laser Diode wafers/chips from 2" to 8". A state of the art vision system with industrial camera, video capture board, and image processing software is incorporated in the 58153 prober system to support high ...more

Since the WS50 provides ideal test methods for testing high-voltage devices, it is capable of high-accuracy testing and high reliability using a newly-developed contact method for both sides probing wafers.  ...more

inTEST direct-dock wafer probing interfaces give you the best of both worlds, combining the highest performance electrical interconnect components with the most dependable mechanical assemblies. We work closely with the major test and wafer prober manufacturers to design our products into their probing platforms, ensuring compatible form, fit, ...more

Developed to meet the critical needs of 90 nm or smaller process technologies used by semiconductor manufacturers, the SUSS PM8WLR probe system provides long-term process reliability measurements at temperatures up to 300°C. The prober itself is built using SUSS renowned stability, and provides the ideal platform for long-term measurements at ...more

DB Design Group offers the Vac-Lock Docking System for test floor equipment docking. Hard docking is often required between the test head and device handler or wafer prober. ...more

The AWP 2000, semi-automatic prober, is a highly versatile, general-purpose tool that is easily adaptable for multiple applications such as failure analysis, WLR, QRA and characterization. Based upon Wentworths proven AWP probe station platform, the AWP 2000 delivers optimum probing performance for 2-inch to 8-inch full and partial wafers ...more

Automatic KLA wafer probers with tray-to-tray-wafer-handling are operated 24h a day and 7 days a week. Data retention bake/tests are done at wafer level ...more

Tokyo Seimitsu, now known as Accretech, has continued to lead the semiconductor industry as the world's number one manufacturer of wafer probing machines. The newly developed UF2000 high-precision 200mm wafer prober is designed for devices with decreasing pad pitches typified by LCD drivers and other such devices, and features enhanced functionalit ...more

The AWP 2803 DSP, semi-automatic prober, is ideal for the simultaneous, dual-side probing of devices such as high-power MOSFETs. Based on Wentworths highly versatile AWP probe station platform, the AWP 2803 DSP delivers optimum probing performance for 3-inch to 6-inch wafers. ...more

The MP 1008, manual prober for 8-inch wafers, is a versatile and economical solution for general diagnostic probing, engineering test and failure analysis of microcircuits. Featuring precision XY stage motion and micrometer control of the probing platform, the MP 1008 may be used with both 4.5-inch and 6-inch wide probe cards, in some instance ...more

Each system provides a complete solution for a specific test application, including accessories, test instruments and instructions. ...more

The APS 80 DSP, automatic double-sided prober for 2-inch to 6-inch wafers, is ideal for high volume, double-sided wafer applications such as power device production. User-friendly LabMaster-derived system software delivers push button simplicity with a full complement of control parameters, including real-time yield analysis of both the wafer ...more

Available wafer probers for sale. ...more

The PML 8000, analytical prober, delivers an economical 8-inch probing platform for failure analysis, device characterization and inline process verification. Its compact base design and extensive feature set are ideally suited for diverse applications, including small geometry probing, applications using high power optics, design debug, wafer ...more

The SA-6 is a fast, reliable and economical tabletop semiautomatic probing system for wafers 150 mm and smaller. The SA-6 is easy to setup and operate. ...more