VLSI

The T6575/6565/6535 achieves significantly higher driver voltage than that of the T6500 series. Therefore, stress tests can be easily performed. Further, by adding an optional high voltage power supply, the T6575/6565/6535 can also perform blown fuse and high stress voltage tests, the specialty of the T3300 series test systems. Therefore, the ...more

In all respects, J-2000 series are improved version of J-1000 and has a view of the higher density PCBs. Unique pin technology makes it possible to probe all the hole rounds and SMD pads on multilayer PCBs. Possible to inspect the pads of the VLSI having more than 200 - 600-lead.  ...more

Integrated systems-on-a-chip (SOC), combining a wide variety of functions are complex devices and challenge to any device tester. This demanding mixture of digital, analog and power features call for a highly versatile ATE system. ...more

The SR192A is based on Talon Instruments extremely successful SR192. For existing SR192 users, the SR192A is very similar in operation but adds a number of very powerful features ...more

The MCT Tapestry SC is a second-generation strip test handler that provides increased performance and greater flexibility at lower cost.  ...more

The SR192 integrates both bus emulation and traditional stimulus/response capability in a single package. ...more

Doric's Model 473 Digital Temperature Calibrator/Indicator uses custom VLSI ICs in a patented circuit design to deliver exceptional accuracy, high reliability, and long battery life in a truly portable, handheld instrument. So you can use it in the field, on the bench, or in the laboratory with the assurance of fast readings and economical ope ...more

Model 475 Calibrator/ Indicator is compatible with Platinum RTD's, both 0.00385 and 0.00392, and 10 Copper, as well as providing direct ohm simulation and milliamp measurement. Model 475 uses custom VLSI ICs in a patented circuit design to deliver exceptional accuracy, high reliability, and long battery life in a truly portable, handheld instr ...more

Teradyne redefines the economics of test by packing power and performance into the compact, economical J750 Family of semiconductor test systems. The J750 delivers up to 1,024 digital channels in a zero footprint system entirely contained within a test head. Its high-throughput parallel testing capabilities help deliver 95% parallel test effic ...more

The J973EP provides diverse test solutions needed for structural to functional testing by manufacturers and designers of high-performance devices, including microprocessors, core logic, integrated processors,digital signal processors, and network processors.  ...more

A control system operates valves, relays, and electrical components to bring a system to desired operating condition. Control systems can be configured to bring a complex system to set point based on user input or can be used to automatically operate a system over its entire range. Control systems are often used to control complex machinery acc ...more