Optical Analyzers

The ONA 600 Optical Network Analyser is a powerful and versatile tool for characterisation of optical fibers and networks. The system consists of a mainframe, plug-in modules for measurement of Chromatic Dispersion, Polarization Mode Dispersion and Spectral Attenuation with a full range of optical light sources. Designed to deliver superior pe ...more

First responders to network emergencies rely on the EtherScope Series II Network Assistant when it's time for action - a handheld portable network analyzer combining essential tools that help network professionals quickly solve the wide range of problems they encounter - 10,100 and Gigabit, twisted pair and optical fiber LANs and wireless LANs. ...more

The LE 1876 Jitter Meter is designed to measure the jitter conforming to Blu-ray Disc (Part 1, version 1.0, June 2002) standards. Combining time interval analyzer TIA as well as digital processing methods for jitter measurement, enables accurate measurement with high throughput for adjusting and inspecting optical pickups on production lines. ...more

The LE 1871 Jitter Meter is designed to measure the jitter conforming to Blu-ray Disc (Part 1, version 1.0, June 2002) standards. Combining time interval analyzer TIA as well as digital processing methods for jitter measurement, enables accurate measurement with high throughput for adjusting and inspecting optical pickups on production lines. ...more

The Digital BeamView™ Analyzer simplifies the setup and analysis of beams, due to the increased optical dynamic range, over traditional analog-based video camera systems. Higher optical dynamic range means more accurate and consistent results. ...more

The CS1 Optical Surface Analyzer performs surface inspection of semiconductor and optoelectronic wafers, including optically transparent wafers such as sapphire and glass. ...more

The is based in an all-optical method without O/E conversion and electrical post-processing until the light reaches the photodiode. The incoming signal under test (SUT) interacts with the beam of the known local oscillator (a TLS, used as probe) in a perfectly known material medium. Deterministic and calibrated non linear effects dominated by the ...more

Surface inspection of semiconductor and optoelectronic wafers, including optically transparent wafers such as sapphire and glass. ...more

The Candela CS10 Optical Surface Analyzer offers a new approach to unpatterned wafer inspection. By combining two laser paths and four independent detection techniques, the CS10 offers exceptional sensitivity to particles and scratches on optoelectronics and semiconductor wafers. ...more

The Candela 5100 system combines five independent detection methods: scatterometry, reflectometry, ellipsometry, optical profilometry, and Kerr effect microscopy in a compact, cost-effective system. Its measurements are well-suited for a variety of production monitoring, process development, and surface analysis applications. The OSA system sc ...more

Representing the semiconductor industry?s first inspection solution capable of meeting the full range of wafer-edge inspection requirements in a production environment, the VisEdge CV300 system leverages KLA-Tencor?s proven Optical Surface Analyzer (OSA) technology. Many advanced IC manufacturers are facing an average of 10 to 50 percent great ...more

The innovative X-Beam technology is based on the industry standard Candela Optical Surface Analyzer (OSA) optical system, measuring scattered light, reflected light, phase shift, surface topography, and magnetic orientation. A second laser path adds sensitivity to micro-scratches -- regardless of orientation. The spot size is selectable to opt ...more

FBERPRO's State Of Polarization Analyzer, SA2000, measures various polarization related characteristics of optical light, such as, State Of Polarization, Degree Of Polarization (DOP), Polarization Extinction Ratio, the orientation of major polarization axis, etc. with high accuracy. ...more

The Optical Spectrum Analyzer Q 8341 (Advantest) uses a Michelson interferometer in a wavelength range of 350 to 1000 nm. The mechanical configuration of the interferometer allows a resolutions of 1 pm or 1 GHz in the frequency mode ...more

FIBERPRO's Passive Component Analyzer (CA3000) is designed to analyze loss characteristics of Multi-channel Optical Fiber Components. Working with external Tunable Laser, FIBERPRO's PCA can measure Polarization Dependent Loss (PDL) and Insertion Loss (IL) accurately at the same time at minimum time. ...more

Q8384 is a high-grade optical spectrum analyzer (Advantest) with a 4-pass monochromator and extremely low polarization dependance. Thanks to a special method used, a value of ±0.05 dB can be guaranteed, the typical value is as low as 0.02 dB ...more

The RadOMA Series Platform is a durable opto-electrical design proven in hundreds of facilities worldwide. Experience the Gamma Scientific RadOMA advantage offering advanced, high-speed spectroradiometers that combines the leading-edge sensitivity of a backside-thinned CCD detector with Gamma Scientific's industry-renowned RadOMA optical multi ...more

The Chroma 7120 is a non-contact measuring instrument for measuring color components and white balance of color LCD panel and monitor. Designed with advanced microprocessor and A/D converter, and using precision optical components and electrical circuit, it offers accurate, stable, and high-speed colorimetric measurement performance. ...more

The Agilent 86146B is a grating-based optical spectrum analyzer covering the 600 to 1700 nm wavelength range. The OSA uses a patented double-pass monochromator design to simultaneously achieve high sensitivity and dynamic range with a fast sweep time. ...more

The AQ6370 is a bench-top high performance optical spectrum analyzer covering 600 to 1700 nm wavelength range. ...more

The FS4320 2 Gb/s Fibre Channel Protocol Analysis Probe provides a physical and electrical connection between an Agilent Logic Analyzer and 6 Fibre Channel optical links controlled by one common analyzer clock. Protocol decode software is included that configures the Agilent logic analyzer and decodes incoming data. ...more

High-resolution, high-precision optical spectrum analyzer (OSA) designed for ultra-dense WDM applications. Internal reference source, for a wavelength accuracy of ±30 pm (±15 pm with external calibration) ORR of 40 dB at 12.5 GHz and 55 dB at 50 GHz from the peak ...more

The AQ6315A/B Optical Spectrum Analyzers bring advanced capabilities to a wide range of applications, from light source evaluation to measurement of loss wavelength characteristics in optical devices. ...more

High speed, high performance and large memory: ideal for jitter analysis of all optical discs. ...more

The FTB-5230 Optical Spectrum Analyzer (OSA) is designed for testing both DWDM and CWDM systems within metro/access links and long-haul networks. This cost-effective module is housed in the FTB-400 Universal Test System, EXFOs tough, portable test platform. Whats more, the FTB-5230 covers the entire transmission wavelength range, from 1250 to ...more