Logic Probes

Tests TTL and CMOS Displays DC to 50 MHz Detects 10ns pulse width Overload protected ...more

The B&K Precision model 4051 is a programmable multifunction generator that is extremely versatile and affordable. It is a perfect instrument for R&D, Manufacturing Test Systems and Service and Repair. Because it is so versatile the 4051 is ideal for Educational and Training applications. Along with the standard features you would expect on a funct ...more

Tests TTL, and CMOS Displays pulse presence and logic states Memory mode "freezes" pulse display Catches pulses to 30ns or pulse trains to 20MHz 1 Minput impedance ...more

# For TTL, and CMOS# Produces 10mS pulse signals at 100mA# External square wave terminal# Sync input terminal# 0.5pps/400pps Pulse repetition Rate ...more

A unique two-in-one logic probe & pulser that simplifies troubleshooting and analyzing digital circuits. ...more

Hand-held digital logic probe provides convenient and precise use in the measurement of logic circuits. It displays logic levels (high or low), pulses and voltage transients down to 25 nanoseconds. High intensity LED readouts provide instant response to the logic state. ...more

Designed specifically for testing computer-controlled vehicles. Tests virtually any circuit on the vehicle. The all-in-one quick check tool for no-starts. Use to verify primary and secondary ignition, pick-up sensors, fuel injectors, fuel pumps, and idle speed control circuits. ...more

* New technology permits safe testing, without the need of direct contact between probes and live wires. * The insulated crocodile clips can clip insulated cables from ø2.4 to 30mm. * Phase rotation is indicated by the rotary illumination of LEDs and logical audible tones. ...more

The Trio™ probe card ensures higher accuracy and repeatable wafer testing, and is perfect for memory, microprocessor and logic device applications. Current IC designs and increasing I/O requirements can effectively utilize the unique design of the Trio™, regardless of layout or number of probes. With this probe card, customers can increase test yie ...more

Selection of Handler Interface includes HB-100 providing relay closures or logic level (positive logic) with software programmable End Of Test (EOT) and PI-200 providing positive or negative logic with hardware adjustable End Of Test (EOT) and bin pulse widths. ...more

Verification and debug of today's high speed, low voltage digital signals requires probing solutions that can accurately acquire from a wide variety of electronic designs and protect signal fidelity. Tektronix logic analyzer probes contain a variety of connectivity options that are engineered to ensure that signal acquisition is a true reflection o ...more

Handy, quick and easy to use tool. For DTL, TTL and CMOS testing. High frquency response. Instant indication. Pulse memory function. Size: 180mm x 30mm x 20mm ...more

ScopeLogic - complete data acquisition system - consists of Digital Oscilloscope and Logic Analyser. This small instrument is making the accurate analysis of complex analog-digital signals possible - thanks to simultaneous sampling finding relationship between these signals is easy. The user is able to simultaneous use 16 digital channels and 2 ana ...more

When testing low voltage signals on ECL, CMOS and other logic circuits, it is important to use probes with low input capacitance to capture an accurate signal with minimal loading effects on the device under test. Tektronix offers the widest bandwidth and lowest capacitance probing solutions on the market. ...more

For Troubleshooting or Testing Logic Circuits ? Directly Injects Signal into Logic Circuits without Removing Components ? Sync Input for Producing Externally Synced Signals ? Operating Voltage Range: 5 ~ 15VDC ? Maximum Input Probe Voltage: ± 35VDC ? Maximum Sync Input Voltage: ± 120V/30sec ? Sync Input Impedance: 1MO ? Pulse Repetition Rate: 0.5/4 ...more

For analyses and trouble-shooting of/in logic circuits and further useful as level meter, pulse meter for pulse-magnification and/as pulse memory. ...more

The modular TLA7000 Series Logic Analyzer provides the speed and flexibility you need to capture logic detail on today's fastest microprocessors and memory designs. Pinpoint the source of elusive errors and gain the visibility you want with large easy-to-read displays, fast data throughput, and time-correlated views of analog and digital signals th ...more

The multi-contact Eye-Pass probe provides controlled impedance power connections enabling functional testing of even the most challenging circuits on-wafer. The high-durability composite multi-finger tip provides high compliance and ensures precise alignment. This custom probe allows the user to select the footprint pattern best suited for the appl ...more

This hand-held digital logic probe provides convenient and precise use in the measurement of logic circuits. It displays logic levels (high or low), pulses and voltage transients down to 25 nanoseconds. High intensity LED readouts provide instant response to the logic state. Tests all logic families TTL/LSI, and CMOS/MOS digital circuits. Maxi ...more

The GLP-1A/GPG-2A Series are pen-type logic pulser that can be used to perform in-circuit testing of TTL, CMOS, and many other logic devices at maximum 50MHz. ...more

The AM105 M-Module Extender board eases the M-Module development cycle by providing easy access to the M-Module interface and I/O signals. Signal breakout pins allow attachment of logic analyzer and oscilloscope probes to each of the M-Module interface signals. ...more

The ELAB-080 is an integrated instrumentation package that uses the power of modern PCs to provide powerful test and measurement features at a very affordable price. The ELAB-080 package comes complete and ready to use with the instrument, power supply, two oscilloscope probes, logic analyzer and AWG cabling, software, and a USB cable. All you need ...more

MAJIC® (Multi-Architecture JTAG Interface Controllers) JTAG Probes are small, stand-alone, processor-based systems that provide an intelligent connection between host-based development tools (the debugger) and an embedded processor via its standardized JTAG debug logic IP macrocell. ...more

BladeRunner175™ (BR175) is designed for the unique challenges of 90-nanometer logic wafer test. Using proprietary MicroForce™ probing technology, the 175-micron-pitch flip chip wafer probing solution combines low probe force with stable contact resistance to reduce risk of damage and help increase test yield. ...more

The X-COM NTDS Protocol Analyzer System reaches a new level of protocol analysis capability by providing insight into protocol, error, timing, and waveform analysis. The system includes an X-COM NTDS Type E Protocol Interface Module, a Tektronix TLA5000 Series Logic Analyzer, two TLA P6434 Probes, and custom disassembler software. ...more