IC Test

The Model 570A Analog IC Tester's built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators & couplers, and audio ICs. ...more

GAO USB Universal Device Programmer supports from 4000+ to 22000+ devices to meet your different needs for device programming or IC testing. Check out the device support list of our universal programmer to match the chip you want to program or the adapter you may need. ...more

The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode. ...more

USB Interfaced Ultra-Fast 48pin Stand-Alone Universal Programmer. Supports 37,069+ IC devices from 174+ manufacturers and continuing. Programmer and tester of TTL/CMOS logic ICs and memories. ...more

TR5001 includes a mix of MDA, ICT and functional testing within one platform, allowing a complete optional testing model which provides an economical testing solution according to the needs of customers. TR5001 incorporates ICT & Functional test that cut production line staff costs, save testing time lengths and increase productivity. ...more

Transistors  pnp or npn for hfe, Ic saturation current, reverse leakage current. Diodes Forward drop, reverse breakdown voltage Zener Diodes Forward drop and zener voltage Ranges Forward drop @maximum test current 10A, Reverse / Breakdown voltage up to 1000V Reverse leakage current up to 1 micro A  ...more

Semiconductor Thermal Analyzers perform thermal measurements on packaged semiconductor devices using the electrical method of junction temperature measurement. These thermal tests include steady-state thermal resistance, transient thermal impedance, and die attach quality screening. Component test services are available for semiconductor therma ...more

We have partnered with Accel-RF Corporation to provide accelerated life and burn-in testing on a variety of RF and microwave components. The in-house Accel-RF systems provide fully automated temperature, DC, and RF bias conditions to each device under test, along with parametric measurements, limits monitoring, datalogging, and analysis. Components ...more

TestEdge has married the standard relational database with important functions geared toward IC test: # Automated parser-loaders for common ATE # Comfortable user interface via web browser # Data retrieval with or without sql programming # Powerful graphic renderings like ones shown # Script-automated complex extractions # Convenient information d ...more

The Ocelot is the most cost-effective manufacturing test system for complex SOC chips. It is the first production system specifically developed to provide comprehensive structural test capabilities for testing ICs that incorporate DFT structures on chip, such as Scan and BIST. ...more

TR6050 IC Tester is designed specially for testing 66MHz Logic IC. The system is capable of conducting functional tests and DC parametric tests. TR6050 is designed with a GUI test program developing environment, rich debugging and analytic tools, compact size, and highly integration for IC Design House. ...more

The Torrent 5100 test system represents the state of the art in UMTS/GPRS traffic generation systems. It features highly realistic mobile simulation and full automation capabilities which can be used to both increase GGSN quality and decreasting testing cost and effort. Support for a wide number of protocols including HTTP, WAP, MMS, PTT, SMTP ...more

TestEdge delivers experienced IC test engineering and consulting services to a wide variety of customers, including consumer electronics firms, telecommunication companies, the automotive industry, and the US Government. We offer complete test solutions for digital, analog, mixed-signal, and RF devices. In addition to being test consultants, we of ...more

TR5001V includes a mix of MDA, ICT and Functional testing within one platform, allowing a complete optional testing model which provides an economical testing solution according to the needs of customers. TR5001V incorporates ICT & Functional test that cut production line staff costs, save testing time lengths and increase productivity. ...more

TR6080 IC Tester is specially designed for testing Power Management IC. It is ideal for testing regulator, detector, reset, switch, and PWM IC. TR6080 system adopts modular design concept. Currently, there are PVC, OVC, DVC, and TMU for DC&AC parameter measurement, and functional pattern testing AC32 modules for various testing requirement ...more

The Personal Ocelot is the fastest way to isolate silicon problems. It is the first effective desktop validation system for semiconductor IC development. Now verification, product and test engineers can refine and release their engineering samples and test codes from their office or lab. ...more

TR8100A high speed, High coverage. Full upgrade options from MDA to ICT and Functional Test. Optional Digintal 1:1 Driver/Receiver per Pin Architecture Design. ...more

Failure Analysis service - Electrical testing, curve tracing, micro-section analysis, microscopic inspection, structural integrity testing, field emission scanning electron microscopy (FE-SEM), Fourier Transform Infrared (FTIR) analysis and component package decapsulation. ...more

Minigrabber to Minigrabber. IC clip test lead set. Length - 36". ...more

In addition to the Tescon Analogue In-Circuit Test system, the Point 88PC SMT tester is equipped with the IC Lead Floating Test which checks for lead opens, open solder joint and capacitor polarity. ...more

The Verigy V93000 offers the lowest cost of test in the market today for WLAN baseband processor ICs.  ...more

TR518FE is TRI's new generation model developed after the TR518F using more advanced component and software technologies. The main distinctive feature lies with its fast testing speed, which is twice as fast as traditional ICT. Further more, it possesses a more programmable short and open circuit learning setting, satisfying different varietie ...more

The ETS 406D Static Decay Meter meets the requirements for static charge dissipation and static decay rate testing as required by DOD, NFPA, ESDA, INDA and EIA test specs. A wide variety of electrode configurations are available which enable the static dissipative characteristics of film, flat plaques, IC carriers, tote boxes, garments, tablet ...more

Engineering and testing services - design for testability, DFM,design for No-Lead process, 1149.x boundry scan, embedded diagnostics, first article evaluation, prototype and small run testing, structural verification with flying probe test system, development of production processes, specifications and standards. ...more

A spreadsheet template, which guides in the development of testable designs. It contains the Inherent Testability Checklist used with MIL-STD-2165, the U.S. Government's Testability Program for Electronic Systems and Equipments. But Version 3.1 goes much further, bringing you hundreds of guidelines from IC design through board and system testi ...more