IC Test

The Model 570A Analog IC Tester's built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators & couplers, and audio ICs. ...more

TTCI supports several platforms for In-Circuit test set development: GenRad 228x & 227x series test systems and the Agilent (HP) 3070 series. All of our test programs are thoroughly Quality Checked before shipment. Additional services provided by Test Connection, Inc. are Testability and Design Reviews for board (ICT) test. ...more

For that basic of all cable assemblies. Materials: Body: Polyamide (Nylon); Contact: Brass, Nickel Plt. Banana Contact: BeCu, Nickel Plt. ...more

SMT IC test clip. ...more

BNC female to MiniPRO Test Clips, IC test clips. Materials: Body: Polyamide (Nylon); Contact: Brass, Gold Plt. Wires: Silicone Jacket. Wire Length: 25cm (10") ...more

For that basic of all cable assemblies. Materials: Body: Polyamide (Nylon); Contact: Brass, Nickel Plt. Banana Contact: BeCu, Nickel Plt. ...more

IC test clip kit, 20 pieces. ...more

For that basic of all cable assemblies. Materials: Body: Polyamide (Nylon); Contact: Brass, Nickel Plt. Banana Contact: BeCu, Nickel Plt. ...more

For that basic of all cable assemblies. Materials: Body: Polyamide (Nylon); Contact: Brass, Nickel Plt. Banana Contact: BeCu, Nickel Plt. ...more

The 866B is a universal device programmer with a constantly updated extensive device library. It has been designed for ease of use and reliable performance and it is ideal for use with Laptop/Notebook computers that do not have parallel port interfaces. Whether you are working with PLCC, SOIC, TSOP, DIP, TQFP, SSOP, PSOP or QFP, B+K Precision has a ...more

The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode. ...more

A spreadsheet template, which guides in the development of testable designs. It contains the Inherent Testability Checklist used with MIL-STD-2165, the U.S. Government's Testability Program for Electronic Systems and Equipments. But Version 3.1 goes much further, bringing you hundreds of guidelines from IC design through board and system testi ...more

TR5001 includes a mix of MDA, ICT and functional testing within one platform, allowing a complete optional testing model which provides an economical testing solution according to the needs of customers. TR5001 incorporates ICT & Functional test that cut production line staff costs, save testing time lengths and increase productivity. ...more

TR6836 is a 33MHz logic IC tester with the best price-performance ratio in the market. It is capable of conducting functional pattern testing and DC parametric testing. Featuring a user-friendly test program development environment, rich debugging & analytic tools, compact size, and a highly-integrated design makes the TR6836 a versatile engineerin ...more

This is a low-cost, high-performance electrical tester. It comes equipped with software tools that make operation easy. The standard model supports IC pin float detection. A large selection of options is also provided to allow JTAG inspections and necessary function testing using the ICT. Made by Digitaltest (Germany). ...more

IC test lead set. Jumper minigrabbers. Set includes 5 colors, 1 each: red, black, yellow, green & white. ...more

The RI7100A ATE System is a configurable and extremely capable tester for a wide variety of IF, RF, and Microwave devices from 5 Khz up to 20 GHz. From simple Power Amplifiers and LNAs to complete Transceivers and Systems, testing is accomplished through a universal Test Head interface. ...more

The Plexus ICT solution is designed to provide maximum in-circuit test value and performance for the Agilent, GenRad, and Teradyne family of testers. •Test strategy development •Design-For-Testability (DFT) reviews •CAD translation •Device modeling development •Test program development - Simple to Complex •Test fixture design - Pneumatic, Vacuum, W ...more

Transistors  pnp or npn for hfe, Ic saturation current, reverse leakage current. Diodes Forward drop, reverse breakdown voltage Zener Diodes Forward drop and zener voltage Ranges Forward drop @maximum test current 10A, Reverse / Breakdown voltage up to 1000V Reverse leakage current up to 1 micro A  ...more

TestEdge has married the standard relational database with important functions geared toward IC test: # Automated parser-loaders for common ATE # Comfortable user interface via web browser # Data retrieval with or without sql programming # Powerful graphic renderings like ones shown ...more

WildScan enables migration of Boundary-Scan test (BST) program to In-Circuit testers (ICT) without the need for complementary hardware integration within the target In-Circuit testers. This significantly reduces test fixturing costs by utilizing the same test fixture for both Boundary-Scan and In-circuit testing, providing a one-stop test solution ...more

# Supports 3,469 devices and growing. # Memory: EPROM, EEPROM, FLASH, Serial EEPROM up to 8Mb. # Microcontroller: AMD, ATMEL, AVR, DALLAS, INTEL, ISSI, LGS, MICROCHIP PIC, PHLIPS, SIEMENS, SST,TEMIC, WINBOND, WSI, ZILOG etc. # PLD: AMD, LATTICE, ATMEL, CYPRESS, NSC, ST, ICT etc. # Advanced pin-driver technology. # High programming speed. # Self dia ...more

Takumi™ probe cards for in-line and end-of-line parametric testing give IC manufacturers earlier insight into opportunities to validate their designs, verify process performance and achieve higher yields. High contact precision supports manufacturers' use of smaller test pads and narrower scribe lines on their product wafers. ...more

TestDeveloper electronic design automation software efficiently analyzes timing from IC design simulation and generates high-quality, ATE-ready test files, reduces test time, and lowers costs for complex SoC devices. ...more

The Ocelot ZFP is the Lowest Cost Test System for Complex SOCs - New, complex SOC designs can now be accelerated through the debug and production process by interrogating on-chip DFT structures with structural test methodologies running on more efficient test systems. The Ocelot ZFP (Zero Foot Print) is a new member of the Ocelot test system family ...more