IC Test

The Model 575A is able to locate intermittent and temperature related faults by using its unconditional or conditional loop testing modes. Unknown device identification is easily accomplished by selecting SEARCH from the menu, selecting the number of pins on the device and activating Search Mode. ...more

The Model 570A Analog IC Tester's built-in test library includes all common Analog ICs including op-amps, comparators, voltage regulators, voltage references, analog switches & multiplexes, opto-isolators & couplers, and audio ICs. ...more

The 866B is a universal device programmer with a constantly updated extensive device library. It has been designed for ease of use and reliable performance and it is ideal for use with Laptop/Notebook computers that do not have parallel port interfaces. Whether you are working with PLCC, SOIC, TSOP, DIP, TQFP, SSOP, PSOP or QFP, B+K Precision has a ...more

TTCI supports several platforms for In-Circuit test set development: GenRad 228x & 227x series test systems and the Agilent (HP) 3070 series. All of our test programs are thoroughly Quality Checked before shipment. Additional services provided by Test Connection, Inc. are Testability and Design Reviews for board (ICT) test. ...more

Interface for Data Transfer for REINHARDT Test Systems. Together with Reinhardt System- und Messelectronic GmbH, Tecnomatix (formerly Fabmaster) has created a software which generates data out of the data of CAD-systems or even of bills of materials which can then be used for programming insertion machines and automatic test systems. ...more

LCC Bug Katchers make it easy to attach test leads to socketed ICs in LCC packages. Accommodate LCC packaages with 32, 44, 68, and 84 pins. Device template eliminates pin identification problems by labeling each test point. Top socket is sometimes convertible to a PLCC or PGA package. Fits between your IC and socket. Unique LCC emulator block o ...more

This is a newly-developed compact version of the WL25. It can measure between one and four small amplitude signal linear devices in parallel, and is ideal for mass-production tests. All the modules used are compatible with the WL25. ...more

Patented on board electrolytic capacitor polarity and missing part technologies: ECJ Pat ented SMD IC solder joints open/contacted discriminating technologies: TAJ PIC/ regulator IC test functions. LED Luminous comparison functions. Key stroke test functions. Auto start test function ...more

Baseband Video testing – The ANG BBV Series of Noise Generators are designed for testing baseband (NTSC, PAL, SDTV, HDTV) video and audio systems in the presence of noise. Ideal for signal and picture quality testing on encoder/decoder ICs. ...more

Pocket-Sized Portable Potentiometer! Calibrate All Your T/C Inputs—Transmitters, recorders, controllers and alarms. Cold Junction Compensated—Just connect and calibrate without external compensators or ice baths. Simulate Temperatures in °C or °F—Thermocouple types J, K, T, E, R, S or B with 22 precise test points. ...more

Pomona DIP Clip® test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting. ...more

When small test points, extremely tight tolerances or high volume applications are required, use QxQ Pneumatic fixture. Designed for either ICT or functional applications, QxQ pneumatics stand the test. ...more

The Diamond test platform is a low-cost, high-throughput production test solution for cost-sensitive devices. Its small footprint, minimal facilities requirements and low power consumption drive down cost of operation, and make Diamond ideal for personal use in the lab or office. ...more

Wedge Clip technology ensures reliable probing of 3, 8 or 16 signals on 0.5mm or 0.65mm pitch signals. The clip alleviates the frustration of accidentally shorting IC pins together; the electrical or mechanical problems associated with soldering, and/or holding multiple probes while using your scope. The clip is excellent for those times when a ...more

T/R Automatic Test System is one of the latest automatic test systems presented by East China Institute of Electronic Measurement Instrument. Organizing multiple test sets under the control of an external computer, the system has successfully coordinated measurement requirements between multi?function, multi?parameter and high speed, thus solving T ...more

At KYEC's Final Test we perform 100% electrical testing as per customers parameters / test program with dedicated changeover kits for a wide range of IC packages. Capability at Final Test includes small packages to high pin count and covers the following form factors: PDIP, PLCC, full SOIC range ? SOP, TSOP, TSSOP, MSOP, QFP, LQFP, TQFP, QFN , ...more

The WL25 uses multi DGS to support total parallel testing of power devices. It provides a wide variety of V/I variations. The newly-developed high-speed BUS that shorten hardware setting times and the lower system noise combine to offer high-accuracy testing ...more

The ASL test platform is a focused solution for the advanced linear and analog mixed signal markets, specifically addressing the increasing need for power delivery and multisite capability. The streamlined architectural principle of the ASL offers key benefits for the cost conscious linear/mixed signal market. ...more

A high percentage of boards that are tested using in-circuit testers (ICT), have boundary scan devices. These components may have individual JTAG port access or be connected in a chain, sharing common TCK and TMS signals.  ...more

StarTest provides turn-key test program development services for the Teradyne Z18xx family of In-Circuit Testers. ...more

ATE, ICT, semiautomatic & manual electronic test fixtures, PCB test fixtures, cable test fixture, wiring harness test fixtures, dedicated test fixtures, functional test fixtures, electronic test fixture programming. PADS Schematic capture, circuit board layout, PCB design prototype, solder paste stencils, X-Y coordinate data, B.O.M. mainten ...more

Chroma 3500 is the first LCD Driver IC Test System designed specially to test both LCD Driver ICs and Consumer ICs in a single platform. Chroma has engineered an universal architecture which enables free inter-change of the LCD pin cards and I/O pin cards in the test head, so users can easily reconfigure the pin cards to meet rapidly changing ...more

Disconnect and reconnect any pin of your socketed ICs in a PGA package. Each lead can be activated or deactivated using the Bug Isolator's DIP switches. Use with an emulator probe to disable unwanted interrupts and resets. Connect a scope or other instrument without using an IC test clip. By connecting the lead to a test instrument, you can fo ...more

Pomona DIP Clip® test clips are designed fortesting dual-in-line IC packages on PC boards. Thesedevices incorporate many built-in features that assurea positive electrical connection as well as hands freetesting. ...more

Gas Flow Durometers Plain ring gages RF Generators up to 40 GHz Frequency counters up to 40 GHz RF Spectrum analyzers up to 40 GHz RF Power meters and sensors to 40 GHz ...more