Digital IC

The AA107-310 is a GaAs FET IC 5 bit digital attenuator with a serial-to-parallel driver packaged in a 32 leadless exposed pad plastic package. It is particularly suited at IF frequencies where high attenuation accuracy, low insertion loss and low intermodulation products are required.Typical applications include base station, wireless and RF ...more

The ABI ChipMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The ChipMaster is designed for testing digital ICs with up to 40 pins through a ZIF socket (see LinearMaster for analogue devices). A range of adapters is also available for SOIC and PLCC devices. ...more

This ICP DAS controller focuses on communication applications. Used with different embedded firmware programs, it can be used as a Device Server, Addressable Ethernet to RS-232/422/485 Converter, or Embedded Internet/Ethernet Controller. ...more

Digital IC Tester ...more

The RFC Pyramid Probe card provides state-of-the-art signal integrity for microwave/RF, analog, or high-speed digital IC production test. Microstrip transmission lines maintain impedance control all the way to the bond pad. Patented ground and power planes with bypass capacitors provide resonance-free power supplies directly to the IC. ...more

Turbo Package Analyzer (TPA) provides the package extraction and automation capability needed to address the electrical requirements of today's complex high-performance SiP, chip-scale, flip-chip, ball-grid array, and wire-bond. With TPA, IC and package designers of analog/RF and high-speed digital applications are able to fully characterize an ...more

Loop Test. Auto-Search. Seif-Diagnosis. Over-Load Protection. Measures 1800 Kinds Device. 54/74 Series TTL and High Speed CMOS  ...more

Wide supply voltage range. Fast response time. Wide frequency and temperature range. Long operating life. Small size, convenient installing. Output compatible with all digital logic families ...more

Low current consumption. Wide supply voltage range. Fast response time. Wide frequency range (DC - 100KHZ). Long operating life. Small volume, install conveniently. Compatible with all digital logic families  ...more

High sensitivity high operating temperature. Resistant to physical stress. Wide supply voltage range, Interfacing with All Kinds of Logic Circuits Directly  ...more

The SYSTEM 8 Board Fault Locator provides the user with the ability to functionally test all common digital ICs in and out-of-circuit. A combination of industry recognised test techniques provides a high level of fault coverage. Additional tools are provided by the SYSTEM 8 Premier software to further enhance the unit\'s wide range of applicati ...more

ABI Electronics offers a range of solutions to cover the most common test combinations. Including both analogue and digital test techniques, they provide an excellent starter package for a wide range of applications. ...more

Easy-Operating Tester, Particularly be Designed for the Digital IC. Supported Device：74/40/45/41/44 Serial. Small, Portable, Light and Power-Saving, Usable With Battery  ...more

Unique in its class, Advantest's new M4841 Dynamic Test Handler enables high-throughput parallel test for very high volumes of devices and supports complex ICs and packages, including BGA, CSP and QFP. Because of its advanced performance capabilities and features, the M4841 is the optimal dynamic test handler for high volume production of devic ...more

Handy Digital IC Tester. The GUT-6600 is a portable Digital IC tester with its features matching those of its desktop cousin: the GUT-6000A. Standard AA battery operation with an optional DC adaptor provides a secure power supply anytime, anywhere. ...more

The ABI LinearMaster Compact Professional is a low-cost, hand-held out-of-circuit IC tester. The LinearMaster is designed for testing analogue ICs with up to 16 pins through a ZIF socket (see ChipMaster for digital devices). A range of adapters is also available for SOIC and PLCC devices. ...more

The MP1764C Error Detector is used in combination with the MP1763C Pulse Pattern Generator for 12.5G Bit Error Rate Testing to evaluate components and systems in conformity with ITU-T standards. Complicated searching for input thresholds or phase adjustments is simplified with the touch of a single key. These functions are ideally suited for t ...more

The MP1764D Error Detector is used in combination with the MP1763C Pulse Pattern Generator for 12.5G Bit Error Rate Testing to evaluate components and systems for conformity with ITU-T standards. Complicated searching for input thresholds or phase adjustments is simplified with the touch of a single key. These functions are ideally suited for ...more