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Showing results: 8146 - 8160 of 8464 items found.

  • Discrete Module for Multi Protocol 4000 Boards

    Excalibur Systems, Inc.

    Discrete Module for Multi Protocol 4000 BoardsThe M4KDiscrete is an interface module for the multimode, multiprotocol Excalibur EXC-4000 family of carrier boards. The M4KDiscrete provides a complete solution for developing and testing discrete voltage-level interfaces.The module contains control I/O registers that may be accessed in real time. The module supports 20 discretes. The user can set each discrete:• Either as input or output.• Either to TTL (0 – 5V) or Avionics (0 – 32V) voltage levels and• Either enable or disable external debounceOutput discretes are open collector, capable of handling up to 32V with a maximum current of 100 mA each. There is a 4092 word FIFO, capable of storing 1023 Discrete entries containing the discrete data and Time tags.

  • 2-CH 14-Bit 200 MS/s High-Speed PXI Express Digitizer

    PXIe-9852 - ADLINK Technology Inc.

    The ADLINK PXIe-9852 is a 2-CH 14-bit 200 MS/s digitizer for high frequency and wide dynamic range signals with an input frequency up to 90 MHz. The 90 MHz bandwidth analog input with 50Ω impedance is designed to receive ±0.2 V, ±2 V, or ±10 V high speed signals. With a PCI Express bus interface and ample onboard acquisition memory up to 1 GB, the PXIe-9852 easily manages simultaneous 2-CH data streaming. With high speed and high linearity 14-bit A/D converters and high stable onboard reference, the PXIe-9852 provides both high accuracy and high dynamic performance, making it ideal for applications requiring high-speed data acquisition, such as optical fiber and LIDAR testing, and video signal analysis.

  • 2-CH 14-Bit 200 MS/s High-Speed PCI Express Digitizer

    PCIe-9852 - ADLINK Technology Inc.

    The ADLINK PCIe-9852 is a 2-CH 14-bit 200 MS/s digitizer for high frequency and wide dynamic range signals with an input frequency up to 90 MHz. The 90 MHz bandwidth analog input with 50Ω impedance is designed to receive ±0.2 V, ±2 V, or ±10 V high speed signals. With a PCI Express bus interface and ample onboard acquisition memory up to 1 GB, the PCIe-9852 easily manages simultaneous 2-CH data streaming. With high speed and high linearity 14-bit A/D converters and high stable onboard reference, the PCIe-9852 provides both high accuracy and high dynamic performance, making it ideal for applications requiring high-speed data acquisition, such as optical fiber and LIDAR testing, and video signal analysis.

  • Torque Analyzers & Sensors

    Mountz Inc.

    If torque tools slip out of calibration, that could impact the quality of your products. Having an accurate way to regularly test calibration onsite is a great way to reduce risk and ensure safety. With Mountz torque analyzers and sensors, you can test tools before they go into service every day. This prevents employees from working with miscalibrated tools and enhances quality management. It’s also more efficient to use your own torque testing equipment since you can evaluate your tools without sending them to a laboratory. Whether you want stand-alone sensors for hand and power torque tools or run down adapters that simulate actual joint conditions, Mountz has many options to choose from.

  • Transportation Simulation

    National Technical Systems

    Transportation simulation testing involves the application or simulation of environments found in the transport of goods and equipment. These environments may include vibration, drop or shock, temperature, loose cargo or bounce, as well as other dynamic or climatic environments. Products and equipment are usually tested in the “shipping” configuration which means they would be packed in the default shipping container or transit case during the test. However, some items may also be tested in an unpacked state if there is an expectation that they might frequently be transported in that manner. Tests are performed not only to test the effects of transport on the product itself, but also to test the adequacy of shipping container design and the interaction between product and container during shipping. There are a number of possible modes of transport for any given item subject to shipping.

  • Switching Power Supply ATS (SMPS ATS)

    8200 - Chroma ATE Inc.

    Chroma Power Supply Auto Test System model 8200 provides complete solution for PC ATX power supply, adapter and battery charger testing. The application oriented system structure makes it the most cost effective test equipment for initial test in power supply production line. To meet the power supply test requirements, Chroma Power Supply Auto Test System model 8200 has built in 20 ready-made test items. Users can simply enter the test conditions and test the power supply features while proceeding. With the report and management functions, Chroma Power Supply Auto Test System model 8200 is able to provide versatile tools to establish test documents and perform system administration.

  • Cryogenic Fuel Storage and Vaporization Systems

    National Technical Systems

    Our cryogenic fluid storage area consists of three 13,000 gallon liquid nitrogen tanks, one 13,000 gallon liquid oxygen tank and one 9,000 gallon liquid hydrogen storage tank. The tanks can be selectively filled to support independent testing activities or feed liquid to high pressure positive displacement pumps and vaporizers. The vaporizers are ASME-coded for use at a liquid hydrogen temperature of -423°F. All pressure piping conforms to ASME B31.3 code design and is installed by certified welders with post-weld X-ray inspection as required. This site has the capability to store LH2, LO2, LN2, liquid CO2 and liquid methane as well as pump and vaporize cryo fluids up to 12 lbs. per second.

  • Walk-In Altitude Test Chamber

    ACMAS Technologies Pvt. Ltd.

    WEIBER Altitude Test Chambers combine temperature and altitude to test basic components or subassemblies designed for use in a variety of industries. With altitude test chambers, user can control the temperature environment for testing while simulating various altitudes from site level to 100,000 feet (1.12kPa)High and low Temperature Altitude Test Chamber is used to test temperature and low-pressure altitude conditions simultaneously. All models are factory tested, with an ergonomic and maintenance cum user-friendly design.These CE approved test chambers are created with multi-layered insulation with double vapor barrier is of low 'K' factor, high density and of non-hygroscopic in nature. WEIBER test chamber are made in accordance with the international standard.Standard as well as customizable models are available. Walk in models are also available.

  • Spring Impact Hammer IK Level Tester

    IK01-06 - Lisun Electronics Inc.

    The most of luminaires manufactory were request to do IK level test (Impact Protection), LISUN can supply the IK test instrument. IK ratings are defined as IKXX, where “XX”  is a number from 00 to 10 indicating the degrees of protection provided by enclosures (including luminaires) against external mechanical impacts. The different IK ratings relate to the ability of an enclosure to resist impact energy levels measured in joules (J). IEC 62262 specifies how the enclosure must be mounted for testing, the atmospheric conditions required, the quantity and distribution of the test impacts and the impact hammer to be used for each level of IK rating. The IK test applicate on lighting luminaires test according to IEC60598 (GB7000) and IEC60068-2-75 (GB2423.55).

  • Combination Board Tester

    V250 / V250PXI - Qmax Test Technologies Pvt. Ltd.

    V250 / V250PXI is designed as a Combination Board Tester capable of testing highly complex and dense PCBs employing various test techniques on a single platform. It can perform Board Level Functional Test through edge connectors of a PCB, and guided probe diagnostics utility to reliably repair Digital/Analog and Mixed Signal PCBs of various complexities and conventional PCBs. An In –Circuit device test by configuring Pin Drivers to High Current Pin Driver mode and interface to the UUT either through Clips / Probes or nail bed and on board clock disable HW feature are the all time favorite . The in-built high frequency 14bit Analog Driver / sensors synchronized with digital drivers for covering analog / mixed signal devices with high degree of accuracy.

  • Universal Launcher Test Set

    TS-217 - Marvin Test Solutions, Inc.

    The TS-217 is an I-level and Depot-level Universal Launcher test set supporting fighter aircraft launchers including the LAU-127, LAU-128, and LAU-129 (AMRAAM), LAU-117 and LAU-88 (Maverick), and LAU-7 (Sidewinder) missile launchers, launcher electronic assemblies, launcher power supplies, and circuit cards. The TS-217 is also used as a depot-level tester for F-18 armament including launchers (LAU-127, LAU-7, LAU-115, and LAU-116), bomb racks (BRU-32), and aircraft pylons (SUU-62 and SUU-63). Additionally, the TS-217 supports MAU-169 Paveway kits, subassemblies, and circuit cards. The TS-217 performs full parametric functional testing as well as troubleshooting to the faulty LRU (I-Level configuration) and SRU (Depot-Level configuration). The TS-217 can be used as an I-Level tester or as a Depot / Acceptance tester for launcher subassemblies.

  • Communications Manufacturing Test Set

    CMW100 - Rohde & Schwarz GmbH & Co. KG

    The R&S®CMW100 communications manufacturing test set is based on the R&S®CMW platform. The flexible RF interface permits simultaneous testing of up to eight devices. The R&S®CMW100 remote control and measurement concepts are compatible with the R&S®CMW500. The R&S®CMW100 is optimized for cost-effective calibration and verification of wireless devices in non-signaling mode (analyzer/generator). The tester provides a new eco-friendly hardware concept, featuring extremely low energy consumption and a very compact size, making it ideal for use in fully automated robotic production lines. It supports LTE, 5G NR, WLAN, Bluetooth® and IoT technologies, making it ready for today and tomorrow.

  • 32 Channel Multi-Purpose DIOS/TAP Modules/Interfaces for Spare JT 2148 QuadPOD Transceiver Slot

    JT 2149/MPV eMPV - JTAG Technologies Inc.

    The JT 2149/MPV and the JT 2149/eMPV are a 32 channel multi purpose DIOS/TAP pod modules/interfaces that can be plugged into any spare JT 2148 QuadPOD transceiver slot. The DIOS channels of these units I/O interface pods enable increased fault coverage and thus improved diagnostic resolution during boundary-scan testing. The principal difference between the two versions is the use of an extended case on the eMPV that allows standard 0.1″ connections to be used to access ths TAP and static IO signals (see tab below)- on the standard /MPV unit these signals are available at the front face 0.05″ connector. The units are fully supported by JTAG Technologies’ development tools. Additional DIOS modules can be serially connected if more parallel access points are required.

  • PXIe-7866, Kintex-7 325T FPGA, 24-Channel AO, 1 MS/s, PXI Multifunction Reconfigurable I/O Module

    787354-01 - NI

    PXIe, Kintex-7 325T FPGA, 24-Channel AO, 1 MS/s, PXI Multifunction Reconfigurable I/O Module - The PXIe-7866 features flexibility of timing and synchronization with a user-programmable FPGA for onboard processing and direct control over I/O signals. The PXIe-7866 provides 24 analog output, 2 analog input, and 32, 5V input-tolerant digital I/O channels connected to a Kintex-7 325T FPGA to help you design applications for hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. You can use the dedicated A/D converter (ADC) for independent timing, individual channel triggering, and multirate sampling. Additionally, the PXIe-7866 includes peer-to-peer streaming for direct data transfer to other PXI Express modules.

  • Pulse Function Arbitrary Noise Generator

    81160A - Keysight Technologies

    Generation of 330-MHz pulses and 500-MHz function/arbitrary waveforms with a 2.5-GSa/s sample rate and 14-bit vertical resolution; Selectable crest factors for white Gaussian noise lets engineers determine how much distortion to apply to a device during stress testing to meet various serial bus standards; Glitch-free timing parameter changes allow engineers to change the frequency without drop-outs or glitches and enable continuous operation without rebooting or resetting the device under test; and Arbitrary bit patterns show capacitive load of the channels using simple pattern settings. Complex measurement setups are no longer necessary to test designs to their limits. Pulses 330 MHz, 500 MHz sine waves, 660 Mbit pattern

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