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  • Handheld Xrf Analyzer, Metal Analyzer, Rohs Analyzer

    SG-2000S - Jinge Testing Machine Co.,Ltd

    Handheld XRF Analyzer, Metal analyzer, ROSH analyzerThis is a portable analyzer specially designed for production site and field environment, which is featured with small size, light weight, easy operation and super long standby, etc. It's widely applied in such fields as alloy steel, geological surveying, mining and metallurgy, metal recycling, and precious metal testing, and can also be applied in quantitative analysis of all elements from Magnesium (Mg) to Uranium (U).

  • Fine Pitch Vertical

    LogicTouch - SV Probe, Inc.

    The shrinking of IC die geometries and the growing complexity of device designs are making the task of on-wafer testing increasingly more difficult. SV TCL''s LogicTouchTM is suited perfectly for these types of advanced designs, a fine pitch technology utilizing a MEMS-style probe targeted for pad-limited devices such as High-Volume SoCs, Microcontrollers, DSPs and 3D Packages. LogicTouch is also ideal for the latest device applications including TSV (Through-Silicon Via) and Copper Pillar (Cu-Pillar).

  • MOS Transistor Selector

    UI9611 - Lisun Electronics Inc.

    Measure parameters: Open voltage UGS (th), internal resistance RDS, Transconductance gm, Withstand voltage V (BR) DS• Test range: UGS (th) 0.1-9.9V; RDS 0.001-9.999Ω gm; 0.10-10.00s; V (BR) DS 50-650V• Test current range: 0.1A-5A adjustable, comply with different working situation• Automatic selecting, out of limit alarming, advance the work efficiency• The technique of testing RDS under the big-current, is advanced technique

  • Test Development Solution

    Corelis, Inc.

    Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete "turn-key" service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.

  • JTAG Test Procedures

    Corelis, Inc.

    Corelis will process your design information, create all necessary test vectors, and verify the test vectors using your actual hardware. This is a complete “turn-key” service resulting in a fully verified and debugged boundary-scan test system. For companies short of resources, those who are under a tight deadline, or for those who are new to boundary-scan and want to be testing in the shortest time possible, this is an excellent way to minimize your investment and maximize your effectiveness.

  • Tensile Test Methods For Plastics: ASTM D638

    Shimadzu Corp.

    Resin materials (plastics) are found in a wide variety of items used on a daily basis. Recently, plastics have started to be used as structural materials in transportation equipment, such as automobiles and aircraft, due to their strength and light-weight nature. In these applications, it is important to understand the mechanical strength properties of these plastics. ASTM D638 specifies methods for testing the tensile strength of plastics and other resin materials and for calculating their mechanical properties, and outlines accuracy requirements for the test frames and accessories used.

  • 35 W Triple Output, 6V, 2.5A & 20V, 0.5A

    E3630A - Keysight Technologies

    Keysight basic DC power supplies offer essential features for a tight budget. The multiple output, 35-50 W, E3620A and E3630A provide dual and triple outputs; small, compact size for bench use; low-noise and excellent regulation; and overload indicator to monitor output. The Keysight 35W, triple output E3630A has three versatile outputs for benchtop applications; and is offers stable and reliable power plus essential features for manual testing.

  • Full Wafer Test System

    FOX-1P - Aehr Test Systems

    Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.

  • Pulsed Source Measure Unit

    Vektrex Electronic Systems

    The SpikeSafe SMU is a precision pulsed source measure unit that precisely sources pulsed current and simultaneously digitizes voltage. Optimized for precise and repeatable high-power LED and laser testing, SpikeSafe™ SMU (Source Measure Unit) current sources deliver precise pulsing with low microsecond rise times, low-jitter triggering and integrated digitizer for more accurate and repeatable high-power LED and laser testing.

  • Air Core Test Lab Reactors

    Hilkar

    Test Laboratory Reactors are designed for high voltage and high power test laboratories. They are designed to withstand the most extreme electrical service conditions during test periods. Design techniques are implemented in accordance with the most demanding service conditions. These reactors are used for various purposes in test laboratories such as current limiting and synthetic testing of circuit breakers, capacitor testing, artificial line simulation etc.

  • Cantilever Probe Cards

    Venture - SV Probe, Inc.

    SV TCL's VentureTM line of cantilever probe cards, represents the finest epoxy technology on the market and are perfect for logic testing. The Venture line includes an extensive array of cantilever cards, single to multi-die for a variety of test systems. Our Venture FX™ fine pitch cantilever cards are ideal for LCD driver testing, with higher probe counts for greater density bond pad layouts.

  • Diode DC. Characteristics Tester

    TVR 6100 - Xceltron Technologies

    The TVR6100 is a multipurpose, versatile Binning Tester. It can be used to classify parameters, including TRR (reverse recovery time), VF (forward voltage, IF is up to 100A), VBR (reserve breakdown voltage) and IR (reverse leakage current). Moreover, it can test IR SURGE, ΔVR(delta reverse voltage) and IR parameters at the same time. Each parameter, for testing or not testing, can be selected by each operator.

  • Data Acquisition Systems

    LMS SCADAS - Siemens Digital Industries Software

    The LMS SCADAS state-of-the-art data acquisition systems cover all types of noise, vibration, durability testing and engineering tasks in the lab, in the field, with a PC or through autonomous recording. Seamless integration with LMS Test.Lab and LMS Test.Xpress provides you with reliable results and optimal testing productivity. Take your mind off the deadline and focus on the test. From lab to mobile to portable.

  • Cloud based Requirements Management & Bug Tracking Service

    ReQtest - ReQtest AB

    Our software testing tool ReQtest offers a complete module for test management. Plan your testing by writing test cases and checklists, execute them by sharing with your test team, and follow the progress in real time to see how the tests are going. ReQtest offers great support to easily search, filter and group your bug reports and presenting them in a useful way.

  • PCI Express 4.0 Test Platform

    Teledyne LeCroy

    The PCI Express 4.0 Test Platform provides a convenient means for testing PCIe 4.0 add-in cards with an internal interposer and power supplies. The Summit Z416 Test Platform provides the platform for the Summit Z416 to act as a host emulator, and provides a general purpose test backplane and interposer for testing Gen4, Gen3, Gen2 or Gen1 hosts and devices. It supports SMBus and other sideband signals.

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