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Showing results: 4501 - 4515 of 5371 items found.

  • PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator

    783127-01 - NI

    PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.

  • PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator

    783127-02 - NI

    PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.

  • PXIe-5654, 250 kHz to 20 GHz, PXI RF Analog Signal Generator

    783126-02 - NI

    PXIe, 250 kHz to 20 GHz, PXI RF Analog Signal Generator - The PXIe-5654 features a combination of exceptional phase noise and frequency tuning time. These features address applications such as blocker test/receiver desensitization, high-performance intermodulation distortion measurements, and various electronic warfare applications. The PXIe-5654 is designed to meet the challenging requirements of RFIC characterization, satellite test, and radar applications. Some PXIe-5654 options include a PXIe-5696 Amplitude Extender Module. The PXIe-5696 supports a frequency range of 250 kHz to 20 GHz and an extended amplitude range up to 27 dBm.

  • Digital (1kV up) H.V. Insulation Tester

    2803 IN (Ranges: 0.5kV, 1kV, 2.5kV, 5kV) - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● Four insulation test voltages.● Insulation resistance; auto ranging on all ranges.● Bargraph indicates test voltage; rise and decay can be observed during tests.● Visual and audible warning if external voltage is present.● EnerSave™ feature to extend battery life.● 2 Lines × 16 characters large LCD.● Low battery consumption.● Low battery indicator.● Overload protection.● Auto-off.● Show test time duration (up to 99.9s) for easy comparison.● EEPROM calibration.● Built-in carry case and test leads in separate pouch.

  • Digital (1kV up) H.V. Insulation Tester

    2804 IN (Ranges: 1kV, 2.5kV, 5kV, 10kV) - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● Four insulation test voltages.● Insulation resistance; auto ranging on all ranges.● Bargraph indicates test voltage; rise and decay can be observed during tests.● Visual and audible warning if external voltage is present.● EnerSave™ feature to extend battery life.● 2 Lines × 16 characters large LCD.● Low battery consumption.● Low battery indicator.● Overload protection.● Auto-off.● Show test time duration (up to 99.9s) for easy comparison.● EEPROM calibration.● Built-in carry case and test leads in separate pouch.

  • Digital ELCB Testers

    6221 EL - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● Indicates phase rotation.● Indicates phase presence.● Tests for disconnection sensitivity.● Indicates battery status.● Tests for disconnection time.● Measures voltage phase to earth.● Select one of 3 Phase to test ELCB.● Color-coded test leads.● Phase presence indication from as low as 100Vac.● Very low consumption.● Fused earth leakage tester.● ELCB works 50Vac to 330Vac 50Hz / 60Hz.● Led indication of Voltage on ELCB.● Phase rotation and presence does not require battery to indicate.● EN 61010-1 CAT III 550V. EN 61326-1

  • Digital ELCB (RCD) Tester

    1813 EL - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● 2 Lines × 16 characters LCD.● Very low consumption.● Suitable for domestic version.● Better than 3% accuracy (current).● Menu-driven.● Accurate digital readout of disconnection time.● Accurate digital readout of disconnection sensitivity.● Automatic data hold function.● Zero crossing circuitry permit testing at 0° or 180°.● Disconnection phase polarity shown on LCD display.● Auto off and off override.● Polarity trip indicator (positive or negative phase)● Wiring polarity indicator.● Measure voltage between Line and Earth before testing.● 60Hz available.

  • Digital ELCB (RCD) Tester

    2712 EL - Standard Electric Works Co., Ltd

    ● Microprocessor-controlled.● 2 Lines × 16 characters LCD.● Very low consumption.● 50Hz and 60Hz operation.● Menu-driven.● Accurate digital readout of disconnection time.● Automatic data hold function.● Over temperature protection.● Over voltage protection.● Fuse protection.● Zero crossing circuitry permit testing at 0° or 180°.● Disconnection phase polarity shown on LCD display.● Auto off and off override.● Polarity trip indicator (positive or negative phase)● Wiring polarity indicator.● Measure voltage between Line and Earth before testing.● Frequency measurement indication.

  • PXI-2542, 6.6 GHz, 50 Ω, Solid-State, Quad 2x1 PXI RF Relay Module

    778572-42 - NI

    6.6 GHz, 50 Ω, Solid-State, Quad 2x1 PXI RF Relay Module - The PXI‑2542 is a terminated switch module suited for routing RF signals for production test applications. It features high-performance solid-state relays that offer unique benefits such as unlimited mechanical lifetime and fast switching time. Front-mounted SMA connectors provide easy connection to your RF devices, and the module features termination on every COM line and channel. The channel termination and COM lines help minimize reflections of the RF signal and protect your instruments.

  • NI-9236, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module

    785996-01 - NI

    10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9236 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9236 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 V rms transient isolation, providing high‑common‑mode noise rejection and increased safety.

  • NI-9236, 10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module

    779994-02 - NI

    10 kS/s/channel, 350 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9236 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9236 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 V rms transient isolation, providing high‑common‑mode noise rejection and increased safety.

  • NI-9235, 10 kS/s/channel, 120 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module

    785995-01 - NI

    10 kS/s/channel, 120 Ω Quarter-Bridge Strain Gage, 8-Channel C Series Strain/Bridge Input Module - The NI‑9235 measures dynamic strain on all channels simultaneously, allowing for synchronized, high-speed measurements. This capability is important for applications, such as impact tests, that require comparison across many channels at a particular instant in time. The NI‑9235 includes built-in voltage excitation for quarter-bridge sensors. It also has 60 VDC isolation and 1,000 Vrms transient isolation, providing high‑common‑mode noise rejection and increased safety.

  • ATE Development Services

    Cyth Systems, Inc

    Automated Testing Engineering and Automated Test Equipment (ATE) provide a faster, more efficient way to test your product. With the help of LabVIEW and Modular Instruments, our engineers create test and measurement systems for all areas of product design and manufacturing.Whether you are in early stage R&D prototype testing, and design validation, or providing a solution for quality control and life testing our engineers can work with you to design fully customized automated Test Systems using entirely off-the-shelf products to ensure you deliver quality product on time.

  • Solid State Bidirectional Relay Designed for High-Speed Switching in ATE Systems

    Series FB - Teledyne Defense Electronics Relays & Coax Switch

    The Series FB relay is an advanced solid-state bidirectional relay designed specifically for high-speed switching in ATE systems. These devices provide high reliability, low life-cycle cost and exceptional switch performance. The FB has very fast turn-on times of under 1 msec. Optical coupling minimizes EMI generation.MSL 1​Available options include:FB00CD 2Adc, 80Vdc DC-Load; ±1Adc, ±80Vdc AC-Load; 10-25mAdc Control​FB00FC 1Adc, 180Vdc DC-Load; ±0.5Adc, ±180Vdc AC-Load; 10-25mAdc Control​FB00KB 0.5Adc, 350Vdc DC-Load; ±0.25Adc, ±350Vdc AC-Load; 10-25mAdc Control

  • END-to-END VALIDATION TESTING

    SANBlaze Technology, Inc.

    SANBlaze VirtuaLUN NVMe Initiator is the key piece of test equipment for anyone needing to test NVMe target devices. The VirtuaLUN feature set provides a unique set of functions applicable in all aspects of a product lifecycle; from development to design validation to test and QA. The ability to drive NVMe targets with a wide range of configurable attributes provides engineers with a flexible, scalable tool to simulate real disk and memory access environments and issues. Development, qualification and certification test cycles can be highly automated, reducing time and surfacing issues and errors.

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