Showing results: 3226 - 3240 of 5359 items found.
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Multiple Current Shunt -
Ohm-Labs, Inc.
*IMPROVED ACCURACY*WIDE RANGE: <1 TO 300 A*HIGH IMMUNITY FROM AMBIENT TEMPERATURE CHANGESDC OR AC USE*TRANSPORTABLE*CUSTOM VALUES AVAILABLEWith new features, Ohm-Labs' model MCS Multiple Current Shunt for the first time overcomes much of the chief problem with accurate current measurement.
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IP-CAN -
Dynamic Engineering
The IP Module driver can be instantiated multiple times to control multiple cards by the same CPU. IP-CAN when coupled with the Dynamic Driver "knows" what slot it is in and which carrier it is installed into. The slot and carrier information is required when using multiple cards in a PCI/PCIe system with dynamic address assignment.
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Intusoft
Test Designer is today's only complete design simulation and verification system for analog, mixed-signal and mixed-systems design, which also features full fault and test synthesis capability. For the first time ever, engineers can efficiently design, simulate and test complex analog and mixed-signal circuitry in the design cycle
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LumiTop 4000 / 2700 -
Instrument Systems Optische Messtechnik GmbH
The patented optical design permits simultaneous measurement of all three sensors in one shot. The accurate spectral measurement is used as a live reference and transferred to the complete display area of the camera. This makes for extremely short measurement times and all relevant optical tests are conducted in a single test station.
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TF152B -
TESTEX Testing Equipment Systems Ltd.
Seat Seam Fatigue Tester is mainly used to test the seam fatigue (dynamic or static) of automobile interior materials such as fabric or leather, this fatigue test is determined by simulating the real vibration when driving.Colorful touch panel is equipped to set and control tests, and displays the test cycles, time. etc.
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236 -
GME Technology
This In-circuit ESR & DCR capacitor tester is designed to measure ESR (equivalent Series Resistance) on capacitors range from 0.47uF to 2200uF, in or out of circuit. The ability to trouble shoot in-circuit saves time and makes the 236 a must for anyone that tests or trouble shoots PCB (printed circuit boards).
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RQVME2-1553 -
Abaco Systems Inc
The RQVME2-1553 provides new levels of performance and flexibility for MIL-STD-1553A and B Notice II on the VMEbus. Available in commercial, industrial and conductively cooled versions with one, two or four dual-redundant channels, the RQVME2-1553 includes advanced API (Application Programming Interface) software that reduces application development time.
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NI
PXI Source Measure Units (SMUs) combine high-precision source and measure capability with features designed to reduce test time and increase flexibility. These features include high channel density for building parallel SMU test systems, deterministic hardware sequencing for minimizing software overhead, and high-speed update and sample rates for quickly changing setpoints and acquiring data. Additionally, the flexible sampling rate and streaming capability of PXI SMUs allows you to use the instrument as a digitizer to capture transient behavior, and the digital control loop gives you the ability to adjust the transient response of the instrument. The ability to change the transient behavior of the SMU, called SourceAdapt, reduces SMU settling time and minimizes overshoot and oscillations, even with highly capacitive loads.
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PLZ-4WL Series -
Kikusui Electronics Corp.
While the PLZ-4WL series succeeds to the superior operability of our conventional model of the PLZ-4W series, the PLZ-4WL series realizes the high speed rise and fall time (slew rate of 50A/µs.) in the range of low voltage with large current. The PLZ-4WL offers six operation modes, and equips with various features such as sequence operation, switching operation, soft-start function, and time and voltage measurement. The PLZ-4WL applies not only for the conventional load test of the CPU power supply, but also it can be applied to even faster current response test. In addition, the PLZ-4WL is a space-saving design (about 50% less volume of the conventional model) that can save the facility space of the testing site, and it can be applied for the single cell testing of the large scale rechargeable battery.
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A8a -
atg Luther & Maelzer
The A8a test system provides the flexibility of flying probe testers while delivering high throughput testing for bare board printed circuit boards (PCBs). The target market for the A8a is the electrical test of tablet and PC motherboards and high density interconnect (HDI) products for smart phones. The A8a is designed for high productivity, reliability and test accuracy. To achieve high throughput the key feature of the A8a is a new dual shuttle system, which reduces the product exchange time to zero seconds in automation mode. In combination with the fast test speed of up to 140 measurements/second the A8a will give customers a competitive test solution for batches up to 5000 boards. A typical cycle time of a 4-up smart phone board is about 2 minutes.
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TAC1000 -
Rhesca Co., Ltd.
For the measurement of tackiness (instantaneous adhesive strength) of various pastes and adhesive tapes, it is possible to quantitatively evaluate the data, which until now had large errors due to individual differences. First, press the measuring probe, which is controlled (approach speed, pressure force, pressure time, separation speed) against the sample, and measure the adhesive force in the process of separating. Measured data can be processed by a computer. With double temperature control (patented), the sample piece is preheated from the back side with a hot plate and the heated probe penetrates the measurement surface, making it possible to keep the set temperature and the temperature of the test surface to be evaluated constant. Since the pressurization time can be as short as 10msec, it is possible to measure the tackiness caused by momentary contact.
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EM Electronics
The EM A10 is a low level amplifier module for sensitive measurements, data collection and systems, where signals below 1 nanovolt may be measured. It is ideal for the input unit for precision voltage measuring systems, requiring voltage sensitivity for measuring low noise and low impedance sources. The noise level of the A10 is equivalent to a perfect resistor of about 20 ohms. When used with a digital voltmeter, steady one nanovolt digits may be displayed, with a response time constant of less than a second. The input voltage stability of the A10 is very high, with the drift around a nanovolt per degree C. The input connectors are made from pure copper. The input impedance is very high, and is time dependent, determined by the loop gain.
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TCG 02-G -
Tekron International Ltd
The TCG 02-G is a highly accurate, full featured GPS and GLONASS (GNSS) clock. Offering multiple oscillator options, Time Code and Frequency outputs, it fits virtually any timing application. With enhanced cyber security features that support NERC CIP requirements, the TCG 02-G is designed for use in modern day smart grid / smart substations, electricity distribution, transmission, and generation protection. In addition industrial application systems and traditional substations are equally provided for. This master clock synchronizes multiple IEDs (Intelligent Electronic Devices) within a network, including protection relays, synchrophasors, event recording and remote telemetry units to enable accurate time stamping. The TCG 02-G is available as a base unit or with one of three expansion module options.
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782110-01 -
NI
TCXO, GPS, IRIG-B, IEEE 1588 PXI Synchronization Module—The PXI‑6683 timing and synchronization modules synchronize PXI and PXI Express systems using GPS, IEEE 1588, and IRIG‑B to perform synchronous events. The PXI‑6683 can generate events and clock signals at specified synchronized future times and timestamp input events with the synchronized system time. The PXI‑6683 features an onboard temperature-compensated crystal oscillator (TCXO) that can be disciplined to GPS, IEEE 1588, and IRIG‑B for long-term stability. You also can use the PXI‑6683 to route clock signals and triggers with low skew within a PXI chassis or between multiple chassis, providing you a method for synchronizing multiple devices in a PXI system.
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782109-01 -
NI
TCXO, GPS, IRIG-B, IEEE 1588 PXI Synchronization Module - The PXI‑6683 timing and synchronization modules synchronize PXI and PXI Express systems using GPS, IEEE 1588, and IRIG‑B to perform synchronous events. The PXI‑6683 can generate events and clock signals at specified … synchronized future times and timestamp input events with the synchronized system time. The PXI‑6683 features an onboard temperature-compensated crystal oscillator (TCXO) that can be disciplined to GPS, IEEE 1588, and IRIG‑B for long-term stability. You also can use the PXI‑6683 to route clock signals and triggers with low skew within a PXI chassis or between multiple chassis, providing you a method for synchronizing multiple devices in a PXI system.
