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Showing results: 7996 - 8010 of 8449 items found.

  • Bench hardness testers

    NovoTest

    Digital Brinell Hardness Tester NOVOTEST TB-B-C has 10 steps testing force settings, allows user to measure hardness values with each of 10 Brinell hardness scales. The device uses the round type of indenter along with the control system. It is highly accurate, gives repeatable results, reliable and easy to operate.Digital Brinell Hardness Tester NOVOTEST TB-B-C has fully automatically test cycle: loading, dwell and unloading. As a result, the operator errors don’t influence on measuring results.Motorized indenter and electronic control system allow making measurements with high accuracy. Absence of mechanical weighs reduce problems of friction and vibration sensitivity of the machine.

  • Three Phase Power Analyzer

    Model PA-600 - Gopal Electronics

    Power Analyzer Model PA-600 is having advanced measurement capability which gives accurate measurement also at low power factor such as 0.1PF with 0.1% basic accuracy. 16 bit microcontroller and 24bit Analog to digital converter performs accurate measurement & calculation of Voltage, current, power, power factor, crest factor, form factor and frequency with any load and signals of frequencies from 30 Hz to 800 Hz. PA600 is most applicable for no load and full load testing of distribution and power transformer. You can read true RMS value, peak value, mean value and average value of any parameter simultaneously in LCD display.

  • Automated AC Digital Hipot Tester

    Educated Design & Development, Inc.

    1 button testing - No setup required, just plug right in! Or, make a plug for your cordless product, and plug right in! EASY!Easy to identify PASS / FAIL visible and audible indicationAuto Test Time (1 sec. / 60 sec.)+ - No need to set a timer or clock watchSafety Protected Start Switch -- Protects user from shock!Performs the Low Current Ground Continuity test at the same timeMeets UL, CSA, CE, EN, IEC, MIL and all other international safety agency requirements as well as UL 120Kohm requirementsIncludes ISO/IEC 17025 Accredited Calibration Certificate, accredited by ACLASS (Internationally accepted results... equivalent to A2LA)

  • Wafer ESD Tester lineup

    Hanwa Electronic Ind. Co.,Ltd.

    ◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.

  • Enerchron® 2.0 Test Management Software

    NH Research, Inc.

    Enerchron 2.0 test management software is a software suite ideally suited for test applications that yield extensive data over an extended period of time such as battery cycling and evaluation. It allows the creation of complex, dynamic test sequences without requiring the skills of a programmer. In addition to real-time viewing during execution, measurements are automatically archived for review and analysis after testing has been completed. Enerchron is available with NH Research’s Regenerative Battery Test System (Model 9200) or can be used to control additional Battery Test Systems, NHR air-cooled electronic loads, power supplies, temperature chambers, and data acquisition devices that measure temperature and pressure.

  • Multiport Electromechanical Coaxial Switch, DC to 40 GHz, SP4T

    87104D - Keysight Technologies

    The Keysight 87104D multiport switch improves signal accuracy in RF and microwave signal routing and testing applications. This high performance electromechanical switch provides unmatched isolation and a 0.03 dB insertion loss repeatability, which is warranted for the 5-million life cycle of the switch. The 87104D’s low insertion loss repeatability reduces sources of random errors in the measurement path, which improves measurement accuracy. The repeatability and reliability of this switch guarantee measurement accuracy and can cut the cost of ownership by reducing calibration cycles and increasing test system up time. Highly repeatable switching capability is made possible through Keysight's rigorous design and tight manufacturing specifications.

  • Precision DC Power Module, 20V, 50A, 500W

    N6765A - Keysight Technologies

    The Keysight N6765A is a 500 W precision DC power module that provides low noise, and precise control and measurements in the milliampere and microampere region with the ability to simultaneously digitize voltage and current, and capture those measurements in an oscilloscope-like data buffer. This module is used in both the small, multiple output 1U high N6700 Low-Profile Modular Power System (for ATE systems) and the multiple output N6705 DC Power Analyzer (for bench testing). GPIB, LAN, USB and LXI compliance are standard. Select from more than 30 different DC power modules ranging in capability from basic to high precision, and in power from 20-500 Watts.

  • 5 kW and 10 kW RP7900 Series Regenerative Power System

    RP7900 Series - Keysight Technologies

    The RP7900 Series regenerative power system is a family of 5 kW and 10 kW bi-directional, regenerative DC power supplies that reduces the cost of test with highly integrated capabilities. The regenerative capability enables the energy consumed to be put back onto the grid cleanly, saving costs from energy consumption and cooling, while not interfering with the grid. The RP7900 helps you overcome your toughest power test challenges by delivering industry-leading specifications and innovative features in an integrated solution for today's advanced high power automated test equipment (ATE)power testing needs. The RP7900 provides the fastest, most accurate, integrated regenerative power system.

  • PXIe-6386, 8 AI (16-Bit, 14 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module

    785926-01 - NI

    PXIe, 8 AI (16-Bit, 14 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module - The PXIe-6386 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe-6386 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • PXIe-6396, 8 AI (18-Bit, 14 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module

    785927-01 - NI

    PXIe, 8 AI (18-Bit, 14 MS/s/ch), 2 AO, 24 DIO, PXI Multifunction I/O Module - The PXIe-6396 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI-STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PXIe-6396 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included NI-DAQmx driver and configuration utility simplify configuration and measurements.

  • PCIe-7846, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device

    786456-01 - NI

    PCIe, Kintex-7 160T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The PCIe-7846 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals to ensure complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware-in-the-loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe-7846 features a dedicated analog-to-digital converter per channel for independent timing and triggering. This device offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical data acquisition hardware.

  • sbRIO-9218, Non-Enclosed, 24-Bit, 51.2 kS/s/channel, 2-Channel C Series Universal Analog Input Module

    783362-02 - NI

    Non-Enclosed, 24-Bit, 51.2 kS/s/channel, 2-Channel C Series Universal Analog Input Module - The sbRIO‑9218 helps you perform multipurpose testing. With the sbRIO‑9218, you can measure signals from sensors such as strain gages, resistance temperature detectors (RTDs), thermocouples, load cells, and other powered sensors. You also can use the sbRIO‑9218 to perform quarter-bridge, half-bridge, and full-bridge current measurements, with built-in voltage and current excitation. You can individually select and perform a different measurement type on each channel. Additionally, the sbRIO‑9218 features 60 VDC analog input isolation. Non-enclosed modules are designed for OEM applications.

  • PCIe-6374, 4 AI (16-Bit, 3.5 MS/s/ch), 2 AO, 24 DIO, Multifunction I/O Device

    785817-01 - NI

    The PCIe‑6374 is a simultaneous sampling, multifunction DAQ device. It offers analog I/O, digital I/O, four 32‑bit counters, and analog and digital triggering. Onboard NI‑STC3 timing and synchronization technology delivers advanced timing functionality, including independent analog and digital timing engines and retriggerable measurement tasks. The PCIe‑6374 is ideal for a variety of applications, such as IF digitization; transient recording; ISDN, ADSL, and POTS manufacturing test in the telecom industry; ultrasound and sonar testing; and high-energy physics. The included DAQExpress™ companion software provides basic measurement and analysis, while the NI‑DAQmx driver provides the ability to create customized automated measurement and control applications.

  • PCIe-6738, 16-Bit, 32 Channels, 1 MS/s Analog Output Device

    785822-01 - NI

    The PCIe-6738 is a high-speed, high-density analog output device designed to deliver simultaneous, multichannel updates for control and waveform output applications such as stimulus-response tests, including acoustic distortion testing, and simulation such as three-phase power simulation. In addition, the device provides eight 5 V TTL/CMOS digital I/O lines; two 24-bit, 20 MHz counter/timers; and digital triggering and external clocking capabilities. The PCIe-6738 can replace several kinds of instruments, including stand-alone proportional integral derivative (PID) controllers, low-speed arbitrary waveform generators, and function generators. You can control each data point for each channel to define common waveforms, such as square, sine, or sawtooth, as well as complex waveforms.

  • PCIe-7852, Virtex-5 LX50 FPGA, 750 kS/s Multifunction Reconfigurable I/O Device

    781103-01 - NI

    Virtex-5 LX50 FPGA, 750 kS/s Multifunction Reconfigurable I/O Device - The PCIe‑7852 features a user-programmable FPGA for high performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7852 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

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