Showing results: 7921 - 7935 of 8464 items found.
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Excelitas Technologies Corp.
Excelitas Technologies specializes in the design, manufacture, and testing of MIL-STD-1316 compliant Electronic Safe and Arm Devices (ESAD), Electronic Safe, Arm and Fire Devices (ESAF), and Firing Modules (FM) for safe fuzing requirements of both legacy and next-generation missiles and munitions. Our dedicated staff of research and design experts use the latest advances in technology to design smaller, lighter, and more cost effective ESAFs and FMs to meet evolving requirements of newer more sophisticated weapon systems. Capabilities include a line of components and subsystems that have been qualified for hard target penetration environments and next-generation smaller-class munitions.
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ATS3000A -
Astronics Corporation
The ATS3000A is designed using Astronics Test Systems’ proven Synthetic Instrumentation architecture. Featuring 23 instruments, and both Automated and Standalone modes to test, record, and diagnose faults, the unit provides complete RF, Analog and Digital capabilities. The ATS3000A also includes the sophisticated IF and baseband I/Q Digital Signal Processing required for modern radios. The fieldupgradeable, software-defined architecture features easy-touse graphical user interfaces and enables testing with minimal operator intervention. Test Program Sets areavailable for a full range of tactical radios, or you can create new TPSs easily using the included TestEZ® software suite.
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CAT 1 TEST -
Monacor International GmbH & Co. KG
Line tester for continuity testing of Cat 5, Cat 6 and ISDN network cables*Connection test with LED display for 8 individual wires and shielding*Continuity, miswire, open, short, crossover, and ground detection*Connector compatibility with the following modular plugs: RJ45 (8P8C), RJ12 (6P6C), RJ11(6P4C, 6P2C)*Network standards supported: Token Ring, 10Base-T, 10Base-T2, 285A, TIA568A/568B*Separate receiver for particularly long and complex cables*The main unit and separate receiver can be attached to one another using a guide rail on the side*Power supply via 9 V block battery (not included)*Supplied with protective bag
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ACMAS Technologies Pvt. Ltd.
Aging Chamber has been designed to simulate environmental condition to test the stability and reliability of products under stressed environment. Weiber is a leading manufacturer and supplier of Aging Test Chamber in India and abroad. Weiber offers scientific equipments at the most economical rates and versatile design. Microprocessor based Aging Test Chambers are made in accordance with the international testing standards. The equipments are NABL, NSF certified and CE approved. Aging Chamber maintains 25% to 95 % RH. The Test Chamber is digitally controlled delivering accurate result under controlled environmental conditions. This chamber also known as Accelerated Ageing Test Chamber.
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PCIe-9529 -
ADLINK Technology Inc.
The ADLINK PCIe/PXIe-9529 is a high-performance, high density, 8-CH analog input dynamic signal acquisition module. The PCIe/PXIe-9529 features eight 24-bit simultaneously sampling analog input channels. The 24-bit sigma-delta ADC provides a sampling rate of 192 kS/s at high resolution, making it ideal for higher dynamic range signal measurement. All channels are sampled simultaneously and accept input range up to ±10V, and the analog inputs support software-selectable AC or DC coupling and 4 mA bias current for integrated electronic piezoelectric (IEPE) sensors. The module is especially designed to meet the requirements of vibration analysis and audio testing.
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LXinstruments GmbH
The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.
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K-900 -
Kongter Test & Measurement Co., Limited
K-900 series are your best choice DC load bank with Kongter’s updated solutions. This new series resistive dummy load includes a series customized load bank models that feature rugged design and and excellent performance. They facilitate your work for DC load and battery capacity testing. With different models of DC load bank, it covers a wide range from 12V to 480V nominal voltages with current up to 600A. Its big TFT touch screen with vivid display makes it more user-friendly for setting and operation. Kongter’s new PC software make it easy for measurement monitoring and report print out.
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Ralston Instruments
High-precision calibration & pressure testing is the key to success in the oil & gas, petrochemical, maritime, pharmaceutical and aerospace industries and the right calibration tools make all the difference. Ralston Instruments offers a wide array of intelligently designed, high-quality calibration test pumps that simplify complex calibration processes while providing fast, accurate results. All Ralston pressure test pumps are lightweight, extremely durable, and easy to disassemble and repair with standard hand tools. And for quick connectivity with the most effective results, they all come with Ralston Quick-test™ adapters for safe, stable, leak-free connections without the need for a wrench or thread tape.
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ScanDIMM -
Corelis, Inc.
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
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Teledyne LeCroy
Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.
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JTAG Technologies Inc.
While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).
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595 -
Electronic Specialties Inc.
The #595 is a premier automotive diagnostic tool. It is equipped with the latest testing capabilities, including Milliseconds Pulse Width, for measuring the on-time of fuel injectors. The #595 features a huge LCD display w/bargraph for easy viewing. This meter can even be interfaced to your PC or notebook computer for enhanced diagnostics and data presentation. The software and computer interface cable are included free! The #595 includes two sets of test leads, RPM pick-up, temperature probe, software CD, interface cable, protective holster, 9 volt battery, instructions manual and hard storage case. Inductive RPM pick-up features a five position, adjustable sensitivity switch.
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780588-01 -
NI
Non-Enclosed, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The sbRIO‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three sbRIO‑9225 channels. Non-enclosed modules are designed for OEM applications.
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783200-02 -
NI
Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7845 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7845 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.
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783200-01 -
NI
Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7845 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7845 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.
