Test Programming
Consulting companies that provide/develop complete testing solutions or specific software capabilities or tools, and even end-product operation and maintenance training. Using a combination of original and generic capabilities, they save time, resources, and costs of the production company. (teradyne.com)
- CAMI Research Inc.
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Pin-Mapping for Custom Connectors, Test Fixtures, UUTs | Cable & Harness Testers
PinMap™
Check out this fast and super-easy pin-mapping process enabled by our optional CableEye® PinMap™ software. Map as fast as you can move the probe from one pin to the next. Use on your custom connectors, test fixtures, specially-built connector panels, or pigtail adapters to your CableEye tester. This software assigns test point numbers to connector types and applies standard pin designations to the pin numbers. For each custom connector, first choose a connector graphic from our large libr...show more -
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GLP2 Luminaries/LED Tester
Safety, function, programming and controlling of LED Lighting from one device. Dramatically reduces set up and test times. Ease of use eliminates errors.
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Test Adapter
Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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4X14 Gb/s QSFP/QSFP+ Evaluation Board
EV-QSFP-174
The EV‐QSFP‐174 QSFP/QSFP+ Host Test Board comes complete with Windows based software (Windows XP & above) to enable intuitive memory map programming and testing, controlled via a mini B USB port. It is designed to simulate an ideal environment for QSFP/QSFP+ transceiver module testing, characterization and manufacturing test. Its high speed properties make the host board as electrically transparent as possible, allowing for a more accurate assessment of the module’s performance.
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Adjustable Clamshell Bed of Nails Testers
AdjustaBON Family
Designed for quick test development. This fixture can be configured to probe almost any circuit board in just a few hours. Once the perfect test is developed, move this light weight fixture out to the production floor to evaluate your production line test strategy prior to buying permanently drilled test fixtures, or while waiting for your drilled fixtures to be delivered. The AdjustaBON competes with the Flying Prober. There are many advantages over the flying prober. Setup is simple and intuit...show more -
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Analog Mixed Signal Testers
- PC-performance independent: multiple SPEA CPUs provide test program timing, while pc replacement does not require the test program requalification- Pattern-based programming: -30% test time vs competitors- 64-line synchrobus and 16-line high-speed synchrobus for real-time instrument synchronization: no embedded delay when running pattern-based testing- 99% parallel test efficiency- Multi-site test capabilities for up to 256 devices in parallel- High-density, floating instruments, for true parallel analog test- Universal slot architecture, up to 1,408 channels- RF generators up to 3 GHz
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x1149 Boundary Scan Analyzer
N1125A
The x1149 is a tool for engineers to perform structural test such as opens and shorts tests on their PCBAs. It also performs In-System Programming for devices such as FPGAs and CPLDs.
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Digital Test Instruments
High-performance VXI and PXI instruments for digital functional test. Teradyne’s Di-Series and eDigital-Series digital test instruments address technologies such as low voltage differential signaling (LVDS), while maintaining full capability to support legacy test requirements. In addition to excellent reliability, these instruments reduce test system footprint, programming and support effort, and overall cost-of-ownership.
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XJLink2-3070
The XJLink2-3070, approved by Keysight Technologies, provides convenient, integrated access to XJTAG’s powerful boundary scan test and programming tools from Keysight (Agilent) i3070 ICT machines.
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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T6990 ENTRY LEVEL ABSOLUTE PRESSURE DECAY LEAK TESTER
T6990, recalculating the success of its predecessor M6990, an obviously enhanced user interface, thanks to an innovative tempered glass panel with built-in capacitive keyboard, around a 3.5” colour display.The new, high resolution display makes it even easier to view the test cycle and the programming menus, and the capacitive keyboard allows fast parameter entry.
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NI Software Suites
NI software suites aggregate the most popular LabVIEW add-ons and other application software typically combined with LabVIEW and other development environments to help you build test, design, and control applications. Each suite, excluding the Multi-IDE Bundle and the Software Platform Bundle, also includes one year of unlimited access to professional training and certification.The suites come with related NI device drivers and are shipped on USB 3.0 media to speed up your installation.The NI Au...show more -
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Digital Test Instrumentation
Di-Series™
The Di-Series tests all levels of integration from board level (SRA/SRU) to box level (WRA/LRU) units under test (UUTs), while maintaining full compatibility with previous generations of Teradyne instrumentation and systems. Excellent usability and reliability reduce programming and support effort, as well as straightforward upgrades of existing test program sets (TPS).
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PXI Software
Keysight modular products include software tools to help you quickly access your test equipment and make measurements. The Keysight IO Libraries Suite allows you to display and configure all of the modules in your system such as LXI, VXI, PXI, AXIe and USB. In addition, software drivers support the most common programming environments such as Visual Studio, C, C++, Visual Basic, MATLAB and LabVIEW.
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Microelectronic Services
Services for ASIC houses and Integrated Device Manufacturers are IC Wafer / Final Test, IC assembly, Test Program development, product engineering, Flash / EEPROM programming, characterisation / capability studies, yield enhancement, design verification and failure / yield analysis. Das Test Haus are specialists for wafer test, low power, mixed signal and eeprom test.
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Test Programming LabVIEW
With LabVIEW, National Instruments provides an industry standard for developing a test environment.Our employees have many years of experience in many areas of this development environment.
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PXIe Arbitrary Waveform Generator, 500 MSa/s, 16 bit, 200 MHz
M3201A
The M3201A PXIe arbitrary waveform generator is ideal for general purpose AWG automated test requirements. It offers high channel density with high-quality output with low phase noise. The optional real-time sequencing, intermodulation synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including envelope tracking (ET) and DPD (part of PA/FEM reference solution), MIMO, baseband electronics design, wireless device manufacturing, ATE, beamforming and other multi-channel coherent signal generation and multi-channel signal generation.
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TCS Comfort
Maschinenbau Haldenwang GmbH & Co. KG.
Trip distance / tachograph meter integrated into the brake tester (only in conjunction with PC)Electronic control unit TCS shockproof (workshop-oriented) aluminum housing with connection D-Sub 25p / D-Sub 9pEntire operation via integrated time and data display, and your existing PC (OS: Windows).Complete measurement and programming of the tachograph types 1311, 1314, 1318, 8400, FTCO 1319 MTCO 1324, TVI 2400, SE 5000, EFAs, SmarTach, DTCO 1381 incl. Integrated dial measurementLCD 4 rows, 16 digi...show more -
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High-Performance Autoranging DC Power Module, 60V, 17A, 500W
N6756A
The Keysight N6756A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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RF Upconverters
SignalCore offers traditional multi-stage and single-stage RF upconverters, and Direct IQ modulators that feature low phase noise, high dynamic range, wide bandwidth, and continuous tuning. SignalCore RF upconverters are compact and built for mechanical robustness and ruggedness. Applications include various test and measurement applications such as those in point-to-point radio, wireless communication, ATE, and software-defined radio. All products are provided with a Graphical User Interface (GUI), driver, and API for easy programming control.
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Test Engineering
TestEdge engineers have an average of 17 years of engineering experience in test, packaging, and fixturing. This experience is across a wide spectrum of products, customers, and ATE platforms. We have experience in all of the following:Digital, analog, mixed-signal, RF Test programming servicesRemote test capability Semi-automatic test generation Automatic data collection and reduction High performance test fixturing Format independant vector translation High power testing with liquid cooling
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VLSI Test Systems
50/100 MHz clock rate50/100 Mbps data rate1024 I/O pins (Max :1280 I/O pins)Up to 1024 sites Parallel testing32/64 M pattern memoryVarious VI sourceFlexible HW-architecture (Interchangeable I/O, VI, ADDA,)Real parallel trim/match functionTime & frequency measurement unit (TFMU)High-speed time measurement unit (HSTMU)AD/DA test optionSCAN test option (max 1G M/chain)ALPG test option for embedded memorySTDF tools supportTest program/pattern converter(J750, D10, V50, E320, SC312, V7, TRI-6020, ITS9K)User friendly windows 7 environmentCRAFT C/C++ programming languageSW (Software) same as 3380P & 3360P
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T8997 Air Leak Tester/Flow Tester ALL IN ONE
A touch of innovationThe new T8997 leak tester was designed with the idea of combining two different types of measurement in a single instrument, making it suitable for leak tests and flow tests.The new video controller “ForTest MMI” brought a superior level of human-machine interaction, thanks to an innovative capacitive panel in tempered glass, around a splendid 6.2” colour display.Parameter programming is much faster thanks to the new numerical keyboard integrated in the menus, and the big display makes viewing even clearer of the test cycle.
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200KHz / 10000Freq.Point LCR Meter
MCH-2816A
It has high test frequency of 300kHz and 0.01Hz stepping arbitrary programming, and it has 10mV-2V signal level, all making it meet the precision test requirements of production line quality control, in-coming inspection and lab. Its HANDLER, RS232c interfaces are used for the component automatic sorting system, which provides the conditions for computer telecommunication and test recording. Flexible frequency-response analysis:Due to non-ideal inductor, capacitor and resistor, in order to preci...show more -
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PLD ISP Feature, GTE 10.00p
K8220B
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Communication Protocol Test Harness
Simulate Master or Outstation Devices.Monitor Communications.Create Custom Functional Tests with any .NET programming language, Python, or Tcl/Tk scripts.Exercise a device as it will be used on the utility SCADA network.Automatically Perform Conformance Test Procedures.
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In-System Test Programming System
WriteNow
Based on proprietary WriteNow! Technology, the WriteNow! Series of In-System Programmers is a breakthrough in the programming industry. The programmers support a large number of devices from various manufacturers and have a compact size for easy ATE/fixture integration. They work standalone or connected to a host PC, and are provided with easy-to-use software utilities.
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High-Performance Autoranging DC Power Module, 20V, 50A, 500W
N6755A
The Keysight N6755A is a 500 W high-performance, autoranging DC power module that provides low noise, high accuracy and programming speeds that are up to 10 to 50 times faster than other programmable power supplies. Optional high-speed test extension offers an oscilloscope-like digitizer that increases measurement accuracy when viewing high-speed transient or pulse events within the device-under-test (DUT).
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PLD ISP Feature, GTE 10.00p
K8220A
The PLD ISP feature allows the test developer engineer to specify a configuration bitstream file in VCL digital test file, much like programming a Flash memory device. The PLD ISP feature supports multiple PLD configuration data formats are supported including. Serial Vector Format (SVF), Standard Test And Programming Language (STAPL), Jam, Jam Byte Code (JBC) object files.
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Test Executive for Visual Development, Database Storage, and Run-Time Execution of Test Strategies
TestBase
TYX TestBase is a test executive that supports the visual development, database storage and run-time execution of test strategies (also known as test plans or test sequences).TestBase integrates third-party applications such as: test programming languages, document viewers, report generators, database engines, Configuration Management systems and diagnostic tools.Its modular and open architecture enables system integrators and end-users to customize and extend the product and to integrate additional third-party applications.
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PXIe Digitizer: 500 MSa/s, 14 bit, 200 MHz
M3102A
The M3102A PXIe digitizer is ideal for general purpose digitizer automated test requirements. It offers high channel density with an advanced data acquisition systems (DAQ). The optional real-time sequencing, inter-module synchronization, and graphical FPGA programming software tools expand its capability to enable a number of solutions including angle of arrival (AoA), baseband electronics designs, wireless device manufacturing and multi-channel coherent signal acquisition.
