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Pulse Adapter
CV5P350
Frothingham Electronics Corporation
The CV5 P350 station is the first mid power pulser in a series of exponential pulse generators that can be connected to an FEC200E tester. This gives you all the versatility of the proven FEC200 with the addition of high power exponential pulses. For exponential pulses up to the 10/1000, the CV5 P350 can produce up to 5KW, 500A, or 350V whichever is most limiting. It can also test all of the usual FEC200 tests in the same test program.
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NIBP Simulator
SC-3 SimCube®
This NIBP only simulator provides features to perform basic NIBP testing of a patient monitor. Features one-button operation for quick testing of patient monitors and optional Battery Boost Option. Optional accessories provide all you need to test the NIBP parameter on any type of patient monitor.
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Speedometer Test Bench
Maschinenbau Haldenwang GmbH & Co. KG.
Tachometer tester for cars and commercial vehicles.
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Test Equipment
Shenzhen Star Instrument Co., Ltd.
Star Instrument Test Equipment - reference meters, test analyzers, power supplies, and more.
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Wireless Device Functional Test Reference Solution
The Keysight S8890A Wireless Device Functional Test Reference Solution provides an automation environment which is both simple to use, yet comprehensive and powerful. Based on the Test Automation Platform www.keysight.com/find/TAP, S8890A provides optional instrument driver/plug-ins offering simplified logically grouped control steps. These steps can be sequenced, looped and swept to provide powerful individual test cases or comprehensive sequences. Each driver/plug-in is provided with extensive starter sample test cases which can be modified by Keysight or the end user the UE to be tested. Plug-in options:
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Computer Automated Data Acquisition
System 471
The NEFF System 471 (S471) DAS is a complete moderate-speed DAS for use in computer-based applications. The S471 is designed primarily for computer automated data acquisition in test facilities, laboratories and industrial plants or wherever a moderate-speed, high accuracy DAS operating in high common-mode voltage environments is required.
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Rackmount Test Enclosure, ≥100 DB Isolation, 300 MHz - 18 GHz
dbSAFE RME
RF enclosures are now a necessity for testing wireless devices. The rackmount dbSAFE RME offers unmatched isolation in its class; up to 100 dB* from 300 MHz to 18 GHz. The dbSAFE RME has been engineered from the ground up to provide superior RF isolation and performance while being cost-effective. This premium isolation shielded box can be designed and manufactured to almost any size and dimensions.
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Lightwave Transmitter Analyzer Bundle
N4364A
The N4364A Lightwave Transmitter Analyzer Bundle consists of a calibrated OE-converter - the N4377A Lightwave Detector - and Vector Network Analyzer - either from the PNA- or from the Streamline Series USB-family - and is a cost-effective solution to test the frequency response of optical transmitters such as directly modulated lasers diodes (DMLs), Mach-Zehnder Modulators (MZMs) or other devices.
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In-Circuit Test Applications
With decades of experience developing test fixtures, we are the recognized industry leaders for solid and reliable quality as well as our outstanding customer service. We fully support our products locally and worldwide for maintenance, repair, and ECO work. Also, 100% wiring verification is part of our Quality Control process, by utilizing automated verification machines for GenRad/Teradyne and HP/Agilent fixture.
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Precise Temperature Forcing System
TA-5000A Series
The ThermalAir TA-5000 Series of temperature forcing systems bring precise thermal testing capabilities directly to your test application, exactly localizing to where thermal conditioning temperature cycling is required. ThermalAir TA-5000 temperature systems provide flexible thermal test solutions for an array of products and technologies.
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Analog In-Circuit Tester
406C
The 406C is an open architecture power up test platform designed to facilitate the implementation of functional testing after the MDA test is completed. Internally dubbed as "Armadillo" the new architecture provides the user almost unlimited flexibility by combining the best of the VME buss and a dedicated ICT buss.
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Toroidal Turns Analyzer
1000
International Electro-Magnetics, Inc.
The Model 1000 is designed to be used in production environments to test for actual turns on toroidal cores. It is able to test single winding toroids as well as multiple windings. It automatically compensates for variations in core permeability.
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Advanced Throughput Multiplier Feature, GTE 10.00p
K8215A
The Advanced Throughput Multiplier feature allows you to test up to two 1000 to 2000 node (between 1296 and 2592 nodes) boards simultaneously on a 4 module tester, thus dividing the test time by half.
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Burn-In Test Sockets
The selection of the test socket is critical to the performance of a device during qualification testing where electrical bias and signals are applied. Key factors such as mechanical compatibility, operating temperature, ability to withstand high moisture levels, signal speed and lead inductance/capacitance all need to be taken into account when selecting the best socket for the test application.
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12/24/36V Conductance Battery Tester
MBT200
Tests 12V heavy-duty auto, truck, commercial, and marine batteries and 12/24/36V starter and charging systems including 42V mild hybrid systems. Eliminate tester input errors by choosing between automotive/truck battery or small automotive type batteries. LED bar graph immediately displays battery condition upon pressing TEST button. No conversion tables needed for CCA, SAE, IEC, EN or Ah. 390 to 650 CCA range (auto) and 650 to 1700 CCA range (truck).
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Quad Channel Mixed Signal Oscilloscope
BS445
BS442 combines 4 independent analog channels and 8 time synchronized logic channels in one powerful test instrument. Consider modern embedded systems, component video, 3-phase motor control, process control, 3D robotics, and automotive systems.
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PC Speed Testing and Benchmarking
PassMark PerformanceTest
Fast, easy to use, PC speed testing and benchmarking. PassMark PerformanceTest ? allows you to objectively benchmark a PC using a variety of different speed tests and compare the results to other computers.
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Fume Hood Testing
Test mannequin to simulate a human breathing zone. Comes with a manikin, lab coat, manikin stand, and soft carrying case.
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Compact & Flexible Test Systems for FCT,ICT, ISP and Boundary Scan Designed for Easy Integration
LEON Rack
The LEONRack test system is a flexible test system that could be installed in automation or handling solutions. It is highly flexible and available in three different chassis sizes from low pin count to high pin count test systems. As part of the LEON Family, LEONRack is based on the ABex platform which directly incorporates Konrad analog bus technology and PXI/PXIe in one chassis.
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PCI High Density Pecision Resistor Card, 4-Channel, 2.5Ω To 925Ω
50-298-121
The 50-298-121 is a high density programmable resistor card with 4 channels which can be set between 2.5Ω and 925Ω with 0.25Ω resolution The 50-298 range provides a simple solution for applications requiring accurate simulation of resistive sensors. The 40-298 is available in a variety of resistance ranges and resolution capabilities that meet the needs of most functional test systems. It is particularly well suited to applications such as the testing of engine controllers where resistive sensors provide information on parameters such as temperature.
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Scienlab Battery Test System – Pack Level, 110 KW Compact Version
SL1710A
Keysight’s SL1700A Scienlab Battery Test System – Pack Level Series allows to realistically emulate the environment of the future battery pack application in order to test the high-power battery pack comprehensively and improve its functions and safety. The growing demand of e-mobility increases the need of vast battery test labs for EV battery development. Keysight developed the SL1700A Series to accelerate the development and validation of batteries. It offers a voltage range of up to 1500 V a...show more -
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500 Watt AC/DC Power Line Conditioner, 3U VPX, Holdup Time
VPX56-3HU
NAI's VPX56-3HU is a rugged, high-performance 500-Watt Output +28 VDC Input 3U VPX AC/DC Power Line Conditioner designed for aerospace, defense, and industrial markets. This off-the-shelf power supply plugs directly into a standard VPX conduction cooled chassis and protects downstream DC-DC converters from MIL-STD-704 transients, low-voltage conditions and power interruptions, providing up to 50 milliseconds of holdup time at up to 500-Watts. Continuous Background Built-In-Test (BIT) and I2C communication are included.
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Sharp Edge Tester
UI-T03
Sharp Edge Tester is used to test if toy or other test sample has hazardous sharp edge or not.
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PCI-4065, 6½-Digit, ±300 V, PCI Digital Multimeter Device
779770-01
The PCI‑4065 makes AC/DC voltage, AC/DC current, and 2‑ or 4‑wire resistance measurements, as well as diode tests. It is ideally suited for OEMs, educational laboratories, or other cost-conscious test and measurement applications.
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Analyzers and Timers
CAT Advanced Series
Description The Advanced CAT Series Analyzers and Timers are stand-alone or PC-controlled digital instruments for circuit breaker status evaluation. Timing channels record arc closing and opening, resistance and auxiliary contacts. The main contact channels can also measure the resistance value of pre-insertion resistors (if present in the breaker). The advanced CAT series records graphs of the opening and closing coil currents and the movements of the moving parts of the high and medium voltage...show more -
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UV Chamber
In PV modules, many different components are exposed to the sunlight. Therefore, the IEC 61215 defines a UV preconditioning test (MQT 10) to test whether these components can withstand the UV radiation of the sun. In our test chamber, the UV radiation is up to five times the sun intensity to accelerate the test, as requested in the UV preconditioning test.
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Thermal Test Chip
Thermal Engineering Associates, Inc.
Thermal Test Chips (TTC) are used in many different Applications: Package Thermal Characterization, Heat Source Simulator, Temperature Reference Platform, Transient Analysis, System Thermal Management Design, Thermal Interface Material (TIM) Measurement & Characterization, Heat Sink Measurement & Characterization.
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Impact Test Apparatus
SCR Elektroniks make Impact Test Apparatus is used to test the Electrical Accessories / appliances for their mechanical strength.
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Java Test Platform
JUnit 5
JUnit 5 is the next generation of JUnit. The goal is to create an up-to-date foundation for developer-side testing on the JVM. This includes focusing on Java 8 and above, as well as enabling many different styles of testing.
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Dual RF Shielded Test Enclosure
JRE 0814-2R
Containing all the capability of the larger JRE enclosures, the rack mounted 0814-2R is ideal for testing devices with a tall form factor. Two independent 0814 series enclosures are mounted in one 19 inch rack. Two shielded vents provide excellent cooling and optional fan(s) are available for those hot products. Tough 'honeycomb' vents maintain shielding effectiveness throughout the frequency range. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness.
