Showing results: 3406 - 3420 of 5277 items found.
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Signalysis, Inc.
The Dinger is a fast yet sensitive NDT (non-destructive test) system used for batch or 100% inspection of raw or machined metal cast, fabricated, sintered, forged, die cast, or ceramic parts. It’s built on our IQC foundation that’s in daily production use by customers worldwide, and has tested over a million parts. Dinger allows you to dramatically improve the shipped quality, by quickly and reliably identifying parts with either global or local manufacturing defects.
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EZT-570i -
Cincinnati Sub-Zero Products
The EZT-570i Touch Screen Controller offers a 7" (18mm) or optional 10" (25 mm) touch screen and the latest in test chamber programming for ease of use . The controller comes standard with data logging, data file access via memory stick or PC, Ethernet control and monitoring, alarm notification via email or phone text message, data file backup, full system security, online help & voice assistance in multiple languages and more.
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VerOStack -
Verocel, Inc.
VerOStack examines the binary executable to statically determine the actual worst-case stack size. This is a precise measurement technique not influenced by particular dynamic test runs and their variance based on a particular execution path. Furthermore, it can take into account not only the current program but also other programs that will run on the target at the same time, such as other applications running on a real-time operating system (RTOS) or in combination with the RTOS itself. It can thus provide truly meaningful data on target memory requirements.
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DL6780 -
Di-Log
Testing of AC/ DC voltages from 12 to 690 V AC/DC Continuity testing with optical and acoustic indication Automatic switching between voltage and continuity Phase rotation test system Single pole phase indication Fully compliant with GS38 Fully operational voltage indication even when batteries are discharged Will not trip any RCD when testing across Live and Earth Single pole detection when L2 probe connected above 100V
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Pickering Interfaces Ltd.
The design is fully scalable, allowing a variety of matrix sizes to be offered in a single family. It maintains a close path loss match for all routes through the matrix, minimizing the calibration effort that has to be invested by users in optimizing their test system performance. The design is non-blocking Y to X (or X to Y) allowing any input to be connected to any output. The construction is based on high quality electromechanical relays which provide a fast operating time compared to microwave relays.
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2000A -
SCR ELEKTRONIKS
SCR ELEKTRONIKS have developed “TEMPERATURE RISE TEST BENCH FOR MEDIUM VOLTAGE SWITCH BOARDS” to measure rise in temperature at various points as mentioned in standard at junctions. The set-up consists of a True RMS Constant Current Source (to maintain the Current within + / - 1 % of set value with Digital Indication), PC based control system, Temperature data logging on PC, Servo-Controller and other indications. Digital voltmeter Primary Voltage) indicates the position of auto transformer (variac).
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Analysis Tech Inc.
The Analysis Tech TIM Tester 1300 is an automated test system for measurement of thermal impedance and conductivity on thin, thermally conductive materials of the type frequently used for electronic packaging, as well as a wide variety of flexible or rigid solids and semi-liquid or viscous materials. Generally, the TIM Tester 1300 can accommodate samples with high-to-medium thermal conductivity with contact pressures ranging from 10 to 550 psi (70-3800 kpa) and at sample temperature ranging from 15C to 70C.
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JT 2154 -
JTAG Technologies Inc.
The JT 2154 is an experiment board based on National Semiconductor’s STA111 device, aimed at users looking to utilise addressable bridge/multiplexors within their designs, and thus set-up ‘system level’ JTAG access. The unit can also be used in semi-permanent installations to expand the TAP (Test Access Port) count on JTAG Technologies controllers in order to address highly segmented designs. Built-in support for ScanBridge-type devices within ProVision allows easy set-up of TAP assignments and device addressing.
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781098-01 -
NI
100 kS/s/ch Simultaneous, ±10 V, Isolated, 4-Channel C Series Voltage Output Module - The NI‑9269 is a channel‑to‑channel isolated analog output module. The NI‑9269 adds channel‑to‑channel isolation for increased safety and improved signal quality. Channel‑to‑channel isolation is commonly needed for applications that have multiple electrical systems, such as automotive tests, or industrial applications that are subjected to increased noise and often contain multiple ground planes.
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781098-02 -
NI
100 kS/s/ch Simultaneous, ±10 V, Isolated, 4-Channel C Series Voltage Output Module - The NI‑9269 is a channel‑to‑channel isolated analog output module. The NI‑9269 adds channel‑to‑channel isolation for increased safety and improved signal quality. Channel‑to‑channel isolation is commonly needed for applications that have multiple electrical systems, such as automotive tests, or industrial applications that are subjected to increased noise and often contain multiple ground planes.
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NEOSEM TECHNOLOGY INC
The N3500 is Neosem Technology’s fourth generation memory test system. Specifically designed for Flash Components and Flash Cards, the N3500 tester-on-a-board architecture targets the broadest range of DUT technologies in various form factors and packages. Each Tester Board (or “Blade”) contains 288 I/O pins and 32 DPS supplies. Up to 64 Blades populated in one test head can test over 2000 DUTs in parallel. Neosem Technology’s high parallel DUT count architecture, combined with low capital cost, provides the absolute lowest HVM cost of test.
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DIOEasy -
Marvin Test Solutions, Inc.
DIOEasy offers test engineers an efficient tool for developing, debugging, and executing digital test vectors for Marvin Test Solutions' GX5050 series, GX5150 series, GX5280 series and GX5291, GX5292, GX5293 and GX5295 dynamic digital instruments.Digital I/O (DIO) systems are very complex and typically require a substantial amount of programming effort to define data vectors. In order to simplify vector development, Marvin Test Solutions developed Windows-based DIOEasy, providing users with an easy to use interface. Toolbars and menus provide quick access to vector editing and viewing tools.
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In-Phase Technologies, Inc.
Over two decades ago, In-Phase Technologies founded our company for the purpose of designing and producing reliable high quality RF and microwave Automated Test Equipment (ATE). We continue that tradition today, providing the best, world-class automated test equipment. Our system designs bring together the right combination of Commercial Off the Shelf (COTS) test equipment, custom designed and built Interface Test Adapters (ITAs), lightning fast and accurate measurement software, and the optimum user interface to make all of this technology easy to use.
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Lorlin Test Systems
The Double-Impact Discrete Component Tester is designed to test small signal and power semiconductor components in both single and multi-device packages or hybrids.. The system uses a Windows 10® 64-BIT OS and a USB 2.0.
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1940000140-0000 -
ELMA Electronic, Inc.
The Elma Electronic VME / VME64x load board provides a means to test the power generated by and cooling capability of VME systems. This makes it easier to locate hot spots in the chassis, so the airflow can be properly directed.
