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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196B
The 16196B surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results, reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement. Now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Mobile Phone Charger Test
MS-165
This equipment is used for inspecting state of travel adapter through AC Input & DC output. Depends on the setting value, OK or NG will displayed.
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TRUE Z-AXIS CAM ACTIVATED TEST FIXTURE KITS
The Cam Press is designed to provide precise, bed-of-nails contact, in a production test environment. Durable aluminum and steel construction and precision bearings insure accuracy and repeatability sufficient to contact test points as close as 10-mils center-to-center.
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AC/DC Hipot Test Set (Gas Type)
YDQ / 570
Wuhan Huatian Electric Power Automation Co., Ltd.
Necessary test equipment for power equipment inspection and preventive test.
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EMI Test Receivers
EMI test receivers; extremely accurate instruments designed to detect electromagnetic emissions rigorously, to ensure all emissions conform to the Standard being tested to. Configured to set up running the required tests for parameters defined by the Standards as simply as possible, including automated test routines. R&S EMI test receivers can be much more too, with a full signal and spectrum analyzer in the same instrument.
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Air-Cooled Universal Test Platform
Diamondx
Diamondx semiconductor test system extends Cohu’s low-cost, high-throughput production test solution platforms to high pin count, higher site count wireless, mobility, SOC, Flat Panel Display drivers, Power Management, and microcontrollers. Designed to meet the cost drivers IC companies face, Diamondx extends Cohu’s leadership in lowering the cost of operations.
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Jandel Test Unit
HM21
The Jandel HM21 Test Unit has six constant current settings between 100nA and 10mA, and can be used to measure voltages from 0.01mV to 1250mV.
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Handset Noise Under RF Test System
BK8021
If you need to evaluate the resistance of cellphones to RF interferance, the BaKo Type BK8021 Handset Noise Under RF Test System is what you need. It performs four tests to evaluate the Sending Noise, Sending Sensitivity, Sending Loudness, Sidetone Masking, Receiving Sensitivity and Receiving Loudness. You run the system using the controlling PC, which allows automatic configuration and which runs the test sequence automatically. When testing is complete, you can print the data as an MS Excel report or save it for comparison and analysis.
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Test Accessories
By combining the latest in LED technology with the unmatched illuminating dynamics of prismatic glass, this High Bay LED luminaire brings a superior, incomparable proficiency and reliability to the table. With its remote driver capability, the TDK HBLED-540 High Bay LED Light Fixture is ideal for EMC chambers with minimal RF emissions.
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Instrument Test Unit
Instrument Test Unit For Advanced Inertial Sensors (INTU) is used for testing and evaluation of Ring Laser Gyro (used in GSLV/PSLV launch vehicles), that detects the angular displacement during rotation. The INTU receives displacement signals from the sensor (RLG) to evaluate the sensor characteristics and also generates signals required towards initiating the action of the sensor.
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Test Systems Integration
Highly flexible test solutions that are cost effective offering basic tests that easily adapts to high product volumes and complicated tests. Mobile computer based test stations provide a wide variety of test solutions at efficient costs.
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The All-In-One Noise Test System
NXA Series
Noise eXtended Technologies S.A.S.
The NXA is a fully automated Phase Noise analyzer. Its dual channel architecture allows the system to use a cross-correlation process to cancel its internal noise floor. This reliable technique provides access to the unique noise floor performance of the DCNTS.
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Receiver Conformance Test Application for IEEE 802.3bm
M8091BMCA
IEEE 802.3bm Receiver Test Application for 25GAUI-1 Chip-to-Module, Chip-to-Chip, Cable and Backplane.
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Automated Test Equipment
These systems test semiconductor performance and quality with industry-leading precision and cost efficiency. Robust support for semiconductor design evaluation, volume production ramps, and yield improvement.
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N Test Finger Nail
TF-24 series
Are designed to perform tests specified in many standards to determine compliance with safety requirements.
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Multi-DUT Mobile & IoT Test System
IQxstream-M
Its ultra-compact design and flexible architecture makes it highly suitable for high volume manufacturing of smartphones, tablets and cellular IoT modules.
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Test Conformance Auditor
ZenTest
ZenTest scans your target and unit-test code and writes your missing code based on simple naming rules, enabling XP at a much quicker pace. ZenTest only works with Ruby and Test::Unit. Nobody uses this tool anymore but it is the package namesake, so it stays.
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Diagnostic Relay Buddy 12/24 Test Kit
193
Relay Buddy 12/24 Pro Test Kit tests five different relays. Relay Buddy is a quick go / no-go tester for the most common automotive relays and this new version tests both 12 and 24 volt relays. . If the relay fails the test, 3 different trouble codes will advise you of the possible causes for the failed relay. The red LED will flash once, twice or three times to indicate the problem. Trouble code definitions are printed on the back of the tester for your convenience.
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Mach Airspeed Test Fixture
TA-6055A
The TA-6055A is a Mach Airspeed Test Fixture built to support the testing and repair of the 2082 and 2083 series of Servoed Mach Airspeed Indicators (SMASI) used in some Boeing aircraft. These mach airspeeds are synchro driven and require a coarse and fine input for altitude and a third input for airspeed. This test fixture was designed around the test procedure and is interfaced with our TA-1001 panel which provides for two of the synchro sources and two Angle Position Indicators (API).
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Wide Measurement Range Model Of Semi-automatic 4 Point Probe Sheet Resistance/resistivity Measurement
RT-3000/RG-2000 (RG-3000)
*User programable measurement pattern & programmable measuring pattern*Tester self-test function, wide measuring range*Thickness, edge, temperature correction for silicon wafer*Film thickness conversion function from sheet resistance*2 types measuring tester (S version: Standard type, H version: High range resistivity measurement type)
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PCB Test System
Circuit Wizard - CW409
Qmax Test Technologies Pvt. Ltd.
CW 409 –Circuit Wizard PCB Test System has all the features of QT9627 such as Desktop PCB Test System. It can be configured to maximum 64 Channels of In-circuit Functional Test Channels and 64 Channels of QSM V-I Signature Test.Maximum Digital Test Speed 10MHz in the QT9627 .It can be connected to any PC/AT or Laptop with Windows 10 operating system through USB Plug and play interface. It operates on user friendly Qmax Test Director software platform with different modes like Test Station for operator level use Test Sequencer mode for Programmer level use and Interactive Workstation mode for quick working.
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Partial Discharge Test System
TPP
The Partial Discharge Test System type TPP is used for non-destructive insulation and quality testing of electrical components (for example according VDE 0110-1, EN 50178, IEC 60270 and IEC 60060).
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In-Circuit Test Fixture Design Services
An integral part of board test is the test fixture. Innovations in board technology may manifest themselves as challenges in test fixture design. Utilizing a creative & systematic design philosophy, Acculogic consistently delivers state of the art solutions for the most complex test interface problems.
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In-Circuit Test
Scorpion ILS 1000
Acculogic's Inline Scorpion is a fully automated in-circuit test system for high volume production with the added advantage of a very fast change over time for different assemblies - less than one minute, including fixture change.
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Battery Pack Rotate Test Device
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's Battery Pack Rotate Test Device Single storage cell safety testTest object: Battery storage pack or systemRotate the battery pack 360°around X axis with rotation speed of 6°/s; secondly rotate it 90°,180°,270°,360°,and remain for one hour after each move. Then stop and observe for 2 hours.Rotate the batter pack 360°around Y axis with rotation speed of 6°/s; secondly rotate it 90°,180°,270°,360°,and remain for one hour after each move. Then stop and observe for 2 hours.Accept standard: B...show more -
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1GbE/10GbE Test Blade with Line-Rate L4-7 Application Performance
Xcellon-Ultra NP Load Module
Keysight Network Applications and Security
Ixia''s Xcellon™ load modules are the highest performing and most scalable application traffic generation solution available in the industry. The Xcellon-Ultra™ NP offers complete layer 2-7 packet generation, routing, and application testing functionality in a single load module.
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Supercapacitor Test
The CT3001A/C battery test systems are upgraded from CT2001A/C with higher precision and data logging rate. The tester can be used to run precision tests for coin cells, pouch cells, prismatic cells, and especially supercapacitors (ultra-capacitors). Each tester has 8 independent channel which can be programmed to run constant current charge/discharge, constant voltage charge, constant power discharge, constant resistant discharge, and direct current internal resistance (DCIR) tests.
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Minigrabber® Test Clip With Banana Jack.
4723
Minigrabber? test clip with banana jack, available in ten colors. This Minigrabber test clip has a standard banana jack built right into the plunger. Excellent for attaching the Grabber test clip directly to the end of a banana plug patch cord.
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Wafer Test Solutions
Wafer Test Solutions has established leadership positions in developing and deploying application-specific test solutions for MEMS devices, offering wafer and frame probing stations suitable for R&D, Wafer Sort, and Final Test. We offer state-of-the-art solutions to test environmental and motion sensors in wafer and other advanced packages.
