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Turn-Up & Maintenance Test Kit
KI-TK083
1310/1490/1550 nm PON power meter, VFL pen, inspection microscope, cleaning materials & accessories, SC/APC connectors
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MultiSite Test sockets and Wafer Level
multi-site sockets include anything from strip test sockets to test sockets for wafer test to multi-position, singulated devices. The advantages of these sockets can be enormous as test time can be decreased by a factor of ten over conventional one up testing. In most cases, the throughput is only limited by tester capabilities and/or handling capacity.
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2.4 MHz Level Test Meter
ET91
*Level Meter, for selective and wideband level measurements with auto ranging*Generator, for the generation of measuring voltage for the test of FDM systems*Bridge, for the measurement of input and output parameter*Spectrum Analyser, for the test of output PSD, cross-talk and other interference signals
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IEC60695 Needle Flame Test Machine
CX-Z18
Shenzhen Chuangxin Instruments Co., Ltd.
Needle Flame Tester is made according to Standard IEC60695 and GB5169, meanwhile it’s a synthesis test equipment that can meet related standard requirements. It’s mainly used to simulate technical evaluation interior equipment. It’s applied to the risk of ignition test of electrotechnical equipment, parts and elements, also suitable for the risk of ignition test of solid electrical insulating materials or other combustible material.
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Airborne Network Flight Test Recorder
TTC nREC-7000
Curtiss-Wright Defense Solutions
The nREC-7000 is a high speed network recorder for use with Flight Test Data Acquisition and Multiplexing units. The nREC-7000 accepts data for recording on two 10GBASE-SR ports and two 1000BASE-T ports that can store data at sustained speeds of up to 1,000 MBps per 10GbE port. The recorder is also capable of acquiring, formatting (using PCAP, DARv3 or IRIG-106 Chapter 10/11), and recording 10GBASE-SR Ethernet at line rate.
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Generator/Analyzer for NFC/EMVCo Manufacturing Test
Micropross MP500 PT1-NFC
Support for ISO 14443 A/B, ISO 15693, MIFARE™, FeliCa™. Measurement correlation with NFC Forum and EMVCo certification test bench. Automated test executive with ready-to-run test sequences. Reader/Writer and Card Emulation modes, resonance frequency measurements supported on same antenna. Embedded analog measurements - LMA, field strength, S11, Q factor, waveform characteristics. Physical parameter/waveshape characteristic definition
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OLED Life Time Test System
A system for measuring measurement items (brightness and so forth through Voltage, Current, and Photodiode) and their lifetime in intervals of set time, while supplying power to multiple (32 Channel) OLED panel stably.
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Integrated Transformer Test Van
XD90
Hangzhou Xihu Electronic Institute
The XD90 integrated modular power system testing vehicle provides an integrated yet flexible solution of preforming a wide selection of normal and specialty tests on power equipment. Designed with the effectiveness and efficiency of power testing in mind, this platform achieves the goal of “integration of functions” instead of just a “combination of instruments”. Not only it provides an abundant means of power testing, but with optimized device placement, operational convenience, and safety factor.
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NFC Conformance Test System
T3111S
The T3111S RIDER NFC Conformance Test System is the Keysight solution for RF Analog and Digital Protocol testing of NFC, EMV and ISO devices. The Test System is based on the Keysight T1141A NFC Test Set and it is complemented by the Keysight's or FIME's robots for accurate and repeatability RF testing. Selected 3rd party positioning robots can also be supported.
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Automate Functional Tests
GXtest
With GXtest you can automate functional tests and find bugs in early stages. GXtest is easy to configure, use and maintain. It allows running the necessary tests to ensure the high quality of the generated software, finding errors when solving them is less costly.
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Test Engineering Projects
Precision Development Consulting Inc
Fiber Optics Test System, Data Collection, Trident Missle Components, PC Board Functional Test and Bearing Tester
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Test Systems
As new products emerge and change, the requirements for the industry also increase becoming more and more challenging. Complex products require demanding and versatile test systems, capable of performing complex test cycles. The ultimate goal is to ensure the validation of the final product during the different stages of the production process.
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Processor-Controlled Test (PCT)
ScanWorks® Processor-Controlled Test
Embedded in that CPU on your circuit board are the instruments that are critical for overcoming today's design challenges. Given the complexity of board designs and chips, you need access to this on-chip technology to diagnose, debug and test your designs. One of the tools that makes up the ScanWorks platform for embedded instruments is Processor-Controlled Test (PCT). It takes advantage of the CPU's debug port for access to the circuit board so it can perform board debug, device initialization, at-speed functional test with structural diagnostics and much more.
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Temperature Humidity Test Chamber
Dongguan Kejian Instrument Co., Ltd.
This equipment can simulate different environment condition. It's appropriate for testing material performance, such as resist heat, resist dry,resist humidity and resist cold. That can define performance of material.
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Variable Optical Attenuator Module for Multimode Fiber Applications
81578A
The Keysight 81578A variable optical attenuator is designed for multimode fiber applications and features lowest insertion loss and excellent wavelength flatness over a complete attenuation range of 60 dB, for characterizing optical network components for telecommunication and data communication in systems.
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Through Connector Functional Test Fixtures
Circuit Check is a pioneer in the development and implementation of access mechanisms enabling testing of circuits through on-board connectors.
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Test Systems Inspection Systems
Different requirements demand flexibility. ELABO boasts a modular product portfolio permitting the economical creation of bespoke solutions for every client. These solutions range from individual testing devices through tabletop workstations with integrated testing equipment all the way to automated systems with ERP connections for mass production.
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"All Weather" IoT Application Image Sensors
IoT Series
Innovation combined with SmartAEC ® function , ultra-low power consumption design enables "all-weather" application terminals to achieve extremely fast startup.
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MCB Thermal Verification Test Bench
The test system is a special version of the thermal test test system in the sense that the test jig is primarily designed to hold and connect multi pole MCBs for thermal verification so that each pole can be verified to trip within the IEC time band after the MCB has been riveted. This test ensures the trip verification of MCB so as to trip all the 4 poles at once when overload is detected in one single pole. In short, this is a verification-only bench.
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Battery Pack PCM Test Equipment
Xiamen WinAck Battery Technology Co., Ltd.
This battery PCM/PCB test equipment is suitable for the basic parameter test and protection function test of lithium battery pack protection board of mobile phone & digital products; it is also used for downloading, comparing and PCB calibration of battery management.
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POWERSTROKE FUEL INJECTOR TEST KIT
DFST20
*Tests Powerstroke engines from 1994 to current*Includes adapters necessary to pressure test the fuel system*Adapters can be used for testing at both the fuel filter and at the fuel pump
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Test Hardware
Development of additional hardware components in-houseCreation of the layout of the developed circuit boards and subsequent production outside the companyAssembly of the printed circuit boardsCreation of additional circuits for test adapters
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DWV/IR Test Systems
When used in conjunction with ART's own parametric relay test systems such as the RT290, the RT900 offers high speed AC and DC Hipot (dielectric withstand voltage) and Leakage testing of relays or other multi-pin passive devices.
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Mini Compact EMC Test Chamber
EMC-MC
Very useful where space is restricted, the EMC-MC will settle into almost any office space. Its small overall size results from the use of our modular SmartShield chamber lined with our AEPH HyPyr-LossTM absorber technology requiring less volumetric space than in a traditional chamber. This mini compact chamber is applicable in pre-compliant EMC and general Research & Development RF testing.
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Test Probes
Test Probes provide the vital link to transfer measurement signals as true and as undistorted as possible. Therefore these elements can be regarded as the heart of Test Fixtures – and for this very reason it is important for Equip-Test to offer high performance Test Probes with best quality and value, and thus ensure maximized ROI (Return of Investment) for our customers. Test Probes supplied by Equip-Test always provide the best-possible available solution for your contacting demands.
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Circuit Breaker Endurance Test System
Endurance testing involves operating – closing and opening – the circuit breaker repeatedly for a set number of cycles. This test is necessary to stabilize the circuit breaker mechanism and to identify “Early Infant Mortality” failures in the switchgear assembly.
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Load Tests
For the production and quality assurance of electric motors and electric drive systems, the use of flexible and customer-specific testing technology is required. Vogelsang & Benning supplies the same to the needs and the application of the customer.
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ScanWorks IJTAG Test
ScanWorks IJTAG Test
The ScanWorks Internal JTAG (IJTAG) tools allow system-on-a-chip (SoC) designers, DFT engineers and validation engineers a new and simpler way to access, control and run any embedded instrument designed into chips. When the IEEE ratifies the IEEE 1687 IJTAG standard in 2013, it will enable easy access to run any functional type of IJTAG instrument. ASSET is the first tool supplier with development tools available today for the early adopters of this important new technology.
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Test Software
American Probe & Technologies, Inc.
This new series of software allows you to analyze materials or semiconductor leakage with all of the capabilities of your HP 4140B to resolutions of 1 fA @ 100VDC. Completely rewritten in Visual Basic for Windows XP operating system, it offers Virtual Front Panel Operation of 4140B for I-V & CV Analysis and allows operator to virtually control the 4140B for any instrument operation. I-V Plots with options of displaying current over time. CV Plots with high resolution plotting capability.
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Threaded Probes Designed for Connector and Harness Test
Equip-Test Threaded Probes Designed for Connector and Harness Test