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Showing results: 9421 - 9435 of 17105 items found.

  • Planar Doped Barrier Detectors

    KRYTAR, Inc.

    KRYTAR Planar Doped Barrier Detectors are specifically designed for use in today's high-performance microwave instrumentation and systems. KRYTAR detectors are designed for such applications as power measurements, analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring and pulsed RF measurements in ultra-broadband and mm-Wave applications.

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  • Zero Bias Schottky Detectors

    KRYTAR, Inc.

    KRYTAR Zero Bias Schottky Detectors are specifically designed for use in today's high-performance microwave instrumentation and systems. KRYTAR detectors are designed for such applications as power measurements, analyzing radar performance, leveling pulsed signal sources, AM noise measurements, system monitoring and pulsed RF measurements in ultra-broadband and mm-Wave applications.

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  • Software Platforms

    Opal-RT Technologies Inc.

    Discover complete solutions for Hardware-in-the-Loop (HIL) and Rapid Control Prototyping (RCP) testing. OPAL-RT offers the most advanced real-time simulation software platforms for power systems, power electronics, aerospace and automotive sectors: RT-LAB (Multi-domain, MATLAB/Simulink® based), HYPERSIM (Power Systems), and NI VeriStand (Automotive).

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  • Lightning Impulse Simulation Tester

    KT-6030iG - Kast Eng Co. LTD.

    Most of all electric systems and equipments are weak against the lightings(direct, inductive lightning). In fact, those electric equipments are broken mainly by lightning.This Lightning Impulse Simulation Tester is certificated to IEC 61000-4-5, and generates the similar impulse with huge rush currents and tests the safety of the power systems and equipments.

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  • IRS MesSy

    IRS Systementwicklung GmbH

    Though originally developed for use in our life time testers, the great amount of interfaces allows the universal application of our system in all fields of test and measurement. The Ethernet connection provides flexibility (spatial separation of PC and measurement system is possible) as well as safety through galvanic isolation from the PC.

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  • Frequency Response Analyzer

    1250E - Ametek Scientific Instruments

    The 1250E Frequency Response Analyzer (FRA) delivers accurate measurement of gain and phase. The device under test is stimulated by a sinewave and the response analyzed at various points in the system. These responses are then correlated with the stimulus to determine the amplitude and phase relative to the generator. The ratio of the two measured signals can then be used to provide the system transfer function.

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  • AMIDA 3001XP Tester

    Amida Technology, Inc.

    AMIDA has introduced two new analog/mixed-signal and logic options in the AMIDA-3000 series in recent years—the AMIDA-3001XP and AMIDA-3KS test systems. Both reinforce the AMIDA-3000 series' ability to provide cost-optimized test solutions for a variety of consumer components in power management and mobile device components. The AMIDA-3000 series provides more than twice the number of analog channels of its modules per test system, thus greatly reducing the acquisition cost of each channel and more than doubling the number of analog channels in the entire test system. This results in a higher number of parallel tests and a higher level of capability for this system, as well as a lower and more cost-effective IC unit test cost for this tester. This series of test systems provides a powerful test combination with high-speed hardware and software integration. The built-in instant messaging protocol detection function of AMIDA-3001XP test machine not only simplifies the complexity and difficulty of test development, but also greatly shortens the test time by using its high-speed computing capability.

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  • 3U CompactPCI Serial 9th Gen Intel Xeon®/Core™ i7 Processor Blade

    cPCI-A3525 Series - ADLINK Technology Inc.

    CompactPCI® Serial (PICMG CPCI-S.0) is a new modular computer standard officially adopted by PICMG in 2011. The CompactPCI Serial standard defines a completely new connector to support high-speed serial interfaces including PCI Express, SATA, USB and Ethernet. A CompactPCI Serial backplane has six high-speed connectors P1 to P6 on the system slot but only P1 is mandatory on peripheral slots, P2 to P6 being optional. A CompactPCI Serial system can comprise a total of nine blades (one system blade and eight peripheral I/O blades) through an Ethernet full mesh or single star architecture. The CompactPCI® Serial standard is the next-generation of the CompactPCI® specification and provides more flexibility and higher speed and bandwidth in modular system solutions.

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  • XRF

    O Series - Bowman

    The O Series combines high performance with a small x-ray spot size. This is made possible by the poly-capillary focusing optics system that replaces the collimator assembly installed in standard Bowman systems. The optics are designed to focus the x-rays coming from the tube exit window to a very small spot size (80μm FWHM) while retaining virtually 100% of the tube flux. So instead of attenuating the x-rays that can’t fit through the small apertures, as is the case with collimator systems, the poly-capillary optics assembly allows almost all of the x-rays from the tube to reach the sample. The result is much greater sensitivity for testing very small components or thin coatings. Shorter test times can achieve even better repeatability when comparing optics systems vs. a similar sized collimator.

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  • Non-destructive Eddy Current Testing of Long Products such as Tubes, Rods, Wire, and Profiles

    DEFECTOMAT® Product Familiy - Foerster Instruments, Incorporated

    The DEFECTOMAT systems by FOERSTER were specially developed for quality testing and process monitoring of long products. From hot testing to all bright steel processing steps, the surfaces of semi-finished products made from austenitic, (non) ferromagnetic metals can be tested for defects. The DEFECTOMAT systems operate in a contactless and non-destructive manner in accordance with the eddy current method and are used for detecting short defects, such as holes or localized defects and transverse defects. The systems detect defective materials fully automatically and reliably. Defects can be marked, classified, and automatically discarded. the test speed of up to 150 m/s facilitates 100% testing, even at high production speeds. The systems benefit from low operating costs and frugal energy consumption as well as low maintenance costs, few wear parts, and low use of materials.

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  • GaiaField-Pro Hyperspectral Imaging Camera

    ZOLIX

    YoGaiaField-Pro (GFP) camera provide extremely high resolution images by scanning and taking multiple images to construct a hyperspectral datacube. Hyperspectral imaging devices (GFP) for spatial (slit) scanning obtain slit spectra by projecting a strip of the scene onto a slit and dispersing the slit image with a prism or a grating. In spatial (slit) scanning, each two-dimensional (2-D) sensor output represents a full slit spectrum (x,λ). The NUC integrated into the system to control system operation ,data acquisition, and analyze, so the spatial dimension is collected through the scanning motor movement . The line-scan systems are particularly common in remote sensing, so it is sensible to use mobile platforms. The system can keep working by internal battery about 4 hours and user can use ipad or phone to connect the camera by internal Wifi.

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  • PXI Resistor Module 2-Channel 2R to 131k

    40-293-034 - Pickering Interfaces Ltd.

    The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.

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  • PXI Resistor Module 2-Channel 2R to 65.5k

    40-293-033 - Pickering Interfaces Ltd.

    The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.

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  • PXI Resistor Module 2-Channel 2R to 32.7k

    40-293-032 - Pickering Interfaces Ltd.

    The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.

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  • PXI Resistor Module 2-Channel 2R to 16.3k

    40-293-031 - Pickering Interfaces Ltd.

    The 40-293 is a Programmable Resistor module with two channels of 16-bit, two channels of 12-bit or four channels of 8-bit resistor chains in a single 3U PXI module. The module is ideal for simulating sensors for control and management systems under test, allowing the user to verify system response in design verification or manufacturing test applications.

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