Showing results: 1 - 4 of 4 items found.
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DataView -
Test Spectrum, Inc.
DataView is a low‐cost test data analysis tool that is used by test and product engineers to perform characterization of integrated circuit devices. DataView reads in industry standard STDF or ATDF files and can produce reports, histograms, and wafer maps in multiple formats including Excel. DataView is ideal for the test or product engineer who needs a fast and simple tool to analyze characterization data.
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QuickLoad-Central -
Spry Software, Inc.
QuickLoad-Central is our new STDF filtering, analysis, reporting, managing, viewing and editing tool. It looks at all your STDF files before you need to, pulling out key information to pre-generate reports and help you quickly find the files you need. You can list files of interest with yield and header information on our dashboard, visualize your data, open pre-generated reports or push any information from them that you can think of to JMP, Excel or other analysis tools.
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yieldWerx Semiconductor
For decades engineers have used STDF as the standard format for ATE test output- data logs, and yieldWerx automatically parses this format. However, with the increase in engineer’s usage of the general data record type (GDF) this usage often results in every product test program’s data log having a unique format from which you need to extract your data. Our support team can assist your company in this data extraction from STDF generated data logs using GDF record types.
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NI
The STS delivers the openness and flexibility of the NI PXI platform to the semiconductor production environment. For easy integration into the production test cell, the STS comes with features such as handler/prober integration, spring probe device under test interfacing, STDF data reporting, and system calibration.
