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Reflectometers

Instruments used to measure the reflectance of a surface. (spaceflight.nasa.gov)


Showing results 61 - 75 of 76 products found.

  • FiberPal Mini OTDR

    OT-8900 - Radiantech, Inc.

    FiberPal OT-8900 series instruments, with power meter built-in, are new miniature, high performance optical time domain reflectometer which is designed as fiber troubleshooter for locating fiber connector, break and imperfections for access networks. It detects event locations along the optical fiber and displays the results on a 7" color LCD display. FiberPal OT-8900 series are light, reliable and easy to use, hence it is ideal for FTTX testing.

  • Pyrofiber On-Line Material Emissivity Measurement

    E10 - Pyrometer Instrument Company

    On-Line Material Emissivity Measurement Infrared Thermometer As a complement to the Pyrofiber? II infrared thermometer, the Pyrofiber? Model E10 is a rugged industrial reflectometer based instrument which can be used measure the emissivity of solid target materials. When coupled with the Pyrofiber? II, this emissivity can be used in an on-line material monitoring or control process to calculate the precise emissivity corrected infrared temperature measurement.

  • Scalar Network Analyzer

    Oleson Microwave Labs

    Extend the frequency coverage of your microwave scalar analysis system to millimeter wave with our scalar frequency extension modules. Two configurations, reflectometer source (RFT) and transmission detector (DET), are available for one-port or one-path, two-port scalar measurements, respectively. These modules easily connect to your existing scalar system for high performance millimeter wave measurements.

  • Professional - Network Cable Tester

    251450 - Hobbes & Co. Ltd

    hi-tech, multifunctional network cable tester. In addition to detecting basicwire faults like open, short, miss-wired and split pairs, it can also measure the cablelength using TDR (Time Domain Reflectometers) technology in real time. LANsmart displaysthe results in pin-to-pin format. When there is any open/short faults in the cable, LANsmartwill detect, locate, and display the faults

  • Optical Time Domain Reflectomete

    FTE-7000A - Terahertz Technologies Inc.

    The FTE-7000A Optical Time Domain Reflectometer performs a wide variety of functions as well as being a fast, simple to use OTDR. Its instant on feature, ease of use, rugged housing and affordable price make this the best day to day unit on the market. This unit includes an integrated Video Scope with pass/fail grading map, AutoTest /AutoWave Power Meter and CW/Fiber Identifier Light Source. It is available in 850/1300nm dual multi mode, 1310/1550nm dual singlemode, triple wave and 850/1300/1310/1550nm quad wavelength versions.

  • Palm OTDR

    OT-8600 - Radiantech, Inc.

    The Palm OTDR (OT-8600) is a new miniature high performance optical time domain reflectometer which is designed as fiber troubleshooter for locating fiber connector, break and imperfections for access networks. It detects event locations along the optical fiber and displays the results on a color LCD display. This Palm OTDR is light, reliable and easy to use, hence it is ideal for FTTx testing.

  • TDR Cable Tester

    39002 - LANsmart - C2G, Lastar, Inc.

    The high-tech LANsmart TDR Cable Tester detects, locates, and displays basic wire connection problems including opens, shorts, miswirings, reversals, split pairs and shield continuity for RJ45, Cat5, Cat6, UTP and STP. Plus, it measures cable length for UTP and STP cable without remotes by using TDR (Time Domain Reflectometer) technology in real time. LANsmart displays the results in a pin-to-pin format.

  • Visible Laser Light Source (Fault Locator)

    VLF-280 - Terahertz Technologies Inc.

    The VLF-280 is a hand-held battery powered stabilized fiber optic laser source that emits visible (red) light at 650 nm. Its intended function is to allow an operator to identify the exact location of a break, micro bend, or other discontinuity in a fiber optic cable. It is useful for identifying micro bends located at short distances that would not be detectable by conventional means such as an Optical Time-Domain Reflectometer, (OTDR).

  • Film Thickness

    TohoSpec 3000 - Toho Technology

    The TohoSpec 3000 is a low cost, film thickness measurement system that utilizes a modern small spot spectroscopic reflectometer that is built on a simple-to-use tabletop platform. Incorporating core technology acquired from market leader Nanometrics, this system is specifically designed for a wide variety of R&D applications. The reliable solid state linear diode array provides fast, precise measurements of single-layer films such as oxide, nitride and photo-resist, as well as the top layer on film stacks of up to 3 layers in the thickness range of 100Å to 30µm. Outstanding value, complete with up to 15 standard film thickness measurement algorithms, this rugged and accurate system is used in laboratories worldwide to provide precision film thickness measurements in a compact design.

  • Mini OTDR

    OT-8700 - Radiantech, Inc.

    FiberPal OT-8700 series instruments, with power meter built-in, are new miniature, high performance optical time domain reflectometer which is designed as fiber troubleshooter for locating fiber connector, break and imperfections for access networks. It detects event locations along the optical fiber and displays the results on a 7” color LCD display. FiberPal OT-8700 series are light, reliable and easy to use, hence it is ideal for FTTX testing. The Application Software equipped is used for data analysis, processing and storage. With the USB Interface port, enabling FiberPal OT-8700 series to transfer test data to computer easily.

  • Spectrum & Vector Analyzer

    SVA1000X Series - SIGLENT Technologies

    The SIGLENT SVA1000X series spectrum & vector network analyzers are powerful and flexible tools for broadcast and RF device testing. With a wide frequency range from 9 kHz to 1.5 GHz, the analyzer delivers reliable automatic measurements and plenty of features including a tracking generator and multiple modes of operation: the base model is a swept super-heterodyne spectrum analyzer and optional functions include a vector network analyzer, a Frequency Domain Reflectometer based distance-to-fault locator, and a modulation analyzer. Applications include broadcast monitoring/evaluation, site surveying, EMI pre-compliance, research and development, education, production and maintenance.

  • Film Thickness

    NanoSpec 6500 - Toho Technology

    The NanoSpec 6500 utilizes an advanced spectroscopic reflectometer to measure optically transparent films that are used in the manufacture of thin film on glass for displays and other applications. Designed for maximum throughput, reliability and accuracy, the NanoSpec measures all transparent or translucent multi-stack films on virtually any kind of substrate. Capable of handling all sizes from “tablet” size glass to G10 panels almost three (3) meters square, the 6500 is specifically designed for a wide variety of production applications. The rugged system provides precise measurements of single-layer films such as oxide, nitride and photo-resist, as well as the top layer on film stacks of up to 3 layers in the thickness range of 100Å to 35µm and features an optional 0.75µm spot for small areas. Proprietary software enables Multilayer Film Analysis with the ability to select film constants, scan ranges and substrate types, the 6500 is the ideal tool for rapid process control measurements at the production level.

  • OTDR

    AQ1000 - Yokogawa Meters & Instruments Corporation

    Yokogawa Meters & Instruments Corporation will add an entry-level model, the AQ1000, to its range of OTDR (Optical Time-Domain Reflectometer) test instruments. The new model will be launched for sale outside Japan on April 13th. The new instrument complements the company’s mid-range AQ1200 Series and the high-end AQ7280 Series, and is specifically designed to increase the productivity of field personnel working on the installation and deployment of optical access networks such as Fiber To The Home (FTTH): the so-called “last mile” to consumers’ premises. The worldwide use of these optical access networks is increasing dramatically as the FTTH network structure is more and more adopted by the telecom operators, and optical fibers replace the copper cables in each household. Consequently, more and more installers will be working on fiber-optic deployment over the last mile. These installers will not need high-end OTDRs capable of measuring over hundreds of kilometers in the core network. Instead, they will need affordable OTDRs equipped with all the features which can make their job easier and faster: instruments like the Yokogawa AQ1000.

  • OTDRs and Fault Locators

    AFL

    AFL optical time domain reflectometers (OTDRs) and fault locators are used to certify new fiber installations and locate faults in deployed fiber optic networks. OTDRs and fault locators are available for both multimode and single-mode networks, including FTTx PONs. OTDRs scan fiber optic networks from one end of the fiber, displaying a trace and reporting detected events such as splices, connectors, micro- or macro-bends and fiber end. Fiber length is reported along with location, loss and reflectance of detected events. Several OTDRs are available with an integrated visual fault locator (VFL), optical light source (OLS), and/or optical power meter (OPM). OTDR results can be saved and uploaded to PC for further analysis and/or archiving.

  • Spectroscopic Ellipsometer

    SE Series - Angstrom Sun Technologies, Inc.

    Spectroscopic Ellipsometer SE series are advanced models built by Angstrom Sun Technologies Inc. There are many more advantages over reflectometers due to its capability to acquire more set of polarization information at different incident angles spectroscopically. User can select two different data acquisition mode, scanning wavelength by wavelength detecting mode or array based fast detecting mode. Thanks for newly developed, mature array based detecting techniques, advanced data acquisition and processing algorithm, users are able to choose array based systems to have the same precision as scanning single element configurations. When a fast measurement is must, especially for real time in-situ measurement, mapping across big surface like wafers, array based configuration is always recommended. You are always welcome to discuss with us on your applications and we'll ensure the final configuration will meet your needs.