Showing results: 1 - 15 of 17 items found.
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Filmetrics, Inc.
Finally, measurements of surface roughness and topography can be made for a price that's less than that of a stylus profilometer. The Profilm3D has sub-nanometer vertical resolution, which surpasses optical profilometers that cost 3x as much. It does so by using the same state-of-the-art measurement technologies as the most sensitive optical profilers available: vertical-scanning interferometry (VSI) and phase-shifting interferometry (PSI).
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DRK8090 -
Shandong Drick Instruments Co., Ltd.
This instrument uses noncontact, optical phase shift interferometry method does not damage the surface when measuring graphics can be quickly measured by a variety of three dimensional surface morphology, and analyzed to calculate the measurement results. Suitable for measuring a variety of blocks, the surface roughness of optical components; scale, dial the groove depth; magnetic (optical) disk, the head surface texture measurements; structural morphology of coating thickness and coating trough structure at the boundary of the grating; silicon surface roughness measurement and the graph structure and so on.
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Nexview™ NX2 -
Zygo Corporation
Designed for the most demanding applications, the Nexview™ NX2 3D optical profiler combines exceptional precision, advanced algorithms, application flexibility, and automation into a single package that represents ZYGO's most advanced Coherence Scanning Interferometric (CSI) profiler.
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Zygo Corporation
ZYGO's 3D Optical Profiler instruments enable precise, quantitative, ISO-compliant, non-contact surface measurement and characterization of micro- and nano-scale surface features, capturing up to two million data points in just seconds. Applications range from topography and waviness to roughness and microstructure characterization on samples as that vary from ultra-smooth sub-angstrom optical surfaces, to extremely rough and diffuse 3D printed surfaces.
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7503 -
Chroma ATE Inc.
Chroma 7503 uses the technology of white light interfaces to measure and analyze the surface profile of micro-nano structures with sophisticated scanning system and innovative algorithms.
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NewView™ 9000 -
Zygo Corporation
The NewView™ 9000 3D optical surface profiler provides powerful versatility in non-contact optical surface profiling. With the system, it is easy and fast to measure a wide range of surface types, including smooth, rough, flat, sloped, and stepped. All measurements are nondestructive, fast, and require no sample preparation.
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4D Technology
The NanoCam™ HD dynamic profiler measures surface roughness on small to meter-scale coated and uncoated optics, as well as precision metals, plastics, and other polished specular surfaces.
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Taylor Hobson Ltd
LuphoScan platforms are interferometric, scanning metrology systems. They are designed to perform ultra precision non-contact 3D form measurements mainly of rotationally symmetric surfaces such as aspheric lenses.
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VS-OSP -
Ametek Scientific Instruments
The VersaSCAN OSP integrates the Base with a high-accuracy, high-speed laser displacement sensor. The OSP technique uses diffuse reflection mechanism to measure topography of a sample. OSP can be used to measure topography, as a very sensitive leveling mechanism, or charting topography to be implemented with other scanning probe techniques for constant-distance mode operation.
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AAQ-RINKO -
JFE Advantech Co., Ltd.
The water quality profiler, AAQ 1183 has been redesigned as AAQ-RINKO with an optical fast response (63% response in water, 0.4 s) DO sensor, RINKO. Conventional water quality profilers with a slow response DO sensor require holding the instrument for a certain period at the measurement depths. AAQ-RINKO makes vertical measurements possible with a profiling speed of 0.5 m/s, similar to CTD observation, thereby significantly reducing the observation time. In addition to conductivity, temperature, depth, chlorophyll, turbidity, DO and pH, AAQ-RINKO also enables simultaneous installation of PAR (Photosynthetic Available Radiation) and ORP (Oxidation Reduction Potential) sensors. The processing unit is available in three types in accordance with the observation applications.
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AEP Technology
AEP Technology offers different kinds of 3D profilers. Rugged platform, advanced electronic equipment, clean test space, low carbon emission, low machine noise, high-end lens, etc., make our surface profiler unique in the imaging world. In addition to providing stand-alone contact 3D profilers and optical 3D profilers, we also provide the world's only cross-platform, dual-mode 3D profiler that is compatible with both tactile and optical profilometers.
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Nanovea Inc.
NANOVEA Optical Profiler is a 3D, non-contact profilometer designed with Chromatic Confocal technology, which uses wavelengths of light to accurately determine physical height. The Optical Profilers NANOVEA offers include compact, stand-alone and portable profilometer models. High-speed sensors are available to scan large surface at high accuracy.
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KLA-Tencor Corp
Profilm3D® and Zeta™ optical profilometers provide fast, easy, non-contact solutions for 3D surface topography measurements. Our portfolio of optical profilers supports a variety of measurement techniques, including white light interferometry, True Color imaging and ZDot™ confocal grid structured illumination. KLA Instruments can help guide you to the right optical profiler solution for your unique needs.
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HyperOCR -
Sea-Bird Scientific
Hyperspectral ocean color radiometer (HOCR) sensors are designed for applications where performance, size and power are key constraints. HOCRs can be mounted on real-time profilers, moored on autonomous deepwater buoys, installed in autonomous underwater vehicles, as well as on ships and airplanes for above-water optic applications. HyperOCR sensors are fully digital optical packages, providing 136 channels of calibrated optical data from 350–800 nm.