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NSOM

Near-field Scanning Optical Microscope


Showing results: 1 - 8 of 8 items found.

  • NSOM & SNOM SPM

    Nanonics Imaging Ltd.

    NSOM Is the premier tool for imaging and manipulation of light on the nanoscale and is a critical instrument for understanding plasmonics, photonic waveguides, photovoltaic and photoconductivity studies. The optical openness of the NSOM system permits any illumination scenario while the Multiprobe NSOM head offers optical transport and dynamic study on the nanoscale for the first time. Offering a variety of options from entry level to low-temperature systems, the MultiView NSOM series has been the platform of choice for imaging on the nanoscale for nearly two decades.

  • Ultrafast Nearfield Optical Microscope

    Femtosecond NSOM - Del Mar Photonics, Inc.

    Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nano-manufacturing.

  • Near-field Scanning Optical Microscope

    NSOM - Del Mar Photonics, Inc.

    Near-field Scanning Optical Microscope (NSOM) is a versatile tool for nano-characterization and nanomanufacturing.Conventional microscopes have fundamentally limited resolution due to diffraction, but there is no such restriction for near-field interactions, that is why near-field microscopy is becoming one of the most important techniques for nano-science.

  • Near Field Scanning Optical Microscope

    MCL-NSOM - Mad City Labs Inc.

    The MCL-NSOM is a fully operational near field scanning optical microscope. It has been built on Mad City Labs versatile RM21™ inverted optical microscope which allows users to convert between NSOM, SPM, and fluorescence optical microscopy techniques. The MCL-NSOM builds on our successful resonant probe SPM and incorporates common elements such as the MadPLL® phase lock loop controller. The NSOM also exploits our expertise in precision motion control by including six axes of motorized positioning, for the sample and NSOM probe, and three axes of closed loop nanopositioning to provide exceptional position resolution and accuracy. The MCL-NSOM also includes a 635nm laser excitation source, fiber launch, oil immersion objective lens (100x, 1.25 N.A.), CMOS alignment camera and avalanche photodiode detector. The microscope configurable design allows researchers to tailor the instrument for many different optical microscopy techniques including near field spectroscopy. The MCL-NSOM is operated in aperture mode with shear force feedback. The standard 5 modes are supported: illumination, collection, illumination and collection, reflection and reflection collection. We supply a LabVIEW™ based software package which automates the motion control features.

  • Near-Field Scanning Optical Microscope Platform

    MoScan-F - CDP Systems Corp.

    MoScan-F is a device that enables you to get the best up-to-date available spatial optical resolution using the near field scanning optical microscope (NSOM) principle

  • Scanning Near Field Optical Microscope

    SNOM - A.P.E. Research

    SNOM microscopes employ SPMs precision of piezoelectric raster-scanning together with sharp probes to obtain light optical images at rather better than the usual wavelength-limited resolution. The possibility to go beyond the Abbe diffraction limit has been achieved with the Near-field light optical microscopes (SNOM or NSOM).

  • Nanopositioning Systems

    Mad City Labs Inc.

    Mad City Labs'' nanopositioning systems move and maintain the position of objects with sub-nanometer precision and high stability. Applications for nanopositioners include super resolution microscopy, high speed confocal imaging, AFM, NSOM, SPM, optical trapping, fiber positioning, single molecule spectroscopy, single molecule/particle tracking, high resolution optical alignment, nanoscopy and lithography.

  • Single Probe Scanning Probe Microscope

    MultiView 2000 - Nanonics Imaging Ltd.

    an advanced single probe scanning probe microscope enabling a variety of modes of AFM/SPM/NSOM imaging. Nanonics has designed The MultiView 2000TM for excellence in scanning probe microscopy while allowing for near-field and far-field optical NSOM/Raman/TERS imaging without perturbation. The Multiview 2000TM is the only commercially available instrument that offers both tip and sample scanning. This versatility is important for different operation modes where the user can now choose whether the sample or tip is static. The Multiview 2000TM further offers the most stable feedback mechanism available in the form of normal force feedback with tuning fork actuation.

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