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Micropositioning

places a probe on submicron test targets.

See Also: Micropositioners


Showing results: 1 - 9 of 9 items found.

  • Micropositioning Systems

    Mad City Labs Inc.

    Mad City Labs micropositioning stages are designed to complement our high precision nanopositioning systems. Our micropositioning stages provide extended range of motion and are designed to provide a stable platform for our nanopositioners. Our product line includes high precision manual stages and fully automated, programmable stages for use with optical microscopes or stand-alone instruments.

  • Micropositioner

    MP-40 - Korima, Inc.

    Engineered for highly demanding probing needs, the Korima Model MP-40 Micropositioner is precision-built for micropositioning to meet ever smaller industry standards. Featuring linear motion on all three axes, the MP-40 provides precise control for sub-micron probing.

  • Micropositioner

    MP-80 - Korima, Inc.

    Engineered for highly demanding probing needs, the Korima Model MP-80 Micropositioner is precision-built for micropositioning to meet ever smaller industry standards. Featuring linear motion on all three axes, the MP-80 provides precise control for sub-micron probing.

  • Vacuum Compatible Instruments

    Mad City Labs Inc.

    Nearly all standard systems can be modified for vacuum applications to 10-8 Torr if baking is not necessary. Many UHV applications require custom designed solutions. With experienced UHV instrumentation specialists on staff, we can provide custom nanopositioning and micropositioning solutions for your vacuum application.

  • Spinstand Automation For Media Testing With XY-Positioning

    V2002 - Guzik Technical Enterprises

    Guzik V2002 XY-positioning spinstand uses the X and Y coarse positioning stages actuated by linear motors and the micro-positioning stage actuated by the piezo element aligned with X coordinate axis to place the tested head on the specified track.  WITE32 software converts the requested track number and skew angle into X and Y coordinates.

  • Electrical Probe Systems

    Instec, Inc.

    INSTEC's Probe Systems offer an integrated solution for performing component-level electrical measurements over a wide temperature range.Compact Mini Probe Stages enable an existing inspection microscope or optical test setup to be converted easily into a precision temperature-controlled semiconductor testing and qualification station.Analytical probe stations are fully featured industry-standard platforms for all modern probing applications and testing.Benchtop Probe Stations provide the user with four independent electrical probes with X,Y,Z micropositioning for precise placement without opening the sample chamber.​Highly configurable probe systems meet a range of requirements for atmospheric and temperature control, sample areas, and electrical measurements.

  • Machine Solutions

    ficonTEC Service GmbH

    Our machines employ industry-proven production technologies – micro-positioning, active/passive precision alignment, attachment via welding, soldering and/or bonding, and automated optical inspection. ficonTEC also provides a suite of test capabilities for individual components and hybrid opto-electronic devices, both on and off-wafer. Moreover, with everything being orchestrated by our flexible PROCESS CONTROL MASTER software, the machine platforms and product lines described below become so much more than just the sum of their parts. The technologies and capabilities implemented in all machine platforms translate into a broad and established spectrum of production process expertise. We are continually refining capability, modularity and design so that these systems reliably and cost-effectively meet and exceed efficiency and yield requirements even for cutting-edge production processes. For the team here at ficonTEC, we face your challenges every day.

  • Defence Antenna Systems

    Smiths Interconnect

    Offering antenna systems for Aerospace & Defense applications, from SATCOM, GPS, flush mounted, micro strip, blade instrumentation & data-link to fixed and mobile positioning systems. Our broad portfolio of off-the-shelf and build-to print solutions featuring TECOM and Millitech innovative technologies is designed to meet specific end-user needs.

  • Near Field Micro Probes ICR HH H Field

    Langer EMV-Technik GmbH

    The measuring coil is horizontally located in the probe head. The near field micro probes are operated with a positioning system (Langer Scanner).

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