Showing results: 6286 - 6300 of 10608 items found.
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Supracon AG
The system enables a number of calibration and measurement functions for dc voltages:*Calibration of secondary standards*Calibration of linearities and accuracies of dc voltmeters in the measuring range from 0 to ± 10 V.*Extremely exact output of any reference voltages*Direct comparison of two voltage standard measuring systemsNo other measuring system in the world offers such a variety with the highest precision.
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C2MAP System -
Shimadzu Corp.
The C2MAP™ System can be automated the process from pretreatment to measurement for culture supernatant samples and display temporal changes in the components as graphs. With the optimized LC/MS/MS simultaneous analysis method, the system can be used for the optimization of culture conditions in animal cell cultures by monitoring the consumption and depletion of media components during culturing, as well as the variation in metabolites secreted from cells.
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RW10 -
Materials Development Corporation
MDC presents the RW10 Reference Wafer. A range of capacitors, resistors and semiconductor devices can bemeasured to verify the repeatability and accuracy of measurement systems. The MDC Model RW10 Reference Wafer is not actually a "wafer". It has the shape of a wafer and it includes capacitors, resistors, MOS devices, and a junction device in a wafer configuration to allow rapid verification of proper operation for capacitance-voltage and current-voltage instrumentation.
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CLE-150 Series -
Asker
When we measure the hardness of rubber test specimen etc. with durometer, we have the possibility to make an error for the result of the measurement. To make solution for such an important factor fo the error, CLE-150 Series is employed the motor driving system for the descent speed control, and then we could realize to measure the hardness of constant speed and constant pressure that is precise and reproducible.
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Intego GmbH
Metal surfaces must undergo a reliable inspection, because defects impair the functions of steel tubes or medical engineering products. Relying to the often appearing strong structures of such surfaces, special robust vision techniques are needed to make, for example, geometric measurements. Our systems are prepared to provide a fully automated, 100 % inspection rate in a rough industrial environment.
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LumiTop 2700 -
Instrument Systems Optische Messtechnik GmbH
The LumiTop 2700 combines the accuracy of Instrument Systems’ well-known spectroradiometer CAS140 series with the obvious advantages of imaging colorimetry. Our innovative design merges an RGB CCD camera and a flicker-diode with the high-end spectroradiometer CAS140 CT or D. Using the extremely accurate spectral information of the CAS140 measurements as reference, guarantees spectroradiometric precision across the whole 2D image.
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ZNA -
Rohde & Schwarz GmbH & Co. KG
The R&S®ZNA vector network analyzers are the high-end series of the R&S VNA portfolio: excellent RF-performance is combined with a wide range of software features and a unique hardware concept. The touch-only operation together with the DUT-centric approach makes the R&S®ZNA to a powerful, universal and compact measurement system for characterizing both, passive and active devices.
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ZNLE -
Rohde & Schwarz GmbH & Co. KG
The renowned high-quality design, innovative user interface and compact size of the R&S®ZNLE make it ideal for basic VNA applications. The time domain analysis option (R&S®ZNL-K2) and distance-to-fault measurements option (R&S®ZNL-K3) enhance the R&S®ZNLE with essential features for general purpose testing.
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Phoenix Contact GmbH & Co. KG
Signal conditioners and measuring transducers ensure interference-free signal transmission in measurement and control technology. From highly compact 6 mm signal conditioners and measuring transducers through signal conditioners with functional safety to signal isolators for intrinsically safe circuits in the Ex area: our signal conditioners and measuring transducers ensure interference-free signal transmission in MCR technology.
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HORIBA, Ltd.
Spectroscopic ellipsometry is a surface-sensitive, non-destructive, non-intrusive optical technique widely used for thin layers and surface characterization. It is based simply on the change in the polarization state of light as it is reflected obliquely from a thin film sample. Depending on the type of material, spectroscopic ellipsometers can measure thickness from a few Å to tens of microns. It is also an excellent technique for multi-layers measurement.
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CyberOptics Corporation
Whether it’s for leveling, vibration, relative humidity, airborne particle sensing, teaching, or gapping, CyberOptics WaferSense and ReticleSense sensors for Semiconductor fabs and equipment OEMs are the world’s most efficient and effective wireless measurement devices. CEO, Dr. Subodh Kulkarni provides a view into the use of CyberOptics’ Multiple Reflection Suppression (MRS) technology in back-end and front-end semiconductor.
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AF26 -
optek
The AF26 is a high precision dual channel color sensor for inline operation; the secondary wavelength is designed to compensate the desired light absorbance measurement from any undesired light scattering influence, such as suspended solids, gas bubbles, immiscible fluids or window fouling. The AF26 sensor’s output can be correlated to almost any color scale including APHA and Hazen.
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Phekda Series -
OtO Photonics Inc.
The Phekda (PD) Series spectrometers consist of CCD/CMOS sensors and 32-bit RISC microcontrollers. This series features a new T-R-T (Transmissive-Reflection-Transmissive) optical design, simple and optimized for LIBS or high resolution requirement. The optical bench is very rigid and stable for measurement system and has outstanding stability of thermo-hydro variation, vibration and shock on resolution and wavelength shift performance.
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Extech RF12 -
Extech Instruments Corporation
Refractometer measures the concentration of lubricants and cutting fluids. Compact and easy to operate. Requires only 2 or 3 drops of solution and provides accurate and repeatable measurements on an easy to read scale. Prism and lens with a simple focus adjustment and Automatic Temperature Compensation from 10 to 30°C. Comes complete with case, calibration screwdriver, plastic pipette and calibration solution.
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GAO Tek Inc.
Surface roughness gauges are used for measuring the surface roughness of a material. GAOTek’s surface roughness gauges are reliable, high quality, and affordable instruments that provide an accurate measurement. They are an efficient and quick means for inspection or testing. Our gauges are compact, easy to carry and portable, allowing the user to work in complex conditions, and are available for sale to the United States, Canada and globally.