Showing results: 1 - 8 of 8 items found.
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7500 -
Tokyo Electronics Trading Co., Ltd.
ESD test based on Human Body Model (HBM) and Machine Model (MM) is the most important reliability test among the Electro-static Discharge (ESD) test of the semiconductor device. Latch-up test, on the other hand, should not be omitted from the reliability test of the CMOS devices.
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JRE 0814-A -
JRE Test, LLC
Testing tall devices? The 0814-A stands up to any test up to 18 GHz! Featuring a wide swing open door with durable latch handle, this enclosure is ideal for testing IEEE 802.11 a,b,g devices such as; WLAN, VoIP, access points and other RF devices.
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74HC595 -
SparkFun Electronics
This is a breakout for the SOIC version of the 74HC595 shift register IC. Clock in data and latch it to free up IO pins on your micro. All pins from the IC are broken out to standard 0.1" spaced headers. The Serial in and out pins are on opposite sides of the board with the remaining pins carried over so that multiple shift register boards can be chained together.
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HFCT -
IPEC Ltd.
The HFCT is a high frequency current transformer designed specifically for picking up partial discharge signals. It has a split core ferrite to allow retrospective fitting to earth straps without the need for disconnection. The durable body has a hinge and a quick release latch, making use quick and easy. The HFCT is constructed with an aluminium body to provide RF shielding and improved performance in noisy environments.
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JRE 0814 -
JRE Test, LLC
Testing tall devices? The 0814 stands up to any test up to 18 GHz! Featuring a wide swing open door with durable latch handle, this enclosure finds wide use in the WiFi test environment. Two shielded vents provide excellent cooling and optional fan(s) are available for those hot products. Tough 'honeycomb' vents maintain shielding effectiveness throughout the frequency range. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness.
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MASER Engineering B.V.
Reliability Test and Diagnostic services are offered to a wide range of customers that are active as Fabless Semiconductor or Integrated Device Manufacturers, automotive electronics supplier, Telecom and ICT application specialists, Industrial and Medical electronic system manufacturers or in Aerospace and Space applications. Independent high tech test and diagnostic service laboratory. IC and electronic module qualification. ESD and Latch Up testing. Design assessment by HALT/HASS. Failure and construction analysis.
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Evans Analytical Group®
EAG is an industry leader in ESD testing (Electrostatic Discharge) and Latch up testing. Our highly experienced engineering team use their industry leading knowledge and years or real world experience of the latest semiconductor technologies, circuit design, and device physics to optimize our customer's ESD and latch-up results. Human Body Model (HBM) and Machine Model (MM), Charged Device Model (CDM), Latch-up, Transmission Line Pulse (TLP).
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IRC3 -
Canden Products LLC
This 3 cu.ft benchtop insect rearing chamber is used by scientists in many research areas, from genomics to clinical epidemiology and species conservation. This chamber can be used in many types of insect growing projects where researchers are constrained by laboratory space. The 3 cu.ft benchtop insect rearing chamber is ideal to conduct research at home or laboratory due to its ease of mobility.Temperature range 10°C to 40°CTemperature uniformity +/- 0.7°CChamber feature a unique double shell-filled with commercial-grade polyurethane material for optimal insulation. Inlaid sealing ring and nylon latch for enhanced seal/performance. The chamber is made out of LLPDE material shell.The chamber comes with 12 molded slots. We provide 2 wire shelves with each chamber. Additional shelves are available for purchase. Shelves can support up to 25lbs distributed load. The Chamber comes with 2 hidden molded handles that enables users to move the chamber with ease. The chamber is also stackable without additional parts.
