Showing results: 16 - 26 of 26 items found.
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72-7250 CAL D -
Tenma
The 72-7250 CAL D from Tenma is a digital light meter with RS232 capability. It has custom one-chip microprocessor LSI circuit which ensures high accuracy. The meter features 13mm (0.5”) super large LCD display with contrast adjustment for best viewing angle, data hold and auto power off. It records maximum, minimum and average readings with RECALL facility. The 72-7250 has RS-232 PC serial interface, user selectable lighting type (tungsten, fluorescent, sodium or mercury, daylight) and zero adjustment by push button. The meter operates from 9V battery.
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72-7250 CAL DU -
Tenma
The 72-7250 CAL DU from Tenma is a digital light meter with RS232 capability. It has custom one-chip microprocessor LSI circuit which ensures high accuracy. The meter features 13mm (0.5”) super large LCD display with contrast adjustment for best viewing angle, data hold and auto power off. It records maximum, minimum and average readings with RECALL facility. The 72-7250 has RS-232 PC serial interface, user selectable lighting type (tungsten, fluorescent, sodium or mercury, daylight) and zero adjustment by push button. The meter operates from 9V battery.
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MRC ltd.
Multi-functions : WATT, VA, Whr, Power factor, ACV, * Built-in data hold function.ACA, Hz. * RS-232 output interface.* True AC power ( Watt ) & apparent power ( VA ) * Exclusive custom exclusive design LSI circuit, provides highmeasurement. accuracy, reliability and durability.* True rms display for ACV, ACA. * Built-in over input indication.* Supper large LCD, easy to read-out, display the Watt, * Power supply by batteries.Power factor, Voltage & Current value at the same time. * Built-in low battery indicator .* Auto range. * Durable plastic housing case with handle.
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1232 -
HIOKI E.E. Corp
High-Precision Batch Fixture-Type Testing System that Support Boards with Embedded Passive and Active Devices. The 1232 is a bare board tester that utilizes the full range of Hioki’s in-circuit testing technologies to deliver LSI reliability testing, complex component separation testing, high continuity and insulation testing, and more. (Double-sided alignment) Testable board dimensions: 50 × 50 to 330 × 330 mm (including clamp area) • Support for build-up boards that require resistance guarantees.
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OP-SB5GL -
LINEEYE Co., Ltd.
OP-SB5GL is the interface expansion kit that has a port to measure RS-232C(V.24) and a port to measure the TTL / CMOS signal level communications. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communications between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI* on monitoring and simulating.
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DENKEN Co., Ltd.
We conduct electric property test (final test) of the completed (packaged) LSI products. We will support testing of analog devices, logic devices, other electronic parts, modules, application products and so on. We will test according to customer's specification regardless of evaluation, trial production, mass production, by know-how cultivated with long-time mass production results. Test initial examination ~ From consistent correspondence up to selection and evaluation, individual correspondence such as design only is accepted.
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OP-SB85L -
LINEEYE Co., Ltd.
OP-SB85L is the interface expansion kit that has a port to measure TTL / CMOS signal level communications, and the one to measure the voltage of high-speed analog input. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communication between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI on monitoring and simulating.
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DUH-210/DUH-210S -
Shimadzu Corp.
A new evaluation system for measuring the material strength of micro regions, such as semiconductors, LSI, ceramics, hard disks, vapor deposited films, and thin coating layers, not addressed by previous hardness testers. It can also be used to evaluate the hardness of plastics and rubbers. This instrument uniquely measures dynamic indentation depth, not the indentation after the test. This in turn permits measurement of very thin films and surface (treatment) layers that are impossible to measure with conventional methods. Additionally, this same method supplies the data needed to calculate elastic modulus on the test specimens.
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CX-118A -
Shenzhen Chuangxin Instruments Co., Ltd.
1 It's using reciprocal counting technique, high accuracy, wide measuring range, truly equal precision measurement, fast speed measurement, high sensitivity.2 single-chip microprocessor technology cycle frequency measurement and intelligent management, making the instrument has high reliability and excellent performance / price ratio.3 It's using LSI design, the use of CPLD devices, instrument components greatly reduced, reliability has been greatly improved, the average time between failures ≥10000h.The machine looks nice, small size, light weight, easy to use.
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Shenzhen Chuangxin Instruments Co., Ltd.
1 It's using reciprocal counting technique, high accuracy, wide measuring range, truly equal precision measurement, fast speed measurement, high sensitivity.2 single-chip microprocessor technology cycle frequency measurement and intelligent management, making the instrument has high reliability and excellent performance / price ratio.3 It's using LSI design, the use of CPLD devices, instrument components greatly reduced, reliability has been greatly improved, the average time between failures ≥10000h. The machine looks nice, small size, light weight, easy to use.
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Hanwa Electronic Ind. Co.,Ltd.
◆Correspond to 300mm Wafer. This tester can measure LED or the large sizes Wafer, such as a system LSI. And Zap of HBM/MM can be performed. The Automatic destructive judging by V/I measurement can also be performed after Zap.◆Waveform guarantee in Zap needles. HED-W5100D carries out the calibration before shipment in the place of Zap needles. Therefore, Correlation of the Result of a Package Device becomes clear easily.◆Correspondence to Standards This Tester corresponds to the Standard of JEITA, ESDA, and JEDEC. A Zap unit adopts the plug-in system and also has the waveform of Customer's requests.◆Connection with TLP This Tester is the best for TLP Testing with deep relation of ESD. The protection circuit of a device with an ESD problem is investigated.
