Showing results: 1 - 15 of 34 items found.
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PACC-ZD006 -
Teledyne LeCroy
Small IC adapter for ZD differential probeQty 2
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DL-HCM-Acc-Kit -
Teledyne LeCroy
60 V of common mode and 80 V differential input range with 1 GHz of bandwidth, make these probes ideal for lower voltage GaN power conversion measurements. The 60 V of common mode is well suited for handling any float of the battery and bulk/absorption voltage during charging, while the 80 V differential input range provide margin for any overshoot.
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STAr Technologies, Inc.
STAr has developed a proprietary patented vertical probe card design that is tunable for wide varieties of parametric, mixed signal, memory IC and logic IC applications.
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Japan Electronic Materials Corp.
The probe card is a tool for testing semiconductors used at "Wafer Test" to check quality of IC or LSI in the first process of semiconductor manufacturing. The probe card is expendable.
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N2872A -
Keysight Technologies
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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N2871A -
Keysight Technologies
Compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the Keysight N2870A Series passive probes ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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MFA Family -
Langer EMV-Technik GmbH
The micro probes allow detailed measurements of high-frequency magnetic fields in the layout, at the smallest SMD components(0603-0201) and at IC pins of printed circuit boards.
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MICRONICS JAPAN CO.LTD.
U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.
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N2874A -
Keysight Technologies
A compact 2.5-mm probe head diameter, low input capacitance, and fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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ICE1 -
Langer EMV-Technik GmbH
The IC Test System was developed to measure the EMC behavior of circuits (ICs) in the event of targeted field or line-related interference and for measuring emissions. The test IC is tested in function. The test environment ICE1 creates the functional environment of the test IC. The respective measurement task is carried out with the corresponding probe set.
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N2875A -
Keysight Technologies
A compact 2.5-mm probe head diameter, low input capacitance, and various fine-pitch probe tip accessories make the N2870A Series ideal for probing densely populated IC components or surface-mount devices used in today’s high-speed digital applications.
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THERMO K click -
MikroElektronika D.O.O.
THERMO K click carries the MCP9600 IC from Microchip. Depending on the type of probe it uses the click can measure temperatures from −200 °C to +1372 °C.
