Showing results: 1 - 15 of 30 items found.
-
N7749C -
Keysight Technologies
The N7749C optical head interface can control two or four 8162-C series optical power meter heads. Readout is supported over LAN and USB interfaces with a built-in web-browser GUI and the SCPI command set common to Keysight optical power meters.
-
ATB -
Mountz Inc.
The ATB is adjustable torque wrench suitable for a variety of applications across multiple industries from aviation maintenance to general repair tasks. The wrench has the ability to change head configurations like open end, box, flare or a ratchet head. At the set torque, the handle moves through an angle of 20° before resetting.
-
95006 -
HITEC Sensor Solutions Inc.
A patented, precision, solid state motion sensor consisting of a sensing head (encoder) and a master control panel and enclosure, the Mark II features a digital tachometer and a two-set point system. Use of a dual set point system, properly set, assures warning of a potential problem, allowing corrective action before damage can occur, and providing total shutdown if the problem is not corrected.
-
300C and 300CD -
Scitec Instruments Ltd
Scitec Instruments Model 300 is a high stability variable frequency optical chopper. The basic system consists of a control unit, a chopping head and a set of four chemically blacked photo etched discs. This system provides operation over the frequency range 5Hz to 3kHz.
-
EC-80P (Portable) -
NAPSON Corp.
*Auto-measurement start by probe head contacting to sample*3 measurement modes for wafer resistivity, bulk resistivity and sheet resistance*Easy set up to measurement condition by JOG dial*5 types of model for each measuring range*Resistivity probe can be changed by sample’s resistivity range
-
Supercritical 24 -
Teledyne OEM Solutions
The Supercritical 24 Constant Flow Pump is designed to be a reliable component wherever a constant flow must be maintained. The flow rate of the Supercritical 24 pump fitted with two standard 12 mL pump heads can be set in 0.01 mL/min increments from 0.00 to 24.0 mL/min.The Supercritical 24 Constant Pressure pump is designed to be a reliable component wherever a constant pressure must be maintained. Pressure can be set in 10-psi increments from 0 to 10,000 psi.
-
LF1 set -
Langer EMV-Technik GmbH
The LF1 near-field probe set consists of 4 shielded near-field probes used during the development process for emission measurement of longwave, medium wave, and shortwave frequencies on electronic devices. The probe heads of the LF1 set are designed for incremental detection of sources of electromagnetic interference on assemblies. First, the electromagnetic interference of the assembly is detected by the LF-R 400 probe from up to 10 cm. Then probes with higher resolution like the LF-B 3, LF-U 5 and LF-U 2.5 are used to more precisely detect any source of interference. The probe heads are designed for taking measurements at single pins and larger components. Near-field probes are small and handy. They have a current attenuating sheath and, therefore, are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. The H-field probes do not have an internal terminating resistance of 50 Ω.
-
PR-82 -
Dakota Ultrasonics
The PR-82 sonic tester has been modified for the automotive industry. This gauge is commonly used for measuring the thickness of cylinder walls, head ports, decks, tubing, body panals, and windshields. It also has the ability to scan the length of a part to find the the minimum thickness.The PR-82 is back-lit and the unit operates for up to 200 hours on a single set of batteries. It is protected by Dakota Ultrasonics 5 year limited warranty.
-
NanoScan -
mks Ophir
Measure your beam as never before with the NanoScan™ beam profiler. The advantage of scanning slit beam profiling is sub-micron precision for measuring beam position and size. Scan head configurations include Silicon, Germanium, and Pyroelectric versions for a wide range of wavelengths and laser power levels. The NanoScan software is available in two versions: Standard and Professional, and includes an extensive set of ISO quantitative measurements, an M2 Wizard, and the ability to measure laser power.
-
SX set -
Langer EMV-Technik GmbH
The SX1 set consists of 3 passive near field probes for making measurements in the development phase of E-field and magnetic field with a high clock frequency in the range from 1 GHz to 10 GHz. The probe heads of the set SX allow for measurements close to electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors, to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through trained use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They have an internal terminating resistance.
-
P845 -
Whitman Controls
The Whitman Controls P845 Differential Pressure Switches are rugged and versatile, with excellent by-pass characteristics and the ability to handle a wide variety of media to 6,000 PSIG and set point ranges to 250 PSID. These switches are NEMA 4 rated and can tolerate submersion. They are commonly used across oil and water filter heads to detect when a filter element needs changing. It may be mounted in any orientation and is capable of carrying light to moderate mechanical shock and vibratory loads.
-
TSR Control -
DTS, Inc.
TSR Control is the user-friendly set-up, control and viewing software for the entire line of TSR data loggers. An intuitive interface makes it easy to configure the recorder, view real-time sensor output and review time-history data. Via a PC, users can set the record time (seconds), trigger threshold (g) per axis, and download individual or multiple events stored in flash memory. TSR Control also includes tools for zoom, filtering and Head Injury Criteria (HIC) calculations.
-
RFS set -
Langer EMV-Technik GmbH
The RFS set consits of three passive near field probes designed for the use in a measurement scanner during the development of E-field and magnetic field. They are designed for frequency ranges of 30 MHz to 3 GHz. The probe heads of the RFS set allow for close measurements needed to correctly localize interference sources on an electronic assembly. They document the whole image of the device under test`s near field. The scanner probes have a sheath current attenuation and are electrically shielded. They are connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance. The measuring signal can be increased with PA 203 or PA 303 preamplifier. On request RFS, LFS and XFS scanner probes can be produced.
-
RF1 set -
Langer EMV-Technik GmbH
The RF1 near field probe set consists of 4 passive near field probes for making measurements in the development phase of E-field and magnetic field in the ranges of 30 MHz to 3 GHz on electronic assemblies. The probe heads of the RF1 set allow for measurements close to the electronic assemblies, e.g. on single IC pins, conducting paths, components and their connectors in order to localize interference sources. Field orientation and field distribution on an electronic assembly can be detected through a trained special use of the near field probe. The near field probes are small and handy. They have a sheath current attenuation and are electrically shielded. They can be connected to a spectrum analyzer or an oscilloscope with a 50 Ω input. They do not have an internal terminating resistance.
-
MFA 02 set -
Langer EMV-Technik GmbH
The two in the set included micro probes are used to measure low-frequency magnetic fields up to 1 GHz, e.g. at signal conductors (150µm), SMD componets (0603-0201) or IC pins. The MFA micro probes are guided by hand. An amplifier stage is integrated into the probe head. The amplifier stage (9V, 100mA) is powered via the BT 706 Bias tee. It has an impedance of 50 Ohm. The micro probes are connected via the Bias tee to a spectrum analyzer or an oscilloscope. The MFA 02 set delivery of Langer EMV-Technik GmbH includes correction lines. With the help of the correction lines the probe output voltage is converted either into the respective magnetic field or to the current which is running through the conductor.
