Showing results: 16 - 18 of 18 items found.
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Anton Paar GmbH
Anton Paar’s precise and flexible XRD solutions combine the best possible data quality with unrivalled measurement efficiency. Our reliable systems are designed for intuitive use and offer a high degree of automation so every user can benefit from increased sample throughput and maximum instrument uptime. The XRDynamic 500 powder diffractometer features advanced optics, a next-generation goniometer, and state-of-the art detectors with a wide range of applications covered by the extensive ambient and non-ambient sample stage portfolio so you can always find the optimal XRD system for your needs.
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SENresearch 4.0 -
SENTECH Instruments GmbH.
The SENresearch 4.0 is the new SENTECH spectroscopic ellipsometer. Every individual SENresearch 4.0 spectroscopic ellipsometer is a customer-specific configuration of spectral range, options and field upgradable accessories. SENresearch 4.0 uses fast FTIR ellipsometry for the NIR up to 2,500 nm or 3,500 nm, respectively. It provides broadest spectral range with best S/N ratio and highest, selectable spectral resolution. Silicon films up to 200 µm thickness can be measured. The measurement speed of FTIR ellipsometry compares to diode array configurations, which are also selectable up to 1,700 nm. The new motorized Pyramid Goniometer features an angle range from 20 deg to 100 deg. Optical encoders ensure highest precision and long term stability of angle settings. The spectroscopic ellipsometer arms can be moved independently for scatterometry and angle resolved transmission measurements.
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Rigaku Corp.
In a move to bring lab-quality performance to the manufacturing floor, Rigaku introduces the MiniFlex XpC, a manufacturing-optimized powder diffractometer for fast and accurate quality control measurements. It is extremely easy to operate using Rigaku’s new EasyX quality control software, which requires minimal clicks to run. A minimal interface means there will be no accidental error variance from operator to operator. The MiniFlex XpC can be configured with a conveyor belt or robot for automated sample processing and collaboration with other instruments. With an 800 W X-ray source and a short-diameter goniometer, the system has the performance of a lab unit, and thus can greatly improve throughput for quality control measurements.
