- Pickering Interfaces Inc.
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PXI/PXIe MEMS RF Multiplexer, Quad 4-Channel, 4GHz, 50Ω, SMB
40-878-241
The module is based on the latest micro-electromechanical system (MEMS) switching technology and has low insertion loss and VSWR. In addition, MEMS devices have a long operational life of >3 billion operations and benefit from an operating time of <20 μs allowing greater test system throughput. The multiplexers have excellent and repeatable RF characteristics beyond 4 GHz with each path having a nominally equal insertion loss.
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Lamp Start, Run-up time and Flicker Test
LSRF-2
The (EU) NO 1194/2012rules
. Compared with which posted by theEuropean Commission Regulation (EC) NO 244/2009 Regulations dated 18th March, 2009, the new rules have complete mandatory and eco-design requirements. Start and Run-up time as the two indicators functional requirements in the industry has been more emphasis by manufacturers. -
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Harmonics and Flicker Testers
complied standards and features of the KHA1000 (dedicated for single phase), is equipped for the harmonic and flicker compliance test exceeding 16A of the single-phase and three-phase equipment. With this unit alone, you can take highly accurate simultaneous three-phase measurements up to 40A/phase*.
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Flicker Measuring Probe for LCM ATS
A712306
The Chroma A712306 Flicker Measuring Probe for LCM ATS is specifically designed for adjusting the flicker on LCM automatically following the FMA(Flicker Modulation Amplitude) standards defined by VESA (Video Electronics Standards Association) and JEITA (Japan Electronics Information Technology Industries Association) for flicker measurement.
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Test Program Development
Today's System-On-Chip-designs require creative development of test system add-ons. Test vector converters for most common simulators are available. Our specification for test program development is available on request. Our specification for test program development is available on request.
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Leak Test Instrumentation
At Cincinnati Test Systems (CTS), we are dedicated to providing our customers with superior quality leak testing systems. With access to advanced designs, features, and test algorithms in our leak test devices, we promise a fast and reliable leak test product that will also provide repeatable results for air leakage testing, gas leakage testing, or any other leak where reliable testing equipment is needed. Browse our family of products to learn more on how our standard and custom built systems can meet your needs:
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Compact EMC Test System
Multi-CE5
The Multi-CE5 includes an Electrical Fast Transient Generator (EFTG), a Combination Wave Generator (CWG) and a Coupling-/Decoupling Network (CDN) for single-phase power supply lines. The software program CE-REMOTE allows full remote control of the test generator via Ethernet light guide as well as recording, evaluation and documentation of test results, according to IEC 17025. To record the wave shape of impulses, it is equipped with an Impulse Recording Function (IRF).
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Test Fixtures-Assemblies
Qmax Test Technologies Pvt. Ltd.
Test Clips are available for various types of DIP ICs like 8, 14, 16, 20, 24, 28, 40, 48 & 64. These can be supplied with or without connectors and cables for interfacing to Qmax Testers. Test Pins in the clips are gold plated and engineered for good contact with the Device Under Test. It is designed for long life and trouble free operation. For easy handling the clips are provided with metal covers.
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In‐Circuit Test Fixtures
Test Head Engineering designs and builds high‐quality In‐Circuit Test (ICT) Fixtures for HP / Agilent / KeySight Technologies 3070 board testers. We partner with In Circuit Test Engineering, Inc. to provide turn-key 3070 ICT solutions - both fixture and programming.
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Pressure Decay Test Systems
Pressure decay leak testing technology has become a mainstay in the arena of high volume production testing. Pressure decay testing methods offer the world's manufacturers a cost-effective and easily applicable solution to the leak testing challenges they encounter on a given day. Fundamentally, pressure decay testing is a straightforward measurement technique; Cincinnati Test Systems (CTS) pioneers new and innovative ways to integrate our technology into custom turnkey systems that exceed the i...show more -
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RF Shielded Test Enclosure
JRE 0709-P
Containing all the capability of the larger JRE enclosures, the compact JRE 0709-P is ideal for small wireless devices such as; cell phones, pagers, WiFi dongles and other small RF devices. Featuring rugged welded aluminum construction, you can be assured of its tight RF shielding effectiveness. Long life door gasket material along with double edge engagement not only provides solid RF shielding, but smooth troublefree operation over its lifespan.
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BARE BOARD TEST PROBES
Probe Technical DataMechanicalMINIMUM CENTERS: .100 (2.54)FULL TRAVEL: .160 (4.06)WORKING TRAVEL: .107 (2.72)OPERATING LIFE: 1,000,000 cyclesElectricalMAXIMUM CURRENT: 5 amps continuousat working travel, non-inductiveRESISTANCE: At 35 mA test current60 18 mOHMS mean63 60 mOHMS meanMaterials and FinishesPLUNGER: Heat treated beryllium copper60 24 Kt gold plated over nickel63 24 Kt gold plated over nickelBARREL: Nickel silver60 24 Kt gold plated ID and OD over nickel63 No FinishSPRING: Music Wire, 24 Kt gold platedover nickel
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High Flexibility Test Controller Card
TCC 1800-UE
The TCC1800-UE Test Controller Card is a generic control board for production testing of printed circuit boards (PCBs). The board is controlled by a command language on a PC to which it is connected via Ethernet.The TCC1800-UE is designed to work with positive voltages up to 24V. The card provides extensive IO: Analog and digital interfacing, counters, PWM outputs, bidirectional I/O, ethernet-, CAN, USB, SPI and I2C interfacing.
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Harmonics & Flicker Analyser
AC2000A
The Laplace Harmonics and Flicker analyser provides the user with a complete system for testing product compliance with IEC61000-3-2 and IEC61000-3-3. Quick and easy to use, the built-in screen provides a clear pass/fail indication of compliance status, plus a full listing of results for each harmonic, in either tabular of bargraph format. The instrument is properly configured to cope with fluctuating harmonics. The Flicker mode provides proper measurement of short term and long term parameters,...show more -
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Distortion Test Sets
DTS-C
Matrix Test Equipment Incorporated
The Model DTS Distortion Test Sets combine Matrix products with those of other manufacturers. When properly equipped, a Model DTS can measure virtually any parameter important to the CATV industry. Controlled completely through the (GPIB) IEEE-488 bus interface, a Model DTS allows rapid, repetitive, and objective readings in a production-type environment.
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Cable-End Test Fixtures
Test Head Engineering's cable-end fixtures are used in the production of cable harnesses and in the testing of finished products. They are the long-lasting "connector" to the test system - taking the place of connectors that would quickly exceed their cycle life and produce erratic test results. Cable-end fixtures are used in the automotive and heavy equipment industries, but are also applicable wherever low cycle-life connectors are used - including RF cables.
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Test Management Tools
Manage, Execute & conclude from your tests with speed! Host on cloud or host yourself. A web-based, fastest & simplest test case management system.
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Environmental Test Chamber
Labtone Test Equipment Co., LTD
Environmental test system, Electro-dynamic Shaker, Shock Test Systems, Drop Tester, Bump Test Systems, Combined Environmental Test Systems
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Spectral Light And Color Meter w/ Flicker measurement
BTS256-EF
Spectroradiometer for the illuminance (photopic, scotopic, melanopic), spectrum, light color, color rendering index, and flicker. Cosine field of view illuminance measurement for accurate evaluation of extended illumination. Flicker measurement. Spectral measurement technology, required for LED light, color, color rendering, color effects. Photodiode for synchronization to pulse width modulated light and flicker measurement.
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Function Test Systems
These specialist Automeg models test the function and integrity of wiring harnesses combined with active components such as relays, switches, contactors, diodes, LEDS, actuators and other active components.Our software takes the complex and traditionally long task of creating functional tests away from the test engineer and allows these to be created automatically, from existing ECAD data and our component library and automated software routines. All the different routes and subtests are automatically calculated in seconds.
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Meter Test & Calibration
Kongter Test & Measurement Co., Limited
Kongter offers a whole line of products for meter test and calibration including portable power source, standard reference meter and meter test system. All products are accredited to the highest production standards with different options of measurement accuracy (class 0.05 and class 0.1).These enable them to cover different applications for test and calibration of different types of energy meters, electric transducers, indicating meters and so on.
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Mixed Signal Test Systems
MTS1020i
The MTS-1020i is a cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Endurance Test Stands
Endurance test stands to validate the life expectancy often run 24/7. We therefore place great store on the reliability of imc test stands. Whether it be the mechanics, data acquisition or automation – everything has been designed for endurance operation.
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Mixed Signal Test Systems
MTS1000i
The MTS-1000i is lowest cost platform available in the MTS series of ATE. It has a reduced platform size compared to the MTS-2010i & MTS-1020i, reduced power supplies, and 4 slots. It is mainly intended for single site testing. Like the other testers in the MTS family it is a highly cost effective production ATE designed for testing high-volume linear and mixed signal semiconductor devices (Op Amps, high-voltage drivers, DAC, ADC, etc.), both at the wafer sort and final test stages of the manufacturing process
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Hipot Test Set
KVLF VLF
KV Hipot Power Test Equipment Co.,Ltd
Voltage withstand testing is an essential electric test for electric equipment to determine the effective of insulation .
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Functional Test Fixtures
Forwessun’s Functional Test Fixtures are tailored to validate the performance of your electronic assemblies, ensuring each product meets critical quality and functional standards. With customisable designs and precision engineering, these fixtures support a range of testing needs—from checking connectivity and function to confirming performance under real-world conditions. Built to handle rigorous demands, Forwessun's solutions are ideal for industries requiring reliable and repeatable results. ...show more
