Showing results: 16 - 30 of 404 items found.
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TF313 -
TESTEX Testing Equipment Systems Ltd.
Surface Flash Tester. The rapid spread of flame over the surface of the material without ignition of its basic structure, usually applied to pile or fur fabrics. This flammability tester is safe and easy to operate, Swivelling butane burner is traversed across the face of the fabric to determine whether surface flash occurs and to record any damage to the base fabric
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Vernier Software & Technology, LLC
The Vernier Flash Photolysis Spectrometer is a simple, user-friendly device for demonstrating the fundamental principles of chemical kinetics and photochemistry to undergraduate chemistry students.
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Weshine Electric Manufacturing Co., Ltd
Closed flash point tester, when the test sample is used in a closed environment (such as transformer oil), to determine the closed flash point value of petroleum products. Use touch screen instead of keyboard operation, adopt foreign advanced technology, large LCD screen LCD full Chinese display man-machine dialogue interface, full screen touch key prompt input, convenient and fast, open, fuzzy control integrated software, modular structure, in line with national standards, the United States, EU and other standards.
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Analog Devices Inc.
Analog Devices LED flash drivers support general LED lighting, building technology, scanning equipment, and a range of other technologies. A range of features, such as automatic phototransistor controls and overtemperature protection, as well as compact size and diverse programmability options, allow these devices to be used in a number of applications including:
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DLF 2800 -
TA Instruments
The Discovery Laser Flash DLF 2800 is an advanced freestanding instrument for the measurement of thermal diffusivity and specific heat capacity of materials from room temperature to 2800°C. The distinctive design incorporates a proprietary laser, laser optics, detector, and furnace technologies, and along with the unique six-position sample carousel, ensures unprecedented measurement accuracy and sample throughput. With the ability to operate in a variety of atmospheric conditions, including inert gas or under vacuum, the DLF 2800 can characterize a wide variety of materials, including polymers, ceramics, carbons, graphite, composites, glasses, metals, and alloys.
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TA Instruments
The Light Flash technique provides information on a material’s ability to store and transfer heat through measurements of thermal diffusivity, thermal conductivity, and specific heat capacity. Thorough understanding of these properties is critical for any process or material which experiences a large or fast temperature gradient, or for which the tolerance for temperature change is exacting. Accurate values of these properties are essential for modeling and managing heat, whether the component of interest is called on to insulate, conduct, or simply withstand temperature changes. Information about these properties is routinely used in heat transfer models of all complexities. Heat transfer property measurements also reflect important information about material composition, purity and structure, as well as secondary performance characteristics such as tolerance to thermal shock.
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UFS -
Arasan Chip Systems, Inc.
Universal Flash Storage (UFS) is a JEDEC standard for high performance mobile storage devices suitable for next generation data storage. The UFS is also adopted by MIPI as a data transfer standard designed for mobile systems. Most UFS applications require large storage capacity for data and boot code. Applications include mobile phones, tablets, DSC, PMP, MP3, and other applications requiring mass storage, boot storage, XiP or external cards. The UFS standard is a simple, but high-performance, serial interface that efficiently moves data between a host processor and mass storage devices. USF transfers follow the SCSI model, but with a subset of SCSI commands.The Arasan UFS IP family consists of Host controller IP, Device controller IP, and MPHY.
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Luzchem Research Inc.
This system that makes complex electronics, cumbersome software and large optical benches a thing of the past. The LFP system incorporates everything needed except the excitation laser. This is a simple, yet powerful instrument, ready to perform a wide range of time resolved kinetic and spectroscopic measurements involving transient absorption or diffuse reflectance. The LFP system, including the monochromator and digitizer is completely computer controlled, making it easy to obtain
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Mors Smitt Group
Arc fault protection for the fast clearance of arcing faults on BUS bars & within metal clad switchgear & associated cable boxes. The arc is detected using an optical sensor & the signal input to a protection device which alsomonitors the load current on the system.
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SF 105 -
LMT Lichtmesstechnik GmbH
Computer controlled measurement equipment to measure the time response of illuminance or luminous intensity when illuminated with rapidly changing values, e.g. flashes.
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THPG -
Whitelegg Machines Ltd
Very Heavy Duty with high milliamp capacity for properly testing motors and windings.
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NplusT -
Saniffer
NplusT was created in December 2002 by Tams Kerekes' 20-years experience in the field of electrical semiconductors and reliability testing.The company started with the sales representation of semiconductor equipment and consumable suppliers. In the meantime, qualified engineering services, linked to the represented products, were provided in Europe.In 2003 NplusT started to market "RIFLE", the non-volatile memory engineering tester, and related services. In a few years, this product has become a reference platform for many memory makers.In 2005 Liliom Laboratories, a Hungarian software development company, merged into NplusT. Thanks to this operation, the company became leader in the test data collection and processing segment.From 2008 a dominant portion of NplusTs turn-over derived from licensing software products. Today almost every European along with several Far East semicon companies license our software products and make use of qualified engineering services.From 2011, NplusT provides turn-key solutions for device testing and characterization, including hardware, software and support.
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MS7208 -
MiNT Systems Corporation
The MS7208 system can test a wide range of device families including – but not limited to – NAND flash, NOR flash, multi-level flash, multi-die flash, EEPROM, RAM, and mixed-technology memory devices.
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OAI
OAI’s Flash Solar Power Meter is a versatile measurement tool used for measuring the irradiance (in Suns) from Flash Solar Simulators. Flash Solar Simulators are commonly used in the production of solar panels. Integrated into the solar cell production line, this meter calibrates the flash solar simulator allowing for constant and repeatable irradiance output. By sampling at speeds up to 4000 Hz, the flash pulse temporal profile can be recorded in the meter’s memory and downloaded to a USB 2.0 port on a PC for further analysis.
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XJFlash -
XJTAG Ltd.
XJFlash is an FPGA-based advanced and innovative method that uses JTAG for high-speed in-system programming (ISP) of flash memories – all serial and parallel flash devices are supported. The most common use of XJFlash is programming the SPI/QSPI NOR flash used to configure an FPGA.
