Showing results: 1 - 12 of 12 items found.
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EDAX
EDAX EBSD tools provide leading performance and groundbreaking technology for analyzing crystallographic microstructure, using electron backscatter diffraction in the SEM.
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e–FlashFS -
Bruker Nano Surfaces
The new EBSD detector e–FlashFS has been designed for maximum sensitivity to allow highspeed EBSD measurements without compromising data quality – even on challenging applications like deformed or lightweight materials. To further improve the pattern quality, the cooling system of the e–FlashFS has been upgraded to lower its functioning temperature and therefore reduce the dark current of the CCD camera as much as possible.
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Symmetry -
Oxford Instruments plc
Electron backscatter diffraction – is a powerful microanalysis technique that enables rigorous characterisation of the micro structural properties of crystalline materials. A high performance EBSD detector is critical for the effectiveness of the technique, influencing both speed and data quality. Symetry is Over 3000 indexed patterns per second (pps). Up to 30x faster than existing CCD-based detectors. Extreme sensitivity for low current and low kV analyses. Megapixel resolution for HR-EBSD applications. High resolution patterns (at least 156 x 128 pixels) at all speeds.
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Velocity™ -
EDAX
high-speed EBSD mapping with the highest indexing performance on real-world materials. Velocity™ EBSD camera combines indexing speeds greater than 3,000 indexed points per second with indexing success rates of 99% or better. At these speeds, the Velocity™ uses 120 x 120 pixel EBSD patterns for improved band detection. This image resolution, combined with proven EDAX triplet indexing routines, provides orientation precision values of less than 0.1°.
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QUANTAX EBSD -
Bruker microCT
QUANTAX EBSD system, with its popular OPTIMUS 2 detector head, is the best available solution for analyzing nanomaterials in the SEM
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Pegasus (EDS-EBSD) -
EDAX
The Pegasus Analysis System enables the simultaneous collection of Energy Dispersive Spectroscopy (EDS) (chemistry) and Electron Backscatter Diffraction (EBSD) (crystallography) data, allowing direct correlation between the elemental content and microstructural aspects of the material being studied.
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Trident (EDS-EBSD-WDS) -
EDAX
The Trident Analysis System combines the latest advances in Energy Dispersive Spectroscopy (EDS), Electron Backscatter Diffraction (EBSD), and Wavelength Dispersive Spectrometry (WDS) in a single analytical tool. With the Smart Features included in the easy to use EDAX analysis software, each technique can be optimized and used independently or they can be combined to provide seamless integration, resulting in comprehensive data collection that can then be shared between the different techniques.
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TEAM™ Pegasus -
EDAX
Introducing the new EDS and EBSD Integrated System
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PRIAS -
EDAX
PRIAS is a synergistic new imaging technique to visualize microstructure and provide exciting new views of your materials. PRIAS enables users to quickly characterize materials without requiring full EBSD pattern indexing. Through a novel use of the EBSD camera, PRIAS provides as many as 25 positional electron detectors to allow unprecedented flexibility in image collection and visualization. Applications of PRIAS include traditional EBSD materials such as metals, ceramics, semiconductors, and minerals as well as new analysis of plastics and glasses.
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Bruker Nano Surfaces
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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Bruker microCT
Bruker’s electron microscope analyzers EDS, WDS, EBSD and Micro-XRF on SEM offer the most comprehensive compositional and structural analysis of materials available today. The full integration of all these techniques into the ESPRIT software allows you to easily combine data obtained by these complementary methods for best results.
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FIB -
JEOL Ltd.
An easy-to-use, out-lens type scanning electron microscope (SEM) equipped with a Schottky electron gun, as well as a new FIB column capable of large current processing (maximum ion current 90nA) installed into one chamber. JIB-4610F enables high-resolution SEM observation after high-speed cross-section milling with FIB, and high-speed analysis with a variety of analytical instruments, such as energy dispersive X-ray spectroscopy (EDS) that takes advantage of the Schottky electron gun delivering a large probe current (200nA), electron back scatter diffraction (EBSD) to perform crystallographic characterization, and cathodoluminescence (CLD). In addition, the 3D analysis function Cut & See is included in the standard configuration, allowing cross-section milling to be executed automatically at fixed intervals, while acquiring SEM images for each cross section.
