Filter Results By:

Products

Applications

Manufacturers

Arrays

fields of applications.


Showing results: 481 - 495 of 729 items found.

  • NI-9476, 36 V, 32-Channel (Sourcing Output), 500 µs C Series Digital Module

    780175-01 - NI

    36 V, 32-Channel (Sourcing Output), 500 µs C Series Digital Module - The NI‑9476 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel is compatible with signals from 6 V to 36 V, based on the external power supply, and features transient overvoltage protection between the output channels and the backplane. You can programmatically monitor the built-in overcurrent and short-circuit protection status of each channel.

  • NI-9476, 36 V, 32-Channel (Sourcing Output), 500 µs C Series Digital Module

    785045-01 - NI

    36 V, 32-Channel (Sourcing Output), 500 µs C Series Digital Module - The NI‑9476 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel is compatible with signals from 6 V to 36 V,based on the external power supply, and features transient overvoltage protection between the output channels and the backplane. You can programmatically monitor the built-in overcurrent and short-circuit protection status of each channel.

  • NI-9477, 60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module

    779517-01 - NI

    60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module - The NI‑9477 works with industrial logic levels and signals to connect directly to a wide array of industrial relays, solenoids, and motors. Each channel is compatible with signals from 5 V to 60 V and … features isolation from channel‑to‑earth ground. You can wire the NI‑9477 channels in parallel to sink up to 20 A of current per module (1 A per channel maximum).

  • NI-9477, 60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module

    780174-01 - NI

    60 V, 32-Channel (Sinking Output), 8 µs C Series Digital Module - The NI‑9477 works with industrial logic levels and signals to connect directly to a wide array of industrial relays, solenoids, and motors. Each channel is compatible with signals from 5 V to 60 V and … features isolation from channel‑to‑earth ground. You can wire the NI‑9477 channels in parallel to sink up to 20 A of current per module (1 A per channel maximum).

  • NI-9476, 36 V, 32-Channel (Sourcing Output), 500 µs C Series Digital Module

    NI-9476 / 779140-01 - NI

    36 V, 32-Channel (Sourcing Output), 500 µs C Series Digital Module - The NI‑9476 works with industrial logic levels and signals to connect directly to a wide array of industrial switches, transducers, and devices. Each channel is compatible with signals from 6 V to 36 V, based on the external power supply, and features transient overvoltage protection between the output channels and the backplane. You can programmatically monitor the built-in overcurrent and short-circuit protection status of each channel.

  • Light-to-Analog Sensors (Voltage)

    Renesas Electronics Corp.

    Renesas' light-to-voltage silicon optical sensors combine a photodiode array, a non-linear current amplifier and a micropower op amp on a single monolithic IC. Applications for these devices include display backlight control, keypad dimming, anti-glare mirror systems, and industrial and medical light sensing applications.

  • Probe Cards

    MICRONICS JAPAN CO.LTD.

    U-Probe for Multi-die Test of Memory IC. Vertical-Probe Needle Type Probe card suitable for multi-die test of devices with peripheral pads. ertical-Probe Spring Type. Probe card suitable for area array pad test. 64DUTs Multi-Die. Probe Card for RF devices. Fine Pitch.

  • Laser Diode Reliability Burn-In / Life-Test System

    58602 - Chroma ATE Inc.

    Chroma 58602 is a high density, precision multi source measurement Unit (SMU) module with temperature control and exchangeable interface developed for burn-in, reliability and life test of optoelectronic components including laser diodes, VCSELs, VCSEL Arrays, silicon Photonics, photo-diodes and other similar components.

  • Pod/Nest Fixtures

    Test Head Engineering, LLC

    Nest and Pod Fixtures are used to test components and sub-assemblies. They typically are built in an array and the devices under test are subjected to tests that simulate operating conditions or life-cycle testing.  Test Head Engineering is experienced in providing nest and pod testers that meet the connectivity, ergonomic and mechanical requirements of component testing.

  • Defect Detection

    StarProd LTB - MVG

    The StarProd LTB is a unique defect detection bench for linear array antennas such as BTS. Tests performed on this bench instantly identify defects such as flawed or absent soldering, swapped wiring or short circuits. Results provide information on the position and type of any existing error. Operators can then immediately step in to make corrections knowing precisely how and where they are needed. StarProd LTB also performs tilt computations which can reveal a misconfiguration, or a mechanical or RF component defect. The end result: improved production processes and product quality.

  • eXpert FPGA DSP Features for Data Acquisition

    GaGe

    GaGe provides several eXpert FPGA processing firmware options for use with CompuScope Digitizers. All standard default CompuScope Digitizer model configurations can store raw acquired waveform data to onboard sample memory and then transfer them quickly to the user for analysis, display and/or storage. The addition of optional eXpert FPGA processing firmware features allow for some signal processing analysis, or other specific functionality, to be performed on the digitizer hardware itself within its onboard Field Programmable Gate Array (FPGA).

  • GPS/FMS Universal Test Fixture

    TA-3000 - Tech-Aid Products

    This panel was designed to give the avionics shop the capability to test and troubleshoot many of the GPS, GPS/COMM and FMS units on the market today. Breakout jacks are provided for both analog and digital signals that need to be monitored or simulated. A data port update jack is provided as well as Arinc 429 and RS232 loopback switches. Switches for Gillham altitude are provided as well as fuel flow adjustments. An array of annunciators and configuration switches are also provided to verify those outputs and inputs. Optional UUT configuration overlays also availabl

  • Shortwave Infrared Camera Core

    Tau® SWIR - Teledyne FLIR

    FLIR Tau® SWIR provides outstanding short-wave infrared image quality and performance over a wide range of imaging and light level conditions. It is the ideal OEM SWIR imaging module for applications like hyperspectral instrumentation, silicon inspection, electro-optical payloads, art restoration, and portable imaging. The Tau SWIR camera incorporates the FLIR high resolution 640×512 ISC1202 Indium Gallium Arsenide (InGaAs) 15-micron pitch focal plane array (FPA) and includes several advanced camera controls features.

  • K-Band Silicon SATCOM Rx Quad Core IC

    AWS-0102 - Anokiwave Inc.

    The AWS-0102 is a highly integrated silicon quad core IC intended for satellite communications applications. The device supports four dual polarization radiating elements with full programmable polarization flexibility. The device provides 22 dB of gain with a noise figure of 3.4 dB. Additional features include gain compensation over temperature and temperature reporting. The chip features ESD protection on all pins, operates from a +1.8 V supply, and is packaged in a 56 lead 7x7 mm QFN for easy installation in planar phased array antennas.

  • Deep Cooled UV-VIS/NIR Scientific Cameras

    HORIBA, Ltd.

    TE and cryogenically cooled CCD and EMCCD scientific cameras for ultra sensitivity from 200 nm to 1100 nmHORIBA Scientific offers a complete line of spectroscopic multi-channel detectors for scientific research. For spectral detection from UV to near-IR, two dimensional CCDs and indium gallium arsenide linear arrays offer a faster acquisition option over single point detectors with relatively high sensitivity. Coupled with HORIBA’s range of aberration corrected, flat field imaging spectrographs, custom spectroscopy packages can be assembled for a variety of applications.

Get Help