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Analyzers

examine data methodically by separating into parts and studying their interrelations. AKA: Analysers

See Also: Analyze, Analytics, Analysis


Showing product results. 3631 - 3645 of 3937 products found.

  • RF / MW switch

    Acery Technologies

    The RF / MW switch includes a variety of RF and microwave switch modules - RF multiplexers, which are available for use in the 34980A multifunction switch / measurement unit, providing broadband switching from DC to 20GHz . Use these modules to route test signals between your device under test and a signal source, oscilloscope, spectrum analyzer, or other instrument. The switch / attenuator driver module also controls the external switches and attenuators of the 34980A.

  • PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument

    PXIe-6544 / 780992-03 - NI

    PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.

  • PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument

    PXIe-6544 / 780992-02 - NI

    PXIe, 100 MHz, 32-Channel, 3.3 V PXI Digital Waveform Instrument—The PXIe‑6544 is a digital waveform generator and analyzer for interfacing with 32 single-ended digital pins. The PXIe‑6544 can sample digital waveforms at up to 100 MHz and interface with common transistor‑to‑transistor logic (TTL) voltage levels. The PXI‑6544 also features advanced synchronization capabilities for building integrated mixed-signal test systems and per-bank digital timing features.

  • (B1500A-A10/A11/A17) Source Measure Units (SMUs)

    B1510A/B1511B/B1517A - Keysight Technologies

    The Source/Measure Units (SMUs) are the key measurement modules of Keysight B1500A Semiconductor Device Parameter Analyzer. The SMUs integrate voltage/current source and measurement capabilities into a module, and it enables accurate DC current-voltage (IV) measurement with down to fA / V resolution. The low current measurement performance can be expanded down to sub-fA level by the optional ASU (Atto sense switch unit) if you need more measurement performance. The SMU can also perform the Quasi-Static Capacitance-Voltage (QS-CV) measurement. It is a measurement method to obtain low frequency CV characteristics, and it is important to characterize the surface state of the gate of transistor as well as high frequency CV. Keysight B1500A enables accurate QS-CV measurement with the leak current compensation. Along with analysis and data management capability of Easy EXPERT software, it is very powerful and useful to perform characterization for semiconductor, nano devices such as carbon nanotube (CNT) and carbon nanowire (CNW), active/passive component, material and any electric devices that require accurate and precise voltage/current measurement.

  • LED Power Driver ATS

    8491 - Chroma ATE Inc.

    1. DC Electronic Load : Chroma 6310A/6330A Series2. Transducer Unit/Module*1 : Chroma A849101/A849102, A849103, A8491043. Time/Noise Analyzer : Chroma 80611 & 80611N card4. Sytem Controller*2 : Industrial PC5. DC Source: Chroma 62000P Series6. Digital Power Meter : Chroma 66200 Series7. OVP/Short Circuit Tester : Chroma 806128. ON/OFF Controller : Chroma 80613*1 : A849101 transfers UUT output signal to voltage signal, and measure by 84911 LED power driver measurement card (200kHz). The optional 80611N Noise card is required for 20MHz ripplecurrent measurement.*2 : The controller includes both 84911 LED Power Driver measurement card and 84903 control card.- 84911: Measure rms current, dimming current/frequency/duty, timing, power & ripple current (200kHz)- 84903 : Provide BL control signal(DC level, PWM, SM bus), and enable ON/OFF signal.C Source : Chroma 6500/61500/61600 Series

  • Low-leakage Switch Matrix Family

    Keysight Technologies

    Conducting all the parametric measurements necessary for the numerous test structures on a semiconductor wafer can be a time-consuming and expensive process. With the cost of end-user devices continuing to drop, even laboratory characterization environments must reduce the cost of test.  Until now engineers and scientists working on current and future semiconductor process technologies were faced with a difficult choice: either use a semiconductor parameter analyzer with positioners on a wafer prober, which limits the ability to perform automated test, or use a switching matrix and probe card, which reduced the analyzer's measurement resolution.  Utilizing a switching matrix with a semi-automatic or fully-automatic wafer prober enables characterization tests to be automated, eliminating the need to have an operator manually reposition the probes each time a new module needs to be tested.  This reduces both test time and cost.  Due to the many price/performance points available, Keysight's switching matrix solutions provide the flexibility to choose exactly what your testing needs require, without overspending.

  • Sample Conditioner

    PCA-400 - Bacharach, Inc.

    Bacharach’s active sample conditioner is used to enhance the performance of the PCA® 400 combustion and emissions analyzer in heavy industrial and commercial settings. The PCA® 400 provides accurate readings for CO, O2 and NO with a standard probe. Bacharach also offers optional Viton™ tubing with the sample conditioner to eliminate sample dropout, ensuring accurate results in applications where NO2 and SO2 measurements are necessary. The sample conditioner removes water vapor from the stack gas sample, preventing the formation of water droplets inside the analyzer’s probe hose. Water in the sample hose could absorb a portion of the gas sample and result in lower than actual readings of NO2 and SO2. The water extracted from the gas sample is pulled out of the thermoelectric (Peltier) cooler and into a water catch pot. The dry, conditioned flue-gas sample is then passed through to the PCA® 400 for analysis, ensuring a clean, dry, accurate air sample. This also prevents water passing into the instrument and possibly damaging the sensors or other components.

  • VXI Video Processor System

    Model VXI 65VP1 - North Atlantic Industries

    NAI’s 65VP1 is a Video Processor System (VPS) on a VXI board. Capable of highly accurate video stimulus and measurements, this state-of-the-art instrument is the culmination of over three generations of Automatic Test Equipment (ATE) development programs. It provides increased functional density, and it reduces power consumption, size, and cost of the overall system. The 65VP1 is ideally suited for defense and commercial ATE programs, including television applications.With this multi-format video display generator and video signal acquisition system, videos can be composed with any possible sync format, rectilinear and polar raster, multi-image interactive stroke, and mixed video (stroke over composite, or stroke over raster). Video image acquisition and sync processor / analyzer functions are also supported. Either 6 output channels or 3 input channels are provided, along with extensive diagnostics. NAI’s Background Built-in-Test (BIT) continually checks on the health of each function and channel, and an initiated BIT function is also available through simple programming commands.

  • IEC61850 Digital Substation Testing

    Ponovo Power Co., Ltd.

    With the development of power system, more and more digital substation based on IEC61850 has been built in the world. IEC61850 is the new communication protocol which is adopted by power system so as to change the analog complicated wiring connection and protocol conversion. Based on IEC61850, all Messages, such as GOOSE, SV, MMS, PTP, etc, could be communicated on the Ethernet via fiber optical cable connection. In China, the digital substation have started since 2003, until now there are already more than 6000 digital substation put on operation, China Power Grid is planning to build 5000 more new digital substations. PONOVO, as the leading power system testing solution provider, have launched plenty of IEC61850 digital testing tools, not only digital relay test set, but also MU test set, multi-functional analyzer, 24 hours online monitoring and analyzing system, etc so that users could have suitable testing equipment for the digital substation commissioning and testings.

  • AC Hipot w/ Ground Bond Test Capability

    HypotULTRA® Series - Associated Research

    In a world where data is king, HypotUTLRA improves traceability with on-board data storage and allows you to automate hipot testing with a variety of communication interfaces. Increase efficiency with our direct barcode scanner connection and intuitive touch screen interface. Models 7804 and 7854 are a 4-in-1 solution with the addition of 40A AC Ground Bond test capability added to HypotULTRA's already impressive feature list. HypotULTRA is a dielectric analyzer designed to take your production line to the next level.

  • OBD2 Auto Repair Intelligent Scanner

    Scan 1 - Automotive Diagnostics and Publishing

    The Scan 1 OBD2 scanner auto repair diagnostic tool is a unique software PC based scan tool, with built-in troubleshooter, PID Analyzer, DTC code videos, PID red-flag feature, advanced graphing, information and more. The PC based scanner software is bundled with all sorts of auto diagnostic and repair help. This OBD2 scan tool and your own oscilloscope makes for a complete auto repair shop solution. If you don't have an oscilloscope, then the Scope 1 is also available.

  • Current Caliper

    KH23101 - Beijing KeHuan Century EMC Technology Co,.LTD

    The KH23101 current caliper is a toroidal transformer used to measure EMI current. When measuring, the caliper does not directly touch the electrical conductor or the cable under test. The conductor passing through the caliper window is used as the single-turn primary wire of the transformer, and the secondary is designed to be multi-turn. Use with 50 Ω receiving system (such as EMI electromagnetic interference field strength meter or spectrum analyzer). In order to facilitate installation and rapid measurement of EMI current, it is designed as a caliper that can be opened.

  • PXI IF Digitizer

    NI

    PXI IF Digitizers offer onboard signal processing (OSP), which enables features such as quadrature digital downconversion (DDC), real digital downconversion, and anti-alias filtering. Models include a high dynamic range front end and a highthroughput PXI Express interface, which allows them to stream IF data to disk for hours at the full sample rate. You can also choose a PXI IF Digitizer that can convert IF signals to I/Q data, so you can use this model as a standalone IF digitizer or as part of a Vector Signal Analyzer.

  • PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument

    PXIe-6548 / 781012-02 - NI

    PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.

  • PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument

    PXIe-6548 / 781012-03 - NI

    PXIe, 200 MHz, 32-Channel PXI Digital Waveform Instrument—The PXIe‑6548 is a digital waveform generator and analyzer for interfacing and basic characterization test with 32 single-ended digital pins. The device is capable of sampling digital waveforms at up to 200 MHz and interfacing with user-programmable voltage levels that have a 100 mV resolution. The PXI‑6548 also features advanced synchronization capabilities for building integrated mixed-signal test systems, hardware comparison for bit-error test, and per-bank digital timing features.

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