Showing results: 1876 - 1890 of 3913 items found.
-
N5247A -
Keysight Technologies
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
-
E5080B -
Keysight Technologies
As devices become highly integrated, complete characterization requires a complete RF and microwave measurement solution. The E5080B provides R&D performance up to 53 GHz and advanced test flexibility. Best-in-class dynamic range, trace noise, and temperature stability guarantee reliability and repeatability.
-
N5245A -
Keysight Technologies
Reach for unrivaled excellence in your measurements and designs Simplify your test stations by replacing racks and stacks of equipment Increase productivity with the most integrated and flexible single-connection microwave test engine Reduce test time with the world's widest range of single-connection measurement applications Test linear and nonlinear device characterization more accurately with the world's best PNA-X Every spec verified, adjustments included Lock in support & peak performance from the start
-
N5232B -
Keysight Technologies
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to20 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
-
N5231B -
Keysight Technologies
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to 13.5 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
-
N5235B -
Keysight Technologies
Perform basic analysis of passive components and simple active devices Measure S-parameters with good accuracy up to50 GHz in cost-sensitive applications Get the world's best price-to-performance ratio for microwave manufacturing Configure an economical solution for signal-integrity measurements and materials characterization Accelerate insight into component behavior using a multi-touch display and intuitive user interface Every spec verified, adjustments included Lock in support & peak performance from the start
-
Silex Technology
Collect radio wave characteristic data for WLAN and non-WLAN transmissions and translate them into an easy-to-understand web dashboard for network monitoring, operating, and troubleshooting.
-
Parsum Range -
Malvern Panalytical Ltd
Parsum Probes use Spatial Filter Velocimetry to deliver in situ, real-time size and velocity measurements for solid particles suspended in a pneumatic or gravity flow gas stream. Robust, dustproof and waterproof they measure particles in the size range 50-6000 µm with velocities from 0.01-50 m/s and are suitable for any industrial environment.
-
NanoSight Range -
Malvern Panalytical Ltd
The Malvern Panalytical NanoSight range of instruments utilizes Nanoparticle Tracking Analysis (NTA) to characterize nanoparticles from 10nm -2000nm* in solution. Each particle is individually but simultaneously analyzed by direct observation and measurement of diffusion events. This particle-by-particle methodology produces high resolution results for nanoparticle size distribution and concentration, while visual validation provides users with additional confidence in their data. Both particle size and concentration are measured, while a fluorescence mode provides differentiation of intrinsic or fluorescently labelled nanoparticles.
-
LISST-Portable|XR -
Sequoia Scientific, Inc.
Truly portable – completely self-contained with built-in data logger, processor, rechargeable battery, and 7” color touch screen display.Particle Size Range 0.35 to 500 micronsPumped and recirculating mixing chamber that keeps large and heavy particles suspended.Shock mounted optics block that can withstand the rigors of field use.A built-in ultrasonic probe for complete sample dispersion.Touch panel allows for easy SOP programming, sample analysis and display of data without a PC.Multiple Mie models as well as Fraunhofer model available for inversion, selectable from the touch panelAll data-processing is performed on board and stored in ASCII format. No post-processing necessary.Outputs: Total volume concentration, mean size, standard deviation, optical transmission, D5, D10, D16, D25, D50 (median grain size), D60, D75, D84, D90, D95, D60/D10 (Hazen uniformity coefficient), particle surface area, silt fraction, silt volume, size distribution, battery voltage, sample notes.Based on the laser diffraction principle. Compliant with ISO-13320-1 standard.
-
ScanExpress JTAG Debugger -
Corelis, Inc.
Test probe access is a luxury—modern electronic system design techniques such as blind and buried vias or ball-grid-array (BGA) devices guarantee limited signal access. Test points quickly reduce precious board real-estate and can even degrade performance. ScanExpress JTAG Debugger overcomes these limitations to provide the control and visibility necessary to quickly debug and test hardware, using a simple JTAG port to interface with IEEE-1149.1 compliant devices.Whether debugging prototype hardware, enhancing production tests with boundary-scan control, or diagnosing a faulty board in the field, ScanExpress Debugger’s easy-to-use and versatile interface helps engineers test and debug systems faster and more efficiently.
-
TAP-4-PLUS -
Zensol Automation Inc.
The Tap-4-PLUS is the newest instrument by Zensol for OLTC testing. It has 2 more analog inputs than the TAP-4. The TAP-4-PLUS with the TAP-DRM accessory can perform dynamic resistance, vibration, and motor current recordings at the same time. Doing so will allow you to easily understand the vibration impacts.
-
TAP4 -
Zensol Automation Inc.
The TAP-4 is the first instrument to use vibro-acoustic measurement to perform tests on On-Load Tap Changers (OLTC). The TAP-4 is a universal device, it adapts itself to any type of transformers: MR Reinhausen, ABB, Ferranti, Federal Pioneer and others.
-
Extech PQ3350 -
Extech Instruments Corporation
Power measurements and analysis + datalogging of single and 3-phase/3-wire or 3-phase/4-wire systems (up to 52,428 single phase readings or 17,476 3-phase readings). Large backlighting LCD displays up to 35 parameters in one screen. Clamp-on True RMS power measurements with on-screen Harmonics display. Simultaneous display of Harmonics and Waveform. Display of Waveform with Peak Values (1024 samples/period). Analysis of Total Harmonic Distortion (THD-F). Maximum Demand (MDkW, MW, kVA, MVA) with programmable period. Adjustable CT ratio (1 to 600) and VT ratio (1 to 3000). Graphic Phase diagram with 3-Phase system parameters. 3-phase Voltage or Current Unbalanced Ratio (VUR, VIR) and Unbalanced Factor (d0%, d2%). Calculated Unbalanced Current through Neutral Line (In). Capture 28 Transient events (including Dip, Swell and Outage) with programmable threshold (%). Optically isolated USB interface with software to download Waveforms, Power Parameters and Harmonics. Includes 4 voltage leads with alligator clips and retractable plunger clips, 8 AA batteries, universal AC adaptor, software, USB interface cable, and case. Current Probes sold separately.
-
FRANEO 800 -
OMICRON electronics
FRANEO 800 was developed for testing the mechanical and electrical integrity of power transformers after transportation or exposure to high fault currents. It uses the sweep frequency response analysis (SFRA) principle and measures the electrical transfer function over a wide range of frequencies.
