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Test Fixtures
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At Global Test Services LP, we know that verifiable yields are the backbone of your business, which is why we offer innovative, robust solutions that offer you better availability, improve efficiency, and offer flexible, scalable systems that meet the specific quality and test needs of your business.
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CTR Test Fixtures
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Designed to hold electronic components or assemblies in place during testing, particularly for verifying the Current Transfer Ratio (CTR) of optocouplers.
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Custom Test Fixtures
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Cortek Test Solution’s design capabilities range from very basic to extremely sophisticated solutions. Developing custom test fixtures demands more engineering time as well as an in-depth knowledge of mechanical design, pcb test methods paired with precision machining. Our experienced engineers will evaluate your requirement and design innovative mechanical test fixtures to meet your application needs in both the R & D and production environments.
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Manual Fixture Kit
230371 – CMCSK-02-01
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Universal Test Fixture
CAM/GATE
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The Low Cost Solution for Accurate and Dependable Universal Functional TestThe CAM/GATE ® Universal Test Fixture System is your afforable, efficient solution for functional test. No need to have multiple fixtures in your test area...
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VOC FIXTURE OVER CLAMP ASSEMBLY'S
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Test-X VOC Series overclamps are used for testing bare or loaded printed circuit boards with open vias and to minimize board flex.The VOC Series overclamp comes with adjustable delrin pressure fingers, anti-rotating hex nuts, hinge and latching assemblies, mounting instructions and hardware.The VOC Series will accomodate fixtures with dress frames or newer style fixtures using full-size top plates.
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Debug Fixture
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With at-speed test, debug can easily become a problem: If test points are on the bottom, as is often the case for test processing, then this requires the board to be flip over for the debug. However, during at-speed testing, key devices and signal paths are often on the topside. IST Engineering has in-house expertise with debug fixtures, which allow the test technician to flip over a test board, or even hold it vertically for dual-sided access, while still running the Device-Under-Test at full-speed through card-edge connectors - whether these are standard DIN type or F or N type co-ax connectors. The debug stations are constructed robustly, with metal frames and high-grade flexible cabling and can also be used as backup test stations in a manufacturing flow. They can be built with custom machined waveguide connections for RF/Microwave applications, or with standard, off the shelf connectors, as defined by the application. A number of these debug fixtures are in production use with a range of customers.
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Fixture Design
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TestEdge offers quick, cost effective test fixture design services for low-speed, full-speed, and high-speed devices. Based on our experience in developing high performance test fixtures for a wide variety of devices, test sockets, and tester platforms, we provide a premium quality test and engineering validation environment for everything from high power (40W) to high pin count to high speed ECL to high speed SerDes (3.25Gb) devices.
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Test Fixture Adapters for In-Circuit Test Fixtures
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Circuit Check test fixture adapters are utilized when the target ICT tester is not available or has been replaced with a newer technology tester. The tester adapter will often allow existing test fixtures from one test manufacturer to be utilized on another manufacturer test platform, eliminating the need for replacement fixtures. Contact Circuit Check to discuss your tester and fixture combinations for the best choice of a cost effective solution.
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Test Fixture, Shielding Effectiveness
EM-2108 | 1.5 GHz – 10 GHz
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The EM-2108 is a standard test fixture for evaluation of the electromagnetic shielding effectiveness (SE) of planar materials.
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USB-C® – USB 2.0 Plug HS SQ Test Fixture
AUT17094
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This product is designed for USB-C USB2.0 Receptacle Host Electrical Test.
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Drop-In In-Circuit Test Fixtures
The Chameleon
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The Circuit Check kit called the Chameleon allows easy re-use of a majority of an ICT fixture’s major components. The Chameleon includes a full size probe plate and interface alignment plate so all valuable tester resources are available. The probe plate assembly is held in place with twelve (12) screws and the vacuum box’s interchangeable push plate is easily replaced by removing four (4) shoulder screws.
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Deep And Sloped Pan Fixtures
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Line of deep and sloped pan fixtures for general purpose/system non-specific pcb test applications. H+W Test Products manufactures test fixture products for in-circuit, functional and combinational testers for users of automated test systems (ATE) such as Aeroflex, Agilent (HP), Checksum, Factron, Teradyne (GenRad), Test Research (TRI) and Testronics.
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HiFIX High Fidelity Tester Access Fixture
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The HiFIX lineup delivers clean waveform transmission, precision docking, and multi-DUT parallel test, with high reliability.
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Test Fixtures
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Pneumatically actuated Kelvin connection to custom manufactured device inserts either to complement ART's wide range of precision parametric test equipment or for use with third party measurement hardware.
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Manual Test Fixture (MA)
MA 2013/D/H/VPC-G12x-18
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: NoInterface signals max.: 1700Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 25,00 kg
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Exchangeable Test Fixture
MA 2112/D/H/S-7/HG/KT-ITA-21
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Parallel contact stroke: 15 mmContact force max.: 2000 NInterface block required: Test system sideInterface signals max.: 1190Component on PCB: 58 mmPressure frame unit-opening angle: 75Installation height test probe top: 16,0 mmInstallation height test probe bottom: 10,5 mmInstallation height dual-stage test probe bottom: 16,0 mmweight: 16,30 kg
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RF Shielded Fixture
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A semi-automatic, pneumatically operated fixture with a sliding pressure top provides a very short mechanical cycle-time. The unit is prepared for full, multi-station automatic operation using a centrally placed robot arm for UUT load/unload.
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Manual Fixture Kit
230356 – CMK-07
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Linear click system with ball bearings, using gas springs.10 mm ESD-proof top cover with aluminum reinforcement bars.Steel base cabinet with detachable aluminum back and bottom panels.Detachable interchangeable case system with an 8 mm spring-loaded probe protection cover.Base cabinet fitted with a telescopic guide rail and catch.
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Automatic Fixture Removal
S96007B
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Automatic fixture removal (AFR), is the easiest way to remove fixture effects from non-coaxial device measurements.
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MANUAL TEST FIXTURE KITS
SERIES 5590
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Built with unique design features: Ease of assembly and disassembly All side panels are removable Side panel material is delrin for easy machining for connectors, switches etc.Light weight and durable construction2" Between Probe plate and lid plate allowing more room for tall board components
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Custom Test Fixtures
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Intrinsic Quality is proud to offer a variety of Test Fixture Development Services that include fixture building, tester interface building, harness building, troubleshooting, maintenance, design, and engineering. IQ’s fixtures are built to exacting specifications and configured to deliver quality production testing. Our global customers have trusted us for over 35 years to provide custom solutions applying leading edge technology. IQ consistently delivers cost-effective solutions with our client’s recognition and gratitude.
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In-Circuit Test Fixture Design Services
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XJTAG offers consultancy services to design and build production test fixtures that integrate JTAG boundary scan with bed-of-nails testing.
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Non-Destructive Resonant Inspection Drop Test Fixture
RAM-DROP
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The Drop Test Fixture, Model RAM-DROP, Resonant Inspection System, allows automated sorting and quality testing of small metal injection molded (MIM), powder injection molded (PIM), additively manufactured, and other small parts by using the Resonant Acoustic Method (NDT-RAM).
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Cable Continuity Test Fixture
CCT
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6 and 8 Wire Cable Continuity Test Fixtures For convienient desk top and bench top The most important features of this cable continuity tester is its ease of use intuitive control functions and durability in a production environment.
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USB-C® Tx & Long Chnnel Rx Precet. Test Fixture
AUT20044 Rev:B0
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The original Intel USB-C 3.1 Tx Test Fixtures includes two types of fixtures, UFP and DPF. Allion Pre-Cert Test Fixture integrates functions of the two fixtures into an one-board solution, eliminating the hassel to frequent switching of two fixtures.
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Fixture Building Software
FixGenius
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Tests show that FixGenius’ rule-based probe-mapping algorithms reduce pin deflection by up to 25% compared with traditional fixturing packages. FixGenius comes with a powerful Fixture Editor that allows the user to change the probe mapping. If a solution is mathematically possible, FixGenius’ algorithms will find it, and pick the one with least deflection. If the job simply cannot be done with one single fixture, FixGenius will fully automatically split the test into multiple fixtures or into fixture and flying probe test sets, with guaranteed test integrity.
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Wireless In-Circuit Test Fixtures
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Higher density more complex circuit boards complicate testing requirements while smaller more tightly spaced test pads create a wiring challenge for the fixture fabricators, test engineers and maintenance personnel. Wireless fixtures solve the challenges associated with the nest of wires found in standard long wire fixtures. Wireless fixtures replace the “nest” of wires with copper traces on a multilayered printed circuit board called a Translator Board or T-Board®. Circuit Check’s wireless fixture technologies reduce test program debug and maintenance times while easing the ECO process. Thus allowing for the higher level of test performance, the ability to probe smaller denser targets and achieve ultra-high node counts.
