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Environmental Chamber
REXMED REC-400
MOD. REC-400, AC 230/380/415V, 1/3 phase, Environmental chamber, HS CODE: 841989, UNCCS CODE: 484384, UMDNS CODE: 16327, Main construction: SS304, Interior: SS304, Exterior: SS304 powder coated, Insulation: Rigid polyurethane foam and glass wool, Controller: Fix point PID controller, temperature ˚C/PV and ˚C/SV, humidity %/PV and %/SV display and setting, Temperature range: -40˚C~100˚C, Humidity range: 20%RH~98%RH, Constancy: ±0.3˚C ±2.5%RH, Uniformity: ±1˚C ±3%RH, Temperature and humidity sensor: PT 100Ω, Temperature and humidity audio and visual warning and OFFS correction setting, Temperature heater: 1.5KW X 2pcs, Humidity heater: 2.5KW X 1pc, Heat up transition time: -40˚C~100˚C within 45 min, Refrigeration system: Air cooled, single stage, Cooling compressor: Bristol hermetic compressor, Cooling capacity: 3,506 Watts, 11,962 BTU/hr, 3,020 Kcal/hr, Cool down transition time: 20˚C~-40˚C within 50 min, Safety devices: No fuse breaker, refrigerator over load relay, refrigeration high pressure switch, over temperature protector, protection relay, protection fuse, water level control and overheat protector, Chamber: L50 X W60 X H75cm, Capacity: 225L, chamber with key lock, with lamp (DC 12V 50W) X 1pcs and double glass viewing window, testing cable port with cover: Ø25mm, 4 castors, W/S: shelf X 2pcs, standard testing wet cloth X 5pcs, PCV water container X 1pc
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Test Adapter
Development of a 12-way test and programming adapter from Toptest for ?? The Dash ?? from Bragi, a wireless, intelligent earphone with communication and sensor technology. With the first version of the test adapter, only a purely sequential testing was possible due to the interdependencies of the tests. In version 3.0, the now autonomous tests were brought into a parallel TestStand sequence. In addition, individual sockets were prioritized in order to optimally use the hardware resources. This resulted in a time advantage of 80% compared to the initial situation.
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Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe
CSP-40G-021
Your product description goes here.
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Turbidity And Standard Meters
Accurately measure the cloudiness of a fluid caused by suspended particles with turbidity meters and standards from HF scientific. Our turbidity meters and standards instruments include features that simplify installation, maintenance, and data access.We offer reliable turbidity meters including an online turbidity meter, handheld turbidity meter, and benchtop turbidity meter.
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Sematech Analysis and SEMI Standards Analysis
Rocky Mountain Laboratories, Inc.
Rocky Mountain Laboratories, Inc. provides SEMI Standards analyses that conform to the following SEMATECH and SEMI Standards for testing of passivated 316L stainless steel components being considered for installation into a high-purity gas distribution system:SEMASPEC #90120401B-STD (SEM Analysis)SEMASPEC #90120402B-STD (EDS Analysis)SEMASPEC #90120403B-STD (XPS Analysis)SEMASPEC #91060573B-STD (Auger (AES) Analysis)SEMI F60-0306 (based on F60-0301) (XPS Analysis)SEMI F72-1102 (Auger (AES) Analysis)
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HARDNESS TESTING
Hardness testing is a basic test used to verify raw materials or as a quick check for materials that fail or aren't performing as expected. Hardness tests quantify the resistance of a material to plastic deformation and is available as microindentation or macroindentation.
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Product Testing
Verification of advertising promotional material in relation to operating, electrical, mechanical, or pneumatic performance; ease of assembly, type of material furnished, general capabilities, and overall safety. Detailed internal and external inspections conducted. Extensive facilities for furniture testing.
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Altitude Test Chambers
Altitude chamber testing is important for manufacturers of products that might be shipped via air. It is especially important for defense and aerospace applications where pressure and vacuum conditions are even more intense. Our altitude test chambers simulate a variety of environmental conditions including temperature, altitude, humidity, and vibration for the rigorous testing standards of combined environment.
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Cable Free ATE
CABLEFREEATE
Digalog Systems customizes resources to provide requirements or more cost-effective requirements that are not currently on the market.The CableFreeATE™ technology also affords lower cost and easier integration of some common offerings:- VPC 64 SPST Reed Relay- 0.1" Discrete Header 64 SPST Reed Relay- DL1-156R 72 SPST Reed Relay
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Fused Test Probes with Silicone Test Leads
AL-57FL
Standard Electric Works Co., Ltd
● AL-57FL is an ideal tool which shows the indication of live voltage even with blown fuse.● 2 replaceable fast-acting fuses are built-in. The specs of the fuses are 1000V, 11A with internal rating of 20kA AC/DC.● Provide additional testing protection.● Help to prevent a possible mis-indication when there is voltage present.● CAT III 1000V, CAT IV 600V, 10A with protective cover.● 2mm probe tips, removable 4mm brass caged banana probe tips are also included.● Include High-quality silicone test leads, 1.5 meter long.● Wipe the fused test probes and silicone test leads periodically with a damp cloth and detergent. Do not use abrasives or solvents.● Operating temperature: -20 °C to +50 °C (-5 °F to 120 °F)● One year warranty● Can't be used on current mode with blown fuse.● Rating : EN 61010-031 CAT Ⅲ 1kV 10A / CAT Ⅳ 600V 10A
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Test Handler
M4872
Improve Efficiency in High-Volume Manufacturing and Device Characterization.
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Standard 1.71 (48.00) - 3.00 (85.00) General Purpose Probe
HPA-74T156
Current Rating (Amps): 3Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Test Center Remark: max. test center 187 mil / 4,74 mmFull Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 75Recommended Travel (mm): 1.91Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 598Overall Length (mm): 15.19Overall Length Remark: Tip “A-B”: 598 (mil), 15.19 (mil), Tip “C”: 586 (mil), 14.88 (mil), Tip “E, T135, T156, T65, T80”: 610 (mil), 15.49 (mil), Tip “T75”: 620 (mil), 15.75 (mil)
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Standard 0.79 (23.40) - 1.75 (49.60) High Frequency Probe
CSP-40A-024
Bandwidth @ -1dB (GHz): 6.00Return Loss @ -20dB (GHz): 2.30Nominal Impedance (Ohms): 50Dielectric VTE Rating (k VAC): 1Test Center (mil): 250Test Center (mm): 6.35Full Travel (mil): 200Recommended Travel (mil): 133Recommended Travel Remark: Shield: 211 (5.36) including travel of probesOverall Length (mil): 1,231Overall Length (mm): 31.28Full Travel Remark: Shield: 225 (5.72) including travel of probes
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Material Testing
*Abrasion Testing*Adhesion Testing*Brittleness Temp.*Bursting Strength*Coating Testing*Coefficient of Friction*Compression Testing*Compression Set*Dart Drop Testing*Density Determination*Fatigue Testing*Fiberboard Testing*Flammability Testing*Flexural Testing*Foam Testing*Hardness Testing*Heat Deflection*Hydrostatic Testing*Impact Testing*Life Cycle Testing*Melt Index Testing*Plastic Testing*Ply Separation*Resin Content*Rubber Testing*Shear Strength Testing*Stress Crack Testing*Tear Testing*Temperature Testing*Tensile/Elongation*UV Exposure*Water Absorption*Wood Testing
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SQL Test
If you want to do test-driven development for databases, SQL Test is the place to start. It lets you write database unit tests in T-SQL and run them in SQL Server Management Studio. It's simple to set up, you don't need extra tools, and you don't need to learn new technologies.
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Test Socket
Contact Pitch Sizes 0.3mm, 0.4mm, 0.5mm, 0.65mm, 0.8mm, 1.0mm (custom pitches available)•Bandwidth < -1 dB through 65GHz•Current Carrying Capabilities 1 - 4 Amps•Pin Contact DC Resistance 10 - 30 mΩ•Environmental -40°C to +150°C•Self Inductance 0.14nH – 0.36nH•Mutual Inductance 0.12nH – 0.32nH•Typical Contact Force 12 – 35 grams/pin•Contact Compliance 75 µm – 200 µm•Custom Cooling Options Available
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In-circuit Test
Medalist i1000 Systems
Cover Extend Technology (CET) is now supported on the Medalist i1000D. The i1000D only requires a VTEP MUX card to enable CET. If you are already using test fixtures with VTEP MUX cards , you can now implement CET without any fixture modification. Simply add new VTEP probes to devices that were previously not testable. This greatly reduces implementation efforts.
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Test Automation System for Brake Testing
STARS Brake
STARS Brake is an integrated automation, data acquisition and control system platform that provides a comprehensive application functionality in a single, powerful environment. STARS Brake is designed to address the needs of a wide range of brake testing applications from component development to final component and system validation. It offers users a level of flexibility and openness that enables thorough investigations of brake systems.
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Standard Digitizer
725S Family
The 725S family is a digitizer capable of recording waveforms along with performing advanced algorithms for online digital pulse processing (DPP). Utilizing DPP Firmware, users can acquire quantitative physical parameters (Integrated Charge, Pulse Shape Discrimination with very fine time resolution, Pulse Height Analysis) as well as read out waveforms with automatic pulse identification and baseline suppression on channel basis (Zero-Length Encoding and Dynamic Acquisition Window). The wide range of DPP algorithms supported by the 725S make it a “must-have” for any type of nuclear physics application.
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Sencha Test
Sencha Test is the most comprehensive unit and end-to-end testing solution for Ext JS apps. Based on years of testing Ext JS applications and the deepest integration with the framework, Sencha Test helps you improve application quality, accelerate time to market, and reduce testing time and costs. With Sencha Test, you can create unit and end-to-end tests quickly, and execute them on multiple browsers simultaneously. Cross-browser testing is critical to ensuring quality for organizations, and test automation is a requirement to meet delivery timelines. Sencha Test is the only dedicated testing solution for Ext JS applications. It helps you build an end-to-end testing plan without having to cobble together testing tools.
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Standard Voltage 50 Pin D-Type Connector Blocks and Breakouts for Pickering
The connector blocks and breakouts below are suitable to use with Pickering cards and modules that utilize a standard voltage 50-pin D-type connector.
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Standard 1.00 (28.00) - 3.20 (91.00) General Purpose Probe
P2550-8
Current Rating (Amps): 5Average DC Resistance lower than (mOhm): 30Test Center (mil): 187Test Center (mm): 4.75Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Overall Length (mil): 1,453Overall Length (mm): 36.91Rec. Mounting Hole Size (mil): 126Rec. Mounting Hole Size (mm): 3.20Recommended Drill Size: #30 or 3.20 mm
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Xytronic Single-Phase Reference Standard +/- 0.04%, +/- 0.02%, +/- 0.01%
RADIAN RX-20, RX-21 and RX-23
Radian Research is committed to providing our customers with leading innovative and technologically superior products, while maintaining metrology capability in power and energy measurement that is surpassed by none. Our engineers drew on the expertise and knowledge we acquired for our industry-leading legacy RM (Metronic) and RD (Dytronic) reference standards to develop the RX (Xytronic), the ultimate in power and energy measurement technology perfection.
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PCIe 5.0 Test Platform
PXP-500A
The Teledyne LeCroy PXP-500A Test Platform provides a convenient means for testing PCIe 5.0 cards with a self-contained portable and powered passive backplane. The PXP-500A provides power required for both cards under test.
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Standard 2.40 (68.00) - 6.20 (176.00) Battery Probe
BIP-8
Current Rating (Amps): 5Average Probe Resistance (mOhm): 30Test Center (mil): 188Test Center (mm): 4.78Full Travel (mil): 90Full Travel (mm): 2.29Recommended Travel (mil): 60Recommended Travel (mm): 1.52Overall Length (mil): 396Overall Length (mm): 10.06
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Optical Testing
We place a great emphasis on our ability to test everything we produce and supply. This has provided the impetus for us to design and build comprehensive testing facilities that include standard as well as custom-made testing equipment.
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Standard 1.18 (33.30) - 3.25 (97.00) Battery Probe
BIP-1
Current Rating (Amps): 5Average Probe Resistance (mOhm): 16Test Center (mil): 150Test Center (mm): 3.81Full Travel (mil): 75Full Travel (mm): 1.91Recommended Travel (mil): 50Recommended Travel (mm): 1.27Mechanical Life (no of cyles): 250,000Overall Length (mil): 323Overall Length (mm): 8.20
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Standard 1.60 (45.00) - 4.50 (128.00) General Purpose Probe
EPA-3A
Current Rating (Amps): 6Average Probe Resistance (mOhm): 35Test Center (mil): 125Test Center (mm): 3.18Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 2,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02
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Protocol Test System
USB Explorer 260
The Ellisys USB Explorer 260 is a sophisticated protocol test system for USB traffic monitoring, driver and software stack debugging, protocol compliance verification and performance analysis. Analyze USB 1.1 and USB 2.0 links at any speed, including OTG and the new InterChip-USB at all speeds and all voltages; emulate USB hosts and devices; inject pre-defined error patterns for stress and error recovery testing.
