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Memory Test System
T5833/T5833ES
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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Accelerated Life Test Systems
Test systems for accelerated life testing and product burn-in utilize Intepro’s electronic loads that are ideal where high power bulk loading is required. Characterization applications within Telecommunication and Aerospace sectors benefit from Intepro’s environmental stress screening (ESS)/Burn-in solutions
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Resilient Modulus and Asphalt Testing System
The Resilient Modulus software features built and test sequences, and the capability to specify user defined sequences. Contact stress is automatically adjusted according to the above procedures as selected. Available waveforms include haver sine, sine, square and triangular, along with a user defined waveform selection. Optional peak & valley compensation ensures proper and quick matching of the load parameters. Real time displays of the prescribed versus actual dynamic load or the dynamic deformation measurements by each sensor are always present. Deformation ratio of the two sensors, Rv (to ensure that the two deformation sensors are in agreement) and Mr are also calculated in real time. During export, curve fitting is done to fit the results to models that predict Mr as a function of σm, σd, and CP (cell pressure). Four different functions are calculated automatically
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Military Communications Test
Astronics testers for military radios and wireless communications systems help you keep your most critical communications up and running smoothly. Write test program sets once and deploy them instantaneously everywhere – whether your test set is in the factory, at the depot, or in operation.
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AUTOMATIC WINDING TEST SYSTEM
VE9036SU
6 CHANNEL Microprocessor based Automatic Test System for Automobile Coils, Magnetos, Alternator, Motor Winding. Can Test : Impulse Winding Tester (IW), AC/DC HiPot, Insulation Resistance (IR), Inductance (L), DC Resistance (DCR)
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High Current Discharge Testing System
DTV
Cold Crank Testing to industry standards: IEC, SAE, BCIDischarge capacity performance testing to thousands of amperes
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Flying Prober Test System
QTOUCH2204C
Qmax Test Technologies Pvt. Ltd.
The Prober Test System is capable of movement in XYZ directions with fixed angle (θ) and dual probe heads (further expandable up to 4 ) . The system has in-built Vision Camera for easy monitoring of probe needle contact.The prober supports automatic fiduciary recognition. The system has built –in linear encoders to achieve higher precision. It also comes with in-built image processing unit with minimum 5 Mega pixel Camera ,tele-centric lens with image processing software, illuminated with LED bar light with controls.
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Ferroelectric Test System
RT66B
Radiant's Rt66B offers amazing performance at an affordable price. The Rt66B is a perfect entry level system for measuring Ferroelectrics. This system does include Radiant's famous Vision Data Management System which offers all the standard measurements of ferroelectrics including Hysteresis, Fatigue, Waveform, C/V, I/V, PUND and much more.
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High Temperature Component Test Fixture
16194A
Measure both axial/radial leaded devices and SMD within the temperature range from -55 to +200°C.
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Modular Test System
IMU-MGS
Modular test system with colour touch screen and intuitive software. An integrated help with graphics guide the user through fast and efficient setup and operation. The system is used for CE mark testing in the European Union.
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Handover Test Systems
Family of handover test systems designed for handset-to-network handover testing. Internal step attenuators allow the RF signal between the network access points and the handsets to be dynamically faded up/down. The Ethernet/Serial models run our latest generation 3.x.x firmware that features easy to use ASCII formatted commands.
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Power Device Testing System
Devices that control electric power, and are used in automobiles and a wide range of electrical products.
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Battery Test System
WBCS3000Ls32
Low current model32 channel battery cycler (expandable up to 128 channels)No. of minimum channel : 16 channelsmax. voltage range : ±5Vmax. current range : ±10mA
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Count Down Test System
The Second Launch Pad Count Down system is implemented using VXI hardware designed by Data Patterns specific to the application requirements, featuring a redundant system handling upto 14000 I/O points.
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Circuit Breaker Test System
TDR900
It operates and records a circuit breaker’s contact timing, motion, velocity, main contact engagement & synchronization, trip and close coil initiation and currents.
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Tire and Wheel Testing Systems
Advanced Telemetrics International
Tire and Wheel Testing Systems can be custom designed and manufactured for practically any application. The inductively powered system is used to wirelessly measure tire pressure and temperature during testing.
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Modular Test Systems
Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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Low Voltage Burn-in and Test System
Max 450
For burning-in and testing DUTs such as microprocessors, DSPs and logic devices, which require low voltage. Output monitoring gives functional test results for every device during burn-in
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PXI based Test Systems Module
PXI XJLink2
The PXI XJLink2 module allows the integration of XJTAG into PXI-based test systems. PXI XJLink2 has one JTAG controller that can be connected to up to 4 JTAG chains, which are configurable for pinout and voltage. It is easily integrated with LabVIEWTM with a full set of Virtual Instruments (VIs) included.
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Partial Discharge Test System
TPP
The Partial Discharge Test System type TPP is used for non-destructive insulation and quality testing of electrical components (for example according VDE 0110-1, EN 50178, IEC 60270 and IEC 60060).
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Meter Testing System
ASTel
Three-phase Meter Test Equipment of ASTeL 3.2x.x series system is a fully automatic system enabling simultaneous, multi-position calibration and legalization of electric energy meters. The automatics include power sources, reference standards, stand controllers, photoelectric scanning heads, separating transformers, and other elements of the system. All these elements are controlled through a Windows based executive program.
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Computer Based Audio Component Test System
DATS V3
Rugged aluminum housing with detachable test leads and built-in precision calibration resistorTighter tolerances on internal components for more precise measurementsIncreased output capability means greater separation from the noise floor, resulting in more accurate measurementsDATS Linearity Test for comparing parameters and impedance plots at multiple drive levelsOptional under desk mounting brackets included to save desk spaceOnly 1" H x 2-1/2" W x 4-1/8" D for easy portability
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Tensile Testing System With Thermostatic Chamber
This thermostatic chamber is ideal for long-stroke tensile testing of large-elongation materials such as rubber and plastic in controlled temperature environments.
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Single Event Effects Test System
SEE-RAD
The SEE-RAD test system brings together the proven features of our ETS780 tester (such as true APG memory test and powerful FA tools) with the newest technology of the Griffin III. With all new high-accuracy DC Parametrics, superior precision pin drivers, and capture memory of 64M, the Griffin SEE-RAD combines the newest innovations in the test industry with our years of experience in Radiation Test.
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Battery & Electrical System Testing
12-0200
Vehicle Battery Systems fitted to modern cars require a complex system to control and maintain the best charge and discharge rates which not only ensures the longest in service life but also that systems such as Stop/Start operate correctly. The 12-0200 gives the operator access to all the functions complicated and time-consuming manufacturer scan tools have to perform the same function but in a fraction of the time. On average the total time required by the technician to reset a system will be 30 seconds.
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Pneumatic Horizontal Shock Test System
KRD12 series
The KRD12 series shock test system is used to measure and determine the horizontal impact resistance of a product or package, and to evaluate the reliability and structural integrity of the test unit in a horizontal impact environment. The system can perform conventional half-sine wave, post-peak sawtooth wave, or trapezoid wave shock test to realize the shock energy that the product is subjected to in the actual environment, thereby improving the product or packaging structure.
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Electro-Optical System Test Bench
IRCOL
Optical collimators and universal electro-optical test benches.
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EMC Test System
An electric product might cause the malfunction to other electric appliances by discharging the emission noise from it, or is oppositely caused the malfuction by the emission noise from other electric appliances. The former is checked by the EMI test and the latter is checked by the EMS test. The international standard like the CISPR standard is provided so that such an accident should not happen, and the manufacturer must declare by themselves beforehand that their product meets the standard. The generic name of the EMI test (Electro-Magnetic Interference) of the emission measurement and the EMS test (Electro-Magnetic Susceptibility) of the immunity
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Test System
Griffin III
The Griffin III system brings new price/performance efficiency to the Tester-in-a-Head tradition, a concept created and introduced by HILEVEL in 1987. This tester is a superior cost-effective solution for Engineering, Production, and Failure Analysis test applications.
