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Mezzanine System
5174
The 5174 provides two major functions, serving as a precision Voltage Controlled oscillator board and a variable frequency source board. These features can be use together or independently. As a variable frequency source, the 5174 provides a high-resolution variable clock source that is based upon a reference clock supplied by the ECM carrier.
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Relay Testing System
UNO
With high power outputs package in an extremely compact and rugged system, the UNO has a tremendous power-to-weight ratio. The design incorporates the latest in modern digital microprocessor technology to achieve unbeatable output characteristics in terms of power, accuracy, low distortion, and dynamic capability. This hi-tech solution enables the testing of many different functions required in relay testing without the need of additional accessories.
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Modular Test Systems
Whether thin film, thick film, MEMS, multilayer or bulk: With test systems from AixACCT Systems, you can characterize your piezoelectric materials both in development and during production with the greatest accuracy.
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VLF Test System
BAUR PHG 70 portable
BAUR Prüf- und Messtechnik GmbH
Portable, high performance test generator with VLF truesinus technology. The BAUR PHG 70/80 portable VLF test systems are used for cable and cable sheath testing of medium-voltage cables of up to 50 kV and electrical equipment.* 3 voltage shapes in one device: VLF truesinus, VLF square wave and DC voltage* For medium-voltage cables of up to 50 kV operating voltage* Cable testing, fault conditioning, cable sheath testing
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PXI Test System
APT-1000
18 Slot NI PXI chassis (PXIe-1065)Amfax MDU with E-StopMAC Panel SCOUT Receiver chassis and tableProgrammable DC power supply4 channels- 0-30V 2AFan Vented 29u Instrumentation rackIndustrial PC i7- Windows 7 or 1024 inch touchscreen LED Monitor on armLight TowerCE CertifiedFully wired and testedFull documentation packDelivery and commissioning on site
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Optics Test Systems
Lens Test
Optik Elektronik Gerätetechnik GmbH
LensTest enables the measurement of air gaps, lens thickness, lens radii and lens surface centration errors in mounted lenses as well as the active alignment of lens surfaces during optics assembly for centering without rotating the assembly.
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Automotive Ethernet Test Fixture
AE6941A
The AE6941A automotive Ethernet electrical test fixture provides easy access to automotive Ethernet electrical signals so you can perform conformance testing and device characterization quickly and easily.
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Vibration Testing System
Torontech is now offering Vibration Test Systems, Shock Test Systems, Bump Test Systems, Drop Tester, and Packaging Transportation Simulators.
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Coil Test System
CTS
International Electro-Magnetics, Inc.
The system is controlled by a PC using software written in Visual Basic. It offers visually oriented menus that allow easy coil configuration and test set up procedures.
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Safety Compliance Test System
EN 60601
Test system for electrical safety compliance testing of medical products in accordance with EN 60601-1, 3rd edition.The system is equipped with three test fixtures which are connected in parallel order to reduce the number of setup tasks for different variants in the course of day-to-day manufacturing processes. Its purpose is to test medical products, e. g. patient monitors, which are employed at hospitals to monitor heartbeat and oxygen saturation.Based on the integrated electrical safety tester by Associated Research, in combination with an AC power source and a switching matrix, it is possible to fully automate tests like for instance AC/DC high-voltage tests, insulation resistance measurements, earth connection tests and leakage current measurements.The required occupational safety is provided by a high-voltage safety hood in accordance with EN 501191. The entire safety technology, as well as the control PC, is mounted in an aluminum-profile cart.
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Test System
ETS788
The 55/110 MHz ETS788 system boasts the same small footprint and cool quiet CMOS architecture as our ETS780 but with the new high-performance precision components of our Griffin series. This powerful member of the HiLevel family takes advantage of all of the tried and true features that have served users so successfully to date. Learn why the ETS788 is the perfect cost-effective solution for higher performance in Design Verification, Production and Failure Analysis.
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System Level Test
SLT
As technology nodes continue to evolve and with a more aggressive time to market to bring devices to their end applications, full test coverage of such chips is possible only with System Level Testing.
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Nanomechanical Test Systems
Bruker’s nanomechanical test systems deliver the highest degree of performance, accuracy, reliability, and versatility for quantitative mechanical and tribological characterization at the nanoscale and microscale. Utilizing multiple patented and proprietary technologies, the Hysitron product line of standalone nanomechanical test systems enable quantitative characterization at length scales unreachable by others.
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Mobile Test Systems
The systems include A+A+A+ LED solar simulators, high-resolution electroluminescence testers and various other tests that you can easily integrate into your transport of choice or directly into a container on site.
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Optics Test Systems
F Number Meter
Optik Elektronik Gerätetechnik GmbH
The f-number of a camera lens is defined as the quotient of the focal length f' and the diameter of the entrance pupil. The f-number measuring device is a simple structure for the automatic, software-controlled measurement of the f-number of optical systems.
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Memory Test System
T5230
T5230 memory test system for NAND/NVM devices adopts a combined array architecture to achieve best-in-class cost-of-test performance for wafer test, including wafer-level burn-in (WLBI) and built-in self-test (BIST). The system can perform on-wafer test of 1,024 memory devices per test head in parallel, delivering high productivity and enabling floor space savings of up to 86%. Multiple test cells are connected per system controller in the T5230, allowing independent wafer test of each test cell. The test cells can be stored in a general multi-wafer prober while minimizing the test cell floor space, and the tester can be docked with probers in both linear and multi-stack configurations. For functional tests at a maximum test rate of 125MHz/250Mbps, the T5230 assures high timing accuracy, repeatability, and failure detection capability.
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Universal Testing Systems
Instron universal testing systems are versatile, high-accuracy platforms (available in electromechanical and hydraulic variants) designed to perform a wide range of static mechanical tests, such as tension, compression, bend, peel, shear, puncture, and more, on virtually any material. They support force capacities from fractions of a newton up to thousands of kilonewtons, with precision load measurement, high data acquisition rates, and compatibility with thousands of accessories, including a wide range of extensometers, grips, fixturing, and automation solutions to meet demanding quality and throughput standards.
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AOI & SPI Test Systems
Xceed AOI
Most defects in the circuit-board assembly are due to the solder paste or the process of printing solder paste. Since the transition to lead-free soldering, a whole new spectrum of problems has emerged in older paste printing and its due processes. Incomplete coalescence of ball grid array (BGA) spheres and solder paste deposits are failure modes that have increased in frequency since the transition to lead-free soldering. The Xceed enables true 3D measurement and provides the most accurate and repeatable inspection results with the minimum false calls. It’s designed with Advanced Signal Processing which gives results in noise-less, clear, and accurate 3D images.
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Benchtop with Drop-In Test System
600 Series Compact ATE Platform
The Circuit Check 600 Series Compact ATE Platform with built-in professional fixturing solves the uncertainty of repeatable results that are common with bench testing. With the 600 Series Compact ATE, test procedures can become automatic, with test steps and go/no-go limits easily programmable. Hand-probing is eliminated, replaced with accurate, repeatable tooling and reliable spring-loaded test probe fixturing.
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Rotary Table Test system
The requirement was to develop a test system that can take very different test and programming times into account so that the hardware used can be used in the best possible way.
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Shock Test System, Battery Test
Guangdong Bell Experiment Equipment Co.,Ltd
DGBell's shock test system used to measure and determine the impact resistance of a product or package. It is mainly used to evaluate the reliability of the function and the integrity of the structure of the test product under impact environment. Suitable for impact testing of aerospace, aerospace, marine, military, consumer electronics, automotive, household appliances and display equipment.
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Test Systems
In-Circuit Test (ICT) tests populated circuit boards by means of electronic measurements through thin needles on test fixtures. We offer in-circuit testers for various testing strategies – from the flexible 19“ rack to the ergonomic high-performance tester. And all of our in-circuit testers are also available in the Lambda edition for true parallel testing. The flying probe test checks your printed circuit boards using four movable test heads. This requires no fixtures and allows for flexible test program generation. That makes our flying probe test systems ideal for a high mix of printed circuit boards and small to medium test volumes, such as for prototype testing.
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Portable Test System
MT680s
Actual value, vector, curve displaypower generationerror measurementMeasurement of harmonics up to the 40thVoltage supply via existing measurement voltage
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USB PD Test System
6050
Single Output USB PD USB PD basic version：the single-group test systemarchitecture is as shown in the table, 5302A AC Source, 3302F + 3310F series and9922-R Quick Charge Controller.
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Cable Harness Test System
Data Patterns has built high reliability Cable Harness Test Systems for large installations. These are primarily used in launch vehicle aircraft and missile level cable harness test validation. Installations with upto 20,000 lines test capability at a single location have been supplied by Data Patterns. Portable version capable handling of as small as 384 points have also been addressed.
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D-Mic Auto Test System
BK9013
If your company produces millions of D-mics per month, take a look at the BK9013. Based on our BK3012V2 D-Mic Tester, the fully automatic BK9013 is our fastest D-Mic test system. With 4 or 8 couplers, the BK9013 can simultaneously test and sort up to 8 D-Mics into 8 passing grades and 7 different causes of failure in just a few seconds! You can view the results in real time or store them to analyze later.
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Portable Meter Test Systems
Zhengzhou SMS Electric Co.,Ltd
Portable energy meter calibration test devices.
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Automated Testing System
PV-LIT
Thermographic solutions ensure high quality of solar cells and modules.Usable for all types of solar cells and modules (silicon-based or thin-layered)Testing in laboratory and in-line in the course of the manufacturing processTesting of various solar cells and modules through contact and non-contact measurementCell-specific system configuration and determination of test criteria and kind of defects
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EMC Test Systems
IEC61000
N4L are the only IEC61000 EMC test system manufacturer in the world* with an on site UKAS ISO17025 calibration laboratory offering accreditation to IEC61000-3-2, IEC61000-3-3, IEC61000-4-7 and IEC61000-4-15. Calibration and trace-ability are a vital aspect of any EMC test solution and the coverage provided through N4L’s UKAS Laboratory is comprehensive. N4L’s IEC61000-4-15 calibration procedure is particularly noteworthy as it covers the entire test protocol detailed in Annex C of IEC61000-4-15. It is commonplace for specific parameters within IEC61000-4-15 (d parameters are frequently omitted from calibration procedures) to remain untested during typical flicker calibration due to the difficulty in providing trace-ability for such measurements. All tests within the test protocol of Annex C are included within the scope of accreditation and calibration procedures at N4L.
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Memory Test Systems
T5503HS2
Semiconductor memories are in high demand to meet the needs of fast-growing end markets such as portable electronics and servers. It has been forecasted that applications ranging from mobile devices and data centers to automobiles, gaming systems and graphics cards will consume an estimated 120 billion gigabits of DRAM capacity. To meet this market demand, new generations of memories with data-transfer speeds of 6.4 Gbps and higher are being developed. Advantest’s second-generation T5503HS2 tester is designed to handle these ultra-high-speed memory ICs.
