Showing results: 3091 - 3105 of 3184 items found.
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ATE-1 -
Lisun Electronics Inc.
Test series connection, parallel connection and series/parallel connections of the electronic ballast (about 15 kinds of connections), available for various electronic ballast. • With a precise resistance box, tube is substituted for the resistance, can act as many as 6 tubes. Resistance value: 1-4095Ω adjustable. • Measure input parameters (vrms, irms, w, pf, harmonics, etc), output parameters (on-circuit voltage, lamp voltage, filament voltage, lamp current, lamp power, oscillatory frequency), can also test the ballast efficiency, abnormity protection, and power symmetry of partial rectifier effect and etc. • Program controlled AC power source to guarantee the smart choice of input voltage and the frequency. • Equipped with 17 inch LCD controlled machine, specially designed A/D combined with special CPU, has the two left and right testing interfaces to achieve stability of data and high- speed testing. • We can make the special-designed product for you and promise to upgrade the software for free.
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PCI104 -
Vadatech Inc
The PCI104 is a PCIe carrier for PCI Mezzanine Cards (PMC) or Processor PCI Mezzanine Cards (PrPMC). The PCI104 carrier allows simplified testing of PMC/PrPMCs and their associated PMC I/O Modules (PIMs) by using a PC environment during board development or deployment. The PCI104 can also reduce the costs of manufacturing PMC/PrPMCs by allowing manufacturers to use off-the-shelf PCs for functional testing. The PCI104 converts the PCIe x4 edge connection to PCI-X via a PCIe to PCI-X bridge. The trace lengths to the PMC/PrPMCare kept to a minimum so the PMC/PrPMC can run with a133MHz PCI-X clock speed. The J4 connector of the installed PMC/PrPMC is routed to a 96-pin DIN connector per theVITA-35 specification. The PCIe to PCI-X bridge can run in either transparent or non-transparent mode and can also operate in forward or reverse mode. The PCI104 has a fan mounted on the board to cool the PMC/PrPMC. The fan can easily be removed for testing and probing of hosted card.
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CCT-100 -
Cosam Industries
Automatic Custom Cable Tester. Instantly test up to 52 test points as soon as you connect your cable. OLED display with pass/fail indicating light and audible notification. Steel construction: 7.75″ x 3.50″ x 1.5″Capable: 52 Test points (Cables up to 26 wires) Detects Opens, Shorts, Miss-wires, Bad connections, and Diode polarity.Versatile: Many standard connector boards available as well as a build-your-own option for specialized connectors.Compact: 75” x 3.5” x 1.5” (197 mm x 89 mm x 38 mm)Rugged: Made from 18 gauge cold rolled steel. Will last for decades.Fast: Tests at speeds up to thirty times per second and starts without pressing a button.Intuitive: Easy to read status updates shown on the clear and bright OLED display along with simple Pass/Fail indication by both green/red LED and dual-tone audio buzzer.
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TY-9610 -
Wuxi Tianmu Instrument Technology Co., Ltd.
1, Optical SystemStructure: Pa type - RungeRaster: Radius of curvature: 750mmIncident slit width: 20 μ mExit slit: high-precision photolithography of the entire slit, according to different elements set up 30u-75u slit width.Detector: Photomultiplier tube ( PMT ) detector2, all digital excitation light source1. Fully digital intelligent composite light source DDD technology, which can automatically adjust the excitation parameters of light source according to the excitation characteristics of different materials, and truly realize full digital control. 2. Using the all-digital control mode, high-energy pre-combustion technology ( HEPS ), ultra-stable energy release stimulates the sample in an argon atmosphere. 3. The application of all-digital light source improves the measurement accuracy and similarity of the sample, improves the sample excitation speed, improves the spark stability, and makes the sample have better reproducibility. The maximum discharge current reaches 400A .
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WLAN Test Toolkit -
NI
The WLAN Test Toolkit gives you direct and fine control over the generation and analysis of IEEE 802.11a/b/g/n/ac and ax signals, as well as 802.11j/p/ah/af waveforms, with industry-leading speed and accuracy. It empowers you to characterize, validate, and test a variety of WLAN connectivity products, such as RF front end components, wireless modules, and user devices.The toolkit includes extensive support for the latest features of the 802.11ax standard, including extended single-user packets, multiuser OFDMA, and multiuser multiple input, multiple output (MIMO) functionality with per-user configuration and measurement results. The WLAN Test Toolkit helps you solve demanding new access point test cases by generating signals that simulate multiuser environments, including per-user impairments. You can also use the new software to generate trigger frames to test the real-time response of client devices and make power precorrection and relative center frequency measurements.
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TLP-3010C -
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±8 kV*High pulse output current up to ±30 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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T5833/T5833ES -
Advantest Corp.
T5833 system is a cost-efficient, high-volume test solution capable of performing both wafer sort and final test of DRAM and NAND flash memory devices. Amid surging sales of mobile electronics, DRAMs, NAND flash memories and multi-chip packages (MCPs) — the main device types used in smart phones and tablets — are quickly evolving toward higher speeds and greater device capacity. Internet and cloud servers also are driving demand for faster, higher-capacity ICs. Yet the cost of testing today's wide array of memory devices is an obstacle for chipmakers, which urgently require solutions that can deliver high functionality, high performance and low cost of test (COT). Advantest's new, multifunctional T5833 memory test system meets these needs, delivering both wafer sort and final test capabilities for a full range of memory devices, including LPDDR3-DRAMs, high-speed NAND flash memories and next-generation non-volatile memory ICs.
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TLP-4010C -
High Power Pulse Instruments GmbH
*Wafer and package level TLP/VF-TLP/HMM testing*Ultra fast 50 Ω high voltage pulse output with typical 100 ps rise time*Built-in HMM (IEC 61000-4-2) pulse up to ±10 kV*High pulse output current up to ±40 A*High speed 50 Ω trigger output for oscilloscopes (synchronous to high voltage pulse output)*6 programmable pulse rise times: 100 ps to 50 ns*8 programmable pulse widths: 1 ns to 100 ns*Optional pulse width extender increases pulse width up to 1.6 µs in 68 programmable steps*Fast measurement time, typically 0.2 s per pulse including one-point DC measurement between pulses*Efficient software for system control and waveform data management*The software can control automatic probers for fast measurement of complete wafers*High performance and high quality components
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Air Brake NanoLeak Finder -
Redline Detection, LLC
“The Air Brake NanoLeak Finder™ allows technicians, for the first time ever, to test for air brake leaks and pinpoint the precise location of leaks, in minutes. The equipment is being used by OEMs to locate leaks in heavy duty trucks and equipment that would take hours with conventional methods, saving valuable service time and getting trucks back on the road fast” said Alex Parker, Executive Vice President of Redline Detection “this is a very exciting breakthrough for anyone who deals with air brake leaks.” The patent pending technology in the machine creates a signature vapor that, in conjunction with the hand-held NanoLeak™ Locator, pinpoints the precise location of air brake leaks instantly. Clear, audible and visual signals speed diagnostics and pinpointing of leaks. The equipment improves efficiency, saving valuable hours and marking a dramatic technical advance from conventional, messy, soapy water methods and ineffective listening devices.
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Analog Devices Inc.
SPI (Serial peripheral interface) is one of the most widely used interfaces between microcontrollers and peripheral ICs such as sensors, ADCs, DACs, shift registers, SRAM, and others. Analog Devices has your isolated SPI bus covered with our dedicated SPI digital isolators which support this synchronous, full duplex master-slave-based interface. Options include devices built with ADI's proven iCoupler® technology and offering a small footprint, simple design-in, fast speeds, and high data integrity, as well as integrated µModules which require no external components. Our SPI isolator solutions increase performance and reduce board space. This simple, compact solution is ideal for isolated SPI data requiring communication across different ground potentials or through large common mode transients often found in Industrial PLCs (programmable logic controllers) and Instrumentation and data acquisition systems.
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Test Chest 3G (Multi Function Test) -
Murraypro Electronics
Quick and very easy to use, the amazing Test Chest boasts instantaneous Audio + Video generation and Monitoring. NO tedious boot-up means Test Chest is “First out of the blocks” every time by 10s of seconds, and it’s intuitive touch-screen speeds Engineers to the required function, saving precious time and giving their investigations a real head start. 10bit precision signal generation is standard with Test Chest, as are the analysis utilities which are displayed on it’s superb 5” high resolution touch screen Monitor screen, and stereo sound too (when present).Ease of use and protection whilst in service are serious matters, so Test Chest is fitted with ‘Ez-Grip’ resillent rubber end sleeves; these assist grip, and provide additional protection against everyday knocks and bumps. During transportation your Test Chest’s tough extruded alloy housing is cradled within a customised go-anywhere foam lined ABS Carry-case for complete protection.
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S-101 -
Notice
LD Driver slot module of FOTS system is an efficient module that is user centered, which can drive various kinds of laser diode for the use of optical signal transmission or light source. The module has a built in LD socket, in which LD of 14 pin butterfly type is installed, which makes it possible for the user to change the LD he or she wants to drive when needed. It is leaded to get rid of the inefficiency of expense, at which various types of expensive united source module needed are purchased. By operating monitoring PD and high-performance processor that are installed inside the module, the output power and temperature of LD can be driven accurately and stably. The laser diodes can be modulated internally in square, sinusoidal, and triangular waves and its output power and temperature can also be maintained the level set by the user. In order to realize the various functions, the efficient and multi-functioned control programs with high speed processor, LCD monitor or GUI for remote control are available.
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S-103 -
Notice
ASE broadband source slot module of FOTS system can offer special function that is able to change optical output spectral feature variously, which is change optical output spectral feature variously, which is followed by user’s driving embedded pump LD freely. The output power of each pump LD is controlled separately by the program that is set up by user. In the case optimum ASE source output features such as wide broadband (> 80 nm @ -10 dBm/nm) and stable output power (< 0.02 dB) is needed, it is made up so that the provided Default mode along with User mode can be chosen and set up. More stable application of ASE source is possible through the combination of monitoring of ASE output power, alarm status and pump LD status with real-time optimal feedback. The embedded FPGA processor makes high speed control possible and enables monitoring and feedback routine operated stably.
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S-105 -
Notice
VOA slot module of FOTS system is a module that installs a built-in dual channel MEMS type VOA inside and can do two separate attenuation functions with two each VOA channel being driven individually. This module controls the optical power precisely to maintain the desired output level set by the user by automatically correcting for power drift or fluctuation.This slot module provides high-performance power control features such as high attenuation range, accurate tolerance, stable spectral flatness and low insertion loss in the wavelength range of 1260 ~ 1600 nm. It also offers a particularity that the high-speed drive of attenuation is possible through the combination of high-speed FPGA processor and high speed response time (within 1 ms) VOA. With the provided driving program and GUI, users can set up various attenuation program of each VOA channel such as sequential attenuation step, periodic attenuation and operation time
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Machine Vision Products
Machine Vision Products, Inc. has extensive experience in a wide range of Microelectronics and Packaging applications. MVP works with the world’s leading manufacturers on a global basis. From multiple die and wire technologies to leadframe, ball grid array and surface inspection applications, MVP has the widest applications toolbox of any AOI provider. MVP takes pride in the fact that they supply many complex inspection solutions to diverse industries such as Automotive, Telecoms, Medical Devices, Military, and Space. MVP’s 900 Series is the base platform upon which all Microelectronics and Packaging inspection solutions are based. The 900 series 2D capabilities provide metrology and defect detection using a propriety Quad-Color lighting, Telecentric optics and resolutions down to 1um. 3D height measurement capabilities allow for in-line high speed inspection of Dies, paste deposition, positional accuracy, volume and height with a resolution down to 1.13um.
