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System Integration

incorporates all functioning sub-elements into one orchestrated service.

See Also: System Integrators, Test Systems, Location Based Services


Showing results: 451 - 465 of 530 items found.

  • SpaceWire-USB Brick Mk3

    326 - STAR-Dundee

    The SpaceWire Brick Mk3 is a USB 3.0 (also works with USB 2.0 and USB 1.1) to SpaceWire interface device that is suitable for use in all stages of SpaceWire equipment development: initial SpaceWire evaluation, instrument simulation, control system simulation, unit testing, integration support, and EGSE. The SpaceWire Brick Mk3 provides two SpaceWire interfaces, support for high speed data transfer, the capability to inject various types of errors on demand, the ability to transmit and receive time-codes and act as a time-code master, and comes complete with highly optimised host software for low latency transmission of SpaceWire packets directly to and from the host PC.

  • Modulation Distortion Up To 70 GHz

    S930707B - Keysight Technologies

    S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 8.5 GHz

    S930700B - Keysight Technologies

    S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 26.5 GHz

    S930702B - Keysight Technologies

    S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 50 GHz

    S930705B - Keysight Technologies

    S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 90 GHz

    S930709B - Keysight Technologies

    S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 13.5 GHz

    S930701B - Keysight Technologies

    S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 125 GHz

    S930712B - Keysight Technologies

    S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To 43.5 GHz

    S930704B - Keysight Technologies

    S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • Modulation Distortion Up To And Beyond 125 GHz

    S930713B - Keysight Technologies

    S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.

  • 2U Rackmount Network Appliance Platform With Dual LGA3647 Socket Intel® Xeon® Scalable Processors, Intel® C621 (Purley) And Up To 66 LAN

    NA860 - Axiomtek Co., Ltd.

    The NA860 offers a perfect mixture of performance, flexibility, and durability with server-class dual LGA3647 socket Intel® Xeon® Scalable processors and Intel® C621 chipset (codename: Purley). It is robust and highly reliable for use in a wide range of network applications such as SDN, NGFW, IDS, IPS, UTM, etc. Designed with flexibility in mind, the 2U rackmount network computing system is capable of managing numerous connected computers through an integration of up to eight expandable NIC modules which support a maximum of 66 LAN ports. These NIC modules feature support for copper, fiber, bypass, 1G/10G/40G Ethernet speeds, and hardware acceleration. The NA860 comes with twelve high-capacity DDR4-2400 R-DIMM slots with up to 384GB non-buffer non-ECC/ECC memory. Moreover, there are two hot-swappable 2.5-inch SATA HDD trays, one mSATA slot and one optional 3.5-inch SATA HDD tray for sufficient storage. Two PCIe x8 expansion slots are available for add-in cards.

  • All-Inert Autosampling Dissolution Tester with Built-In Fraction Collector

    CD AutoPlus & CD AutoFill - Teledyne LABS

    The CD AutoPlus™ is a precision autosampling system with all-inert syringes, valves, tubing, and fluidics, designed for plug-and-play integration with CD14 Comparative Dissolution Testers. With 6 syringes (10 mL capacity) and a volume accuracy of ± 1% (0.1 mL), the CD AutoPlus easily accommodates sampling intervals under 5 minutes.​The CD AutoPlus comes in two configurations, DissoScan™ and Maximizer™. Use the DissoScan with optional return-to-vessel (RTV) probes to recirculate rinse volumes, or the Maximizer™ for automated addition of dilutions or stabilizers, and its included media-replacement kit with low-evaporation vessel covers, 6 fixed probes (PEEK), and a 6-channel tubing harness.​The AutoFill™ collector is a precision fraction collector built to seamlessly integrate with the AutoPlus™ to save space and to provide a 360 degree view for visual monitoring of the collection process.The CD AutoPlus (38 cm W x 66 cm D) when combined with the CD14 dissolution tester provides the smallest 14-vessel footprint in its class.

  • Automated Test Equipment

    ATE - Frontier Electronic Systems Corp.

    The design, development, manufacture and integration of Automated Test Equipment (ATE) systems is a core technology focus for FES. Our engineers have designed and manufactured complex flight line test systems for military aircraft such as the F-15, F-18, C-17, B-1, B-52 and OV-22 aircraft. In 1994, FES developed the Common Core Test Set to test space systems electronics for the Defense Support Program (DSP). This open-architecture, high-reliability electronics test set has been upgraded over the last 20 years with new hardware and graphics-based software to accommodate the complex testing requirements associated with the International Space Station Rotary Joint Motor Controller and other satellite electronics. Maritime ATE systems designed and manufactured by FES include Radar & Video Distribution factory test systems supporting US and Canadian Navy customer production requirements. Core components of FES-developed ATE systems include the use of PXI/PCI/VXI/VME technologies, National Instruments Test Stand software, Agilent Technologies instrumentation, and Virginia Panel interface hardware. The FES ATE design team employs CMMI level 3 compliant processes throughout the design process from Systems Requirements Analysis through verification and validation of ATE compliance with customer hardware, software, and documentation requirements.

  • 14-slot PICMG 1.3 Bus Passive Backplane

    FAB101 - Axiomtek Co., Ltd.

    The FAB101 features one CPU card slot and thirteen 32bit/33MHz PCI slots, and built in a 24-pin ATX power connector and 8-pin connector for thermal detected board. Furthermore, the FAB101 delivers outstanding system performance through high-bandwidth interfaces such as Serial ATA and USB 2.0 high speed peripheral (optional function). It is designed for all of PICMG 1.3 single board computers, and is a perfect fit for AXIOMTEK's SHB100 & SHB110, which are built around the PICMG 1.3 form factor. We also have various 4U-high enclosures, AX6156E, AX6156LE, AX6156LLE, AX6156LLES, AX61400, AX61491, and AX6145, to house the FAB101 and any customer's industrial integrations flexibly.

  • Smart Camera

    NI

    Smart Cameras combine powerful onboard processors and imaging sensors into an all-in-one vision system. Smart Camera digital I/O includes optoisolated digital inputs, optoisolated digital outputs, a RS232 serial port, and Gigabit Ethernet ports. Smart Cameras also can include built-in digital I/O and industrial communication options for dynamic, real-time communication and integration with industrial automation devices including programmable logic controllers (PLCs), human machine interfaces (HMIs), robotics, sensors, and industrial machinery. You can configure Smart Cameras with the included Vision Builder for Automated Inspection (AI) software and program the camera with the LabVIEW Real-Time Module and the Vision Development Module.

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