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Showing results: 7981 - 7995 of 8519 items found.

  • Test Database Software Module

    LXinstruments GmbH

    The relational test database is the pivotal point of the software structure. On one hand, this is where the test applications and test systems used for productive testing are stored; on the other hand, it provides the storage space for all DUT-related test data. Depending on customer requirements, the test database may either be hosted locally on the test system or centrally on a server, supporting several test systems. The database performance is sufficient for a high-volume production environment with many test systems which access the central database in parallel. LXinstruments prefers to implement the database as a license-free MySQL database; it is however also possible to realize a version based on Microsoft SQL.

  • DC Load Bank

    K-900 - Kongter Test & Measurement Co., Limited

    K-900 series are your best choice DC load bank with Kongter’s updated solutions. This new series resistive dummy load includes a series customized load bank models that feature rugged design and and excellent performance. They facilitate your work for DC load and battery capacity testing. With different models of DC load bank, it covers a wide range from 12V to 480V nominal voltages with current up to 600A. Its big TFT touch screen with vivid display makes it more user-friendly for setting and operation. Kongter’s new PC software make it easy for measurement monitoring and report print out.

  • Calibration Test Pumps

    Ralston Instruments

    High-precision calibration & pressure testing is the key to success in the oil & gas, petrochemical, maritime, pharmaceutical and aerospace industries and the right calibration tools make all the difference. Ralston Instruments offers a wide array of intelligently designed, high-quality calibration test pumps that simplify complex calibration processes while providing fast, accurate results. All Ralston pressure test pumps are lightweight, extremely durable, and easy to disassemble and repair with standard hand tools. And for quick connectivity with the most effective results, they all come with Ralston Quick-test™ adapters for safe, stable, leak-free connections without the need for a wrench or thread tape.

  • Boundary-Scan DIMM Socket Tester

    ScanDIMM - Corelis, Inc.

    Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.

  • PCI Express 5.0 Test Platform

    Teledyne LeCroy

    Teledyne LeCroy’s PCI Express 5.0 Test Platform is part of a suite of tools that facilitates complete protocol testing of PCI Express devices up to and including version 5.0. The latest feature of the Teledyne LeCroy Test Platform is the addition of an integrated interposer, which eliminates the need for an external interposer. This innovation simplifies setup with fewer connection points and outboard devices, making analysis easier and more reliable than ever. In addition to using the Test Platform with the Exerciser, the user can connect two of their own devices and use the Test Platform as a PCIe 5.0 backplane and as an interposer to capture protocol traffic between the systems.

  • CoreCommander

    JTAG Technologies Inc.

    While many ICs are equipped with a JTAG (IEEE Std. 1149.1) boundary-scan register (BSR), a significant number of microprocessors and DSPs can be found with deficient or even non-existent BSRs. CoreCommander Micro uses the on-chip debug mode of processors to access ports and embedded peripheral controllers to promote ''kernel-centric'' testing. Similarly, in the case of today's Field Programmable Gate Arrays (FPGAs) test engineers can ''bridge'' from the JTAG interface to the resources of the gate array itself. Our CoreCommander FPGA product implements a translatorinterface that allows our JTAG hardware to control embedded IP cores via a variety of bus interfaces (e.g. Wishbone Avalon etc.).

  • Pro Model Automotive Meter W/PC Interface

    595 - Electronic Specialties Inc.

    The #595 is a premier automotive diagnostic tool. It is equipped with the latest testing capabilities, including Milliseconds Pulse Width, for measuring the on-time of fuel injectors. The #595 features a huge LCD display w/bargraph for easy viewing. This meter can even be interfaced to your PC or notebook computer for enhanced diagnostics and data presentation. The software and computer interface cable are included free! The #595 includes two sets of test leads, RPM pick-up, temperature probe, software CD, interface cable, protective holster, 9 volt battery, instructions manual and hard storage case. Inductive RPM pick-up features a five position, adjustable sensitivity switch.

  • sbRIO-9225, Non-Enclosed, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module

    780588-01 - NI

    Non-Enclosed, 300 Vrms, 50 kS/s/ch, 24-Bit, Simultaneous Input, 3-Channel C Series Voltage Input Module - The sbRIO‑9225 performs differential analog input. The wide measurement range is well suited for high-voltage measurement applications such as power metering, power quality monitoring, motor test, battery stack testing, and fuel cell tests. You can perform transient and harmonic analysis with high-speed simultaneous sampling. In addition, you can prevent ground loops and add safety to a system with 600 Vrms channel‑to‑channel isolation between the three sbRIO‑9225 channels. Non-enclosed modules are designed for OEM applications.

  • USB-7845, Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device

    783200-02 - NI

    Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7845 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7845 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • USB-7845, Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device

    783200-01 - NI

    Kintex-7 70T FPGA, 500 kS/s Multifunction Reconfigurable I/O Device - The USB‑7845 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7845 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • USB-7855, Kintex-7 70T FPGA, 1 MS/s Multifunction Reconfigurable I/O Device

    782915-01 - NI

    Kintex-7 70T FPGA, 1 MS/s Multifunction Reconfigurable I/O Device - The USB‑7855 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The USB‑7855 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • SpaceWire-USB Brick Mk3

    326 - STAR-Dundee

    The SpaceWire Brick Mk3 is a USB 3.0 (also works with USB 2.0 and USB 1.1) to SpaceWire interface device that is suitable for use in all stages of SpaceWire equipment development: initial SpaceWire evaluation, instrument simulation, control system simulation, unit testing, integration support, and EGSE. The SpaceWire Brick Mk3 provides two SpaceWire interfaces, support for high speed data transfer, the capability to inject various types of errors on demand, the ability to transmit and receive time-codes and act as a time-code master, and comes complete with highly optimised host software for low latency transmission of SpaceWire packets directly to and from the host PC.

  • High-Speed Precision SMU (100 FA, 60 V, 15 MSa/s)

    PZ2121A - Keysight Technologies

    The Keysight PZ2121A is a high-speed precision source / measure unit (SMU) featuring best-in-industry narrow-pulse width, fast Digitizer Mode, and seamless current measurement ranging. It enables narrow-pulsed measurements and fast dynamic measurements with a wide dynamic range for a wide range of emerging applications such as vertical-cavity surface-emitting laser (VCSEL) optical devices, integrated circuit (IC) testing. In addition, its low measurement noise performance enables measurements with shorter aperture times, and its seamless current measurement ranging function enables a wide dynamic range and eliminates range change time, which improves test throughput.

  • PCIe-7842, Virtex-5 LX50 FPGA, 200 kS/s Multifunction Reconfigurable I/O Device

    781101-01 - NI

    Virtex-5 LX50 FPGA, 200 kS/s Multifunction Reconfigurable I/O Device - The PCIe‑7842 features a user-programmable FPGA for high-performance onboard processing and direct control over I/O signals for complete flexibility of system timing and synchronization. You can customize these devices with the LabVIEW FPGA Module to develop applications requiring precise timing and control such as hardware‑in‑the‑loop testing, custom protocol communication, sensor simulation, and high-speed control. The PCIe‑7842 features a dedicated A/D converter per channel for independent timing and triggering. This design offers specialized functionality such as multirate sampling and individual channel triggering, which are outside the capabilities of typical DAQ hardware.

  • PXIe-5650, 1.3 GHz RF Signal Generator

    781215-01 - NI

    The PXIe‑5650 features continuous-wave generation capabilities with FM, 2‑FSK, or OOK modulation. It uses direct digital synthesis (DDS) for high-resolution frequency hopping or phase-continuous sweeping for fixture and device characterization applications. The PXIe‑5650 is ideal for clocking nonstandard sample rates, such as WCDMA signals at baseband or intermediate frequency (IF). With these versatile signal generators, you can perform analog and digital modulation through the onboard DDS circuit, which gives you frequency modulation and frequency-shift keying for applications such as bit error rate test, antenna testing, or even keyless entry. You can also perform amplitude modulation using on-off keying.

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