High Speed Internet Test
Determines the amount of data transferred per second.
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Standard 3.74 (106.00) - 14.35 (407.00) High Frequency Probe
K-50L-QG-75
Nominal Impedance (Ohms): 50Bandwidth @ -1dB (GHz): 12.00Return Loss @ -20dB (GHz): 3.00Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 100Full Travel (mm): 2.54Recommended Travel (mil): 67Recommended Travel (mm): 1.70Overall Length (mil): 1,575Overall Length (mm): 40.00
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Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe
K-50L
Current Rating (Amps): 5Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 1.90Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48
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Unipolar Variable Gain High Speed Amplifier
F70PV
The F70PV is a very fast, unipolar, linear amplifier having a variable amplification of 0-10 times and capable of voltage output of +70V. Any functiongenerator or arbitrary waveform generatoror any othe signal source can be used as an input device. The amplifier's output is linear from DC up to ca 10 megahertz range. It can be used in a wide range of high speed applications.
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Modular Functional Test Platform
LX-OTP2
The OTP² system platform has recently been available in both the PXI and LXI versions. The OTP2 system platform enables the cost-effective and fast implementation of function test systems based on defined modules and function blocks. Thanks to the open system interfaces, customer-specific adjustments can be made at any time without any problems. When considering options for your next generation functional test system, it is important to assess the entire life cycle of the system and the associated costs and efforts. Use OTP² to accelerate development cycles and reduce the development effort for new functional test systems.
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*High Speed, Multifunctional Integrating Spheres
Multifunctional integrating spheres enable simultaneous measurement of multiple laser parameters including:*Power*Pulse Characteristics*Spectrum
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High Speed Comparators (<100ns Propagation Delay)
Analog Devices high speed comparators feature <100 ns propagation delay and are a versatile and easy to use solution for a range of applications. Owing to our proprietary CB and XFCB fabrication processes, our comparators such as the AD790 possess a fast response time with outstanding input voltage resolution.
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High Speed Caged Ball
SBK
High Speed Caged Ball Ball Screw. THK high speed caged ball ball screw type SBK that eliminates collisions and friction between ball and prolongs the effectiveness of grease by utilizing the caged ball mechanism. This mechanism reduces a noise level, torque fluctuation, and a long maintenance-free period.
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Advanced SoC/Analog Test System
3650-EX
Chroma 3650-EX is specifically designed for high-throughput and high parallel test capabilities to provide the most cost effective solution for fabless, IDM and testing houses.
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Batterie Inspektor
By combining the most diverse hardware and software modules, Batterie Inspektor™ delivers innovative, automated, and digitalized battery testing at every stage of manufacturing. With this flexible test platform, all modules can be adapted to their respective quality requirements. Manufacturing is simplified through a scalable and standardized framework for both new projects and upgrades.
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Speed Controllers
Omega speed controllers are essential for controlling the speed of a motor in any given application. We carry a variety of speed controllers, covering needs from food to pharmaceutical industries.
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Brute High Current Probe
P4301-2F
Current Rating (Amps): 50Current Rating Remark: 40 Amps for BeCu plungersAverage Probe Resistance (mOhm): 5Test Center (mil): 300Test Center (mm): 7.62Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cyles): 1,000,000Overall Length (mil): 1,750Overall Length (mm): 44.45
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Non-Multiplexed High Speed Transient Function Card
Identified by its ADC per channel and on-board memory, it typically operates at per channel sampling rates which in aggregate would overwhelm any communication system. Data is stored on board during a test and transmitted to a host computer following completion.
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Speed Sensors
Variohm supply differential hall effect speed sensors for use in motorsport applications. We have two different designs but both offer very high performance.
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High-Voltage Differential Probe, 200 MHz
N2805A
The N2805A is a 200-MHz differential probe designed to provide superior differential signal measurements with long cable length (5 m), making it ideal in an environment where extended cable length is required. The probe offers 50:1 attenuation ratio, allowing it to be used adequately for up to ±100V DC+peakAC of high voltage differential measurements with high CMRR. The differential probe has a differential input resistance of 4 MΩ and low input capacitance of 4 pF to minimize circuit loading. The probe is powered by Keysight’s oscilloscope AutoProbe interface.
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Non-Multiplexed High Speed Continuous Function Card Overview
This type of system can be designed with benefits of both the multiplexed amplifier-per-channel and transient recorder systems. Benefits of the non-multiplexed amplifer-per-channel system include: High Sampling Rates: With an ADC per channel, the sampling rate is not encumbered with considerations such as multiplexing and post-amplifier settling time.Superior Filtering: With an ADC per channel, digital filtering can be used to augment analog filtering to achieve better anti-aliasing performance with much lower effective sampling rates.Superior Phase Matching: Digital filtering provides much steeper, more predictable rolloff rates and phase characteristics than analog filtering with greater stability with time and temperature changes at lower cost.
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Standard 3.27 (93.00) - 8.13 (231.00) High Frequency Probe
K-50L-QG
Bandwidth @ -1dB (GHz): 4.00Return Loss @ -20dB (GHz): 0.80Nominal Impedance (Ohms): 50Test Center (mil): 550Test Center (mm): 13.97Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 225Recommended Travel (mm): 5.72Overall Length (mil): 1,830Overall Length (mm): 46.48
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Speed Sensors
*2 in 1: speed sensor and evaluation in one compact housing*Space-saving design*Inductive or magnetic sensor principle*Flexible combination of housings, connections and output signals
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High Sensitivity Anemometer for Very Low Wind Speeds
HD53LS… Series
2-axis ultrasonic static anemometer - high sensitivity to dectect very low speeds. Measurement of wind direction, wind speed and wind gust.
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High Speed・High Accuracy Eddy Current Type Digital Displacement Sensor
GP-X
Panasonic Industrial Devices Sales Company of America
The inductive displacement transducers of the GP-X Series use eddy current techniques and are particularly noted for their highly accurate measurement at a resolution of 0.02% F.S. with minimal linearity error, a high sampling frequency of 40kHz and low temperature dependence. GP-X Series Sensors are ideally suitable for the highly accurate motion and distance control of metal objects in harsh industrial environments.
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High Speed Data Acquisition Board
MS 1800
*Bus Interface:- 64 Bit PCI Bus with PMC Interface*Virtex-4 FPGA based design*32 channel digital I/O signal*RS232 & RS485 Interface*32MB Flash*2MB Static RAM for data storage*Analog Inputs:- 2 Channel*Input Resolution:- 14 Bits*Sampling rate up to 80MSPS*Filter:- Low Pass Filter for all channels*Two Analog Outputs*14 bit Resolution*Driver interface for Windows2000/XP/VISTA and LINUX OS*Self Test future
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High Speed IR Camera
Tachyon 16K+
Allows to implement artificial inteligence (AI) and algorithms to develop custom solutions.
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High Speed Photodetectors
Macom Technology Solutions Holdings Inc.
MACOM offers photodetectors from 20 – 70 GHz for ultra-clean, high-speed performance that enable precise characterization of ultrafast optical signals. These products are available in with different bandwidths and packages to provide solutions many applications.
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Power Over Ethernet For Internet Service Providers
Intuitive PoE You Need . . . Design the Network You Want
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Parallel Electrode SMD Test Fixture, DC To 3 GHz
16196D
The 16196D surface mount devices (SMD) test fixture offers excellent repeatability and usability, with accurate correlation up to 3 GHz. 16196 series fixtures are custom designed to fit specific SMD sizes (see table below), and provide repeatable DUT positioning with reliable contacts to enable stable measurement results – reducing the possibility of operator-induced error. Traditionally, SMD inductor evaluation up to 3 GHz has been difficult to implement – now with the 16196 series, it’s easy to perform accurate and repeatable measurements.
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Functional Test Trainer System
QT65
Qmax Test Technologies Pvt. Ltd.
Functional Test Trainer system, is a test system which can perform various Power- On functional tests of digital devices(ssl/MSI/LSIs and analog devices in the out- circuit and in-E conditions. Unified Library of vast number of devices to effectively test devices in in-circuit as well as out of circuit conditions.
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Internet Streaming Video Multiviewer Monitoring System
WSM120
Mividi WSM120 is a multiviewer monitoring system designed for monitoring IPTV and Internet streaming video services. It supports most common IPTV and Internet Streaming media protocols including UDP, RTP, HTTP, HLS (HTTP Live Streaming), MPEG-DASH, RTMP, RTSP and MMS.
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Speed
Speed sensors for both indoor and outdoor environments with optinos featuring kits for motos, geartooth pickup, tachometers, and stroboscopes.
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High Speed Fiber-Optic Detectors
High speed fiber-optic detectors use special photodiodes with high speed electronic circuits to convert fast pulses in optical fibers to electrical signals for measurement. Unlike our optical receivers, these photodetectors do not include a transimpedance amplifier.
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Test Fixture, Axial And Radial
16047A
The 16047A is designed for impedance evaluation of axial/radial lead type devices of up to 13MHz. The 16047A employs Kelvin contacts which realize a wide impedance measurement range. The contact tip can be changed according to the device shape.
