DAQ Systems
Sense, log and store information.
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Optics Test Systems
Contract Measurements And Services
Optik Elektronik Gerätetechnik GmbH
Thanks to our very good laboratory equipment, we offer contract measurements for numerous measuring tasks. In the field of optics, measurement and testing technology, these are, for example, the parameters MTF, focal length, radius, contact dimension, focal length, geometric and optical parameters of cylindrical lenses. Others on request.
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RSP-2T Test System Interface Probe
RSP-2T
Current Rating (Amps): 5Average Probe Resistance (mOhm): 20Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 167Full Travel (mm): 4.24Recommended Travel (mil): 79Recommended Travel (mm): 2.00
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Electronic Load System
Electronic loads are required for testing fuel cells such as PEMFC, AFC, PAFC, MCFC, SOFC. These electronic loads are designed either in IGBT technology with power, current and voltage ranges according to specific requirements or in transistor technology. Electronic loads in IGBT technology are designed for high voltage ranges up to 900 V, current ranges up to 1000 A, and power ranges up to 480 kW.
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Fixed Surveillance System for Perimeter Security
Argus
Argus is a fixed, rugged, preconfigured wide area surveillance system. Combining a best-in-class radar and thermal camera with Command and Control software, Argus is designed to detect and track multiple threats both near and far in the most demanding weather conditions 24 /7. When compared to other perimeter security solutions, Argus has the lowest initial cost per kilometer of secured space as well as the lowest lifetime cost.
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Data Acquisition And Control System
DynPro2
Demands for data acquisition call for a range of complex requirements that need to come together to meet customer challenges, industry advancements and safety. DynPro2 is a full-featured, testing and measurement system that’s capable of testing a wide variety of equipment including engine, vehicle and industrial component testing.
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Advanced Data Acquisition And Control System
ADACS
This high-speed damage-control system was built around Arc Fault Detect and Continuous Thermal Monitoring (AFD/CTM) from the Johns Hopkins Applied Physics Laboratory. When AFD/CTM detects dangerous arc faults — powerful discharges of electricity between conductors — the ADACS system immediately cuts power to the affected circuit before it can damage equipment or injure nearby personnel. Altogether, the system prevents loss of life, preserves countless repair dollars and assures continuous readiness.
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Low Frequency Test Systems
Ingenieurbüro Dr. Hillger Ultrasonic-Techniques
Our imaging low-frequency inspection systems are excellently suited to displaying internal defects with high resolution and high dynamics.
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Test System
LPDDR4 and LPDDR3
Testing LPDDR4, LPDDR3 devices is made fast and simple with the "Lower Power" LPDDR4/3 TCE-3200LP IC test system. It can be configured up to 32 sites in parallel and integrated with the customer's selected handler.The TCIII-3200LP system can be used as a production tool as well as an engineering tool. To assist manufacturers and integrators, TurboCATS has developed a heat chamber that can be integrated with the TCE-3200LP, LPDDR4 and LPDDR3 test system. This allows the devices to be tested while being exposed to heat conditions.
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LMK Imaging Photometer Systems
The Life Sciences and Instrumentation division of Gooch & Housego is proud to annouce that it is the exclusive North American distributor of the exciting LMK line of products from TechnoTeam Bildverarbeitung GmbH (Germany), including:LMK 5 Luminance Measuring Video PhotometerLMK 5 Color Measuring Video PhotometerLMK Mobile Advanced Luminance Measuring Imaging Photometer
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Facility & Asset Management System
Insight
Today’s environment confronts lab managers in new, challenging ways. The current regulations demand increasingly complex test procedures that require more time and resources to execute, which counteracts the goals to improve productivity and reduce costs. Therefore, lab managers need to maximize the test cell availability by continual awareness of the current situation in their facility. They must ensure the equipment is fully functional, meets all mandatory quality standards and regulations, and is up to date with all service and maintenance requirements.
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Cross-Correlator Pulse Profiling Systems
Rincon
The third order cross-correlator is ideal for looking at the full range of output from amplified femtosecond laser systems. High temporal resolution over a long (close to 1 ns) window shows pulse features that are usually missed, giving the user a detailed and complete picture of the quality and stability of the output pulse parameters of their femtosecond lasersystem.
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Radar solution for launder systems level
The precise level measurement of molten metal in the launder system guarantees a controlled, reliable filling of casting pits, casting ladles and casting molds. Our radar sensors measure the level of liquid steel, copper or aluminum in open or closed launder systems, channels or troughs with a measurement accuracy in the sub-millimeter range – even at a metal temperature of up to 1600 degrees Celsius.
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Battery Monitoring System
iPQMS-C256
Around-the-clock UPS protection is achieved through battery monitoring systems that monitor and trend battery health multiple times per day. The iPQMS-C256 is designed for 480V UPS Systems. Ohmic resistance and voltage measurements (per jar) are taken as often as every five minutes. System DC current, DC voltage, and temperature are measured in real-time.
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DUV Lithography Systems
ASML's deep ultraviolet (DUV) lithography systems dive deep into the UV spectrum to print the tiny features that form the basis of the microchip.
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PC-104/PCI-104 DAQ & Communication Cards
PC/104 Single Board Computer modules include embedded DAQ, PC/104 DAQ, and PC 104 add-on peripheral modules - perfect for space limited applications.
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Solar simulation systems
Whatever your application, from an environmental chamber for small components to an extensive array for a complete automobile or aircraft test, EYE / Iwasaki has the experience to provide a solar lighting system customized for your requirements.
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ARM 9 System on Module
MS 1515
- Processor: LPC3250 processor with ARM 9 core running at 266 MHz SDRAM- Memory: DDR2 256 MB (scalable to 512 MB)- Flash Memory: NAND flash 512 MB- Display & Graphics: Programmable color LCD controller supports up to a TFT interface- Touch screen: Integrated touch screen controller- Network Support: 10/100 Base-T Ethernet PHY- PC Interface: One USB 2.0 high-speed On-the-Go interface- Serial Interfaces: Up to four external UARTs- + CAN 2.0B controller- + Three I2C ports- + Three SPI ports- GPIO: Programmable I/O depending on peripheral requirements- Mechanical: 60 mm wide x 60 mm long x 5.4 mm high
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802.11be Test System
IQxel-MX
Next generation wireless devices Access Points, CPEs and client devices like smartphones or tablets based on the IEEE 802.11be EHT (Extremely High Throughput) standard require stringent RF performance to meet the latest standard requirements.
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Process Verification System (PVS)
In today’s complex manufacturing world, having a manufacturing tool that can be connected into manual and automated processes, can help you achieve your error proofing goals. Whether you are assembling a complex modern tractor trailer design or building the next generation jet engine. If you have a variety of manual steps or a mix of automated processes, PVS is the tool of choice to make your LEAN manufacturing process, an effective one. The ARC PVS platform is a flexible, user configurable software and hardware platform that can be the essential tool. It includes a built-in controller architecture allowing you to connect together PLCs, smart torque and assembly tools and a variety of discrete processes.
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Nanopositioning Systems
Mad City Labs'' nanopositioning systems move and maintain the position of objects with sub-nanometer precision and high stability. Applications for nanopositioners include super resolution microscopy, high speed confocal imaging, AFM, NSOM, SPM, optical trapping, fiber positioning, single molecule spectroscopy, single molecule/particle tracking, high resolution optical alignment, nanoscopy and lithography.
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Surface Profiler Measurement System
SP series
SP series, high accuracy 3D surface profiler measurement system with white light interferometry.
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6U CompactPCI Enclosures & Systems
1~9U CompactPCI chassis for 6U CompactPCI boards , most of which are with front/rear panel I/O, H.110 CT bus and redundant power supplies.
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Portable High-Voltage VLF Test System
VLF-60
The system is designed for VLF (0.1 Hz) withstand testing of cross-linked polyethylene (XLPE) insulated cables.Integrated Tan Delta (tan δ) measurement module allows to evaluate the general condition of cable insulation according to IEEE 400.2-2013 international standard.
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X-Ray And Gamma Detector Systems
The XR-100CR is a new high performance x-ray detector, preamplifier, and cooler system using a thermoelectrically cooled Si-PIN photodiode as an xray detector. Also mounted on the 2-stage cooler are the input FET and a novel feedback circuit. These components are kept at approximately -55 °C, and are monitored by an internal temperature sensor. The hermetic TO-8 package of the detector has a light tight, vacuum tight thin Beryllium window to enable soft xray detection. The XR-100T-CdTe represents a breakthrough in xray detector technology by providing “off-the-shelf” performance previously available only from expensive cryogenically cooled systems. The XR-100-CdTe is also suited for measuring gamma rays.
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Full Wafer Test System
FOX-1P
Enables High Throughput, Single Touchdown, Full Wafer Production Testing. Capable of simultaneously testing up to 16,000 die in a single wafer touchdown. Resource configurable up to 16,384 " Universal Channels " - each programmable as anI/O, Clock, Pin Parametric Measurement Unit ( PPMU ) or Device Power Supply ( DPS ). Software-enabled per site flexibility to support small and large device pin count test needs. Comprehensive functional and parametric test capabilities Deep functional pattern data and capture memory optimized for BIST/DFT testing. Per channel PMU for per site parametric testing Individual channel over-current protection to protect wafers and probe cards. Configured for high volume production. Compatible with industry standard probers and probe cards. Available as an integrated test cell with prober, probe cards and 16,384 channel probe I/F. Configurable as a single or dual system integrated test cell.
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High-Power Narrow-Linewidth Laser System
SML and USML Laser Series
This solution offers a cost-effective and flexible solution for various experimental setups. It can generate up to 1 W output power and features a robust and highly reliable frequency stabilization which results in remarkable spectral characteristics.
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Immersion Systems
Immersion systems are the workhorses of the industry. Our latest NXT machines have shown the ability to run in excess of 6,000 wafers per day, with an average five percent productivity increase over 12 months, supporting our customers' value requirements. We continue to innovate our immersion systems to meet the requirements of future nodes, benefiting from commonalities in R&D with our EUV program, while ensuring the platform’s extendibility through System Node Enhancement Package upgrades. Thanks to these packages, any NXT system can be upgraded to the latest technology.
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Digital Matrix Intercom System
Gemini
A system that interfaces with existing communication assets such as SIP telephones.A way to reduce costs for linking remote sites by using standard IP infrastructure.An intercom system that operates over LAN or WAN or Internet.Works on any terrestrial or satellite-based network.Virtual and hardware operator panels to configure and manage each unit.Private one-to-one, group and conference calls with the ability to manage simple to complex conference and private conversations simply and quickly.Interfaces for telephony, 4 wire, and other audio devices such as Radio base station or Presenter systems.Sophisticated SIP integration for modern telephony interconnection options.Camera Mix interfaces for 6 cameras to/from Engineering and Production.
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Wireless Data Logging System
MicroLogPLUS
A wireless data logging system for remote monitoring of up to 200 data loggers via the cradle technology and transmitting all real-time measurements to the PC. Handles data from up to 200 MicroLogs at up to a distance of 300m (120m US Version). Two open collector output for controlling other devices set at low and high alarm levels
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System Design Tool
MAPP XT
Sculpt your coverage pattern and sharpen design ideas with your team online or offline before setting foot in a venue, so you save time, cost, and stress.
