Nano-probes - All Manufacturers - eTesters.com

Nano Probes

a 5 to 35 nm tungsten wire needle accessing an IC transistor node within 5 nm accuracy. AKA: Nanoprober

See Also: Probing, Probers, Probing Stations

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Showing results: 1 - 30 of 2557 items found.

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Name

Company
Sponsored by: QA Technology Company, Inc.

product

Spring Probes & Hyperboloid Contacts

QA Technology Company, Inc.

QA Technology Company, Inc.

In-Circuit / Functional Probes, Socketless X Probes®, High Current Probes, Double Ended Probes, ATE Interface Probes, integraMate®

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Real-time and Direct Correlative Nanoscopy

LabRAM Soleil Nano

HORIBA, Ltd.

LabRAM Soleil Nano - HORIBA, Ltd.

Fully integrated system based on our OmegaScope scanning probe microscope and LabRAM Soleil Raman microscope. LabRAM Soleil Nano offers unprecedented capabilities for direct co-localized AFM-Raman and photoluminescence measurements. AFM imaging modes (topographic, electrical, mechanical, etc.) and Raman acquisition can be performed either sequentially or simultaneously at the same location of the sample surface. Optical nano-resolution is also achievable with Tip-Enhanced Raman Spectroscopy and Photoluminescence (TERS/ TEPL). LabRAM Soleil Nano is compatible with the environmental chamber for AFM and Raman measurements in controlled atmosphere and at low temperatures.

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The Nanoworkbench

Klocke Nanotechnik

Klocke Nanotechnik

In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The...
In light microscopy it is natural to use toolsets like tweezers, knives, probes and several different measurement tools. Without this many present-day products and methods would not exist. The operators of SEM/FIB-Systems generally work without toolsets, although the wavelength limit of light is no physical boundary. It can be imagined how technology would be pushed when a SEM/FIB Workbench reaches the same degree of practicability and utilization as toolsets for light microscopes. The Nanoworkbench is the first system substituting the eye-hand coordination effectively with nm precision in a SEM/FIB-system. The Nanoworkbench features a set of applications including TEM lamella preparation, nano probing, nano cutting, nano cleaning, force distance measurement, particle sorting and material preparation. Every application supports automated processes so almost no user interaction is needed. Even complex processes can be done within seconds and even by untrained users. Applications can be combined to create new and more complex processes. Expanding the SEM/FIB to a material processing system and a nano-analytical workbench by utilizing the Klocke Nanoworkbench enables new applications in research and production of material research, live sciences, tribology, environmental & forensic research and semiconductor technology.
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Nano Technology Products

Salicon Nano Technology

Salicon Nano Technology

We are instrumental in offering quality range of nano technology products that find application in defense research and development organization. Our range encompasses probe station, microscope, extension cable, adopter and RF probing, and vibration isolation products. We have the ability and resources to design products in line with the exact specifications provided by the clients.

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AFM-Raman for Physical and Chemical Imaging

LabRAM Nano

HORIBA, Ltd.

LabRAM Nano - HORIBA, Ltd.

Fully integrated system based on SmartSPM state of the art scanning probe microscope and LabRAM HR Evolution fully automated Raman micro-spectrometer. LabRAM HR Nano offers full automation and versatile compatibility with outstanding performance.

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Analytical Software for Microscopy

SPIP

Image Metrology A/S

SPIP - Image Metrology A/S

SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enh...
SPIP™ or Scanning Probe Image Processor - is an advanced software package for processing and analyzing microscopic images at nano- and microscale. It has been developed as a proprietary software by Image Metrology and is unique in the microscopy and microscale research market. With the high level of usable features, SPIP provides industrial and academic researchers with an advanced toolkit for working with microscope images, incl. extracting data from most microscopy file types, cleaning and enhancing data, analyzing measurements, visualizing and reporting analysis results. The software is used for research and innovation in a variety of industries such as pharmaceutical, cosmetics, semiconductors, hard disk manufacturing, polymer and aluminum manufacturing. Furthermore, SPIP is widely recognized as the standard microscope image analysis software for research and education at leading universities, and has been cited in more than 1200 scientific publications.
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AFM-Raman for Physical and Chemical Imaging

XploRA Nano

HORIBA, Ltd.

XploRA Nano - HORIBA, Ltd.

Fully integrated system based on SmartSPM state of the art scanning probe microscope and XploRA Raman micro-spectrometer.Compact, fully automated and easy-to-use, the XploRA Nano concentrates the power of AFM-Raman into an affordable yet full-featured package, making TERS imaging a reality for all. The TERS proven system.

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Scanning Auger Nanoprobe

PHI 710

Physical Electronics

PHI 710 - Physical Electronics

The PHI 710 Scanning Auger Nanoprobe is a unique, high performance Auger Electron Spectroscopy AES instrument that provides elemental and chemical state information from sample surfaces and nano-scale features, thin films, and interfaces. Designed as a high performance Auger, the PHI 710 provides the superior Auger imaging performance, spatial resolution, sensitivity, and the spectral energy resolution needed to address your most demanding AES applications.

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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe

LFRE-25L36-4

ECT

LFRE-25L36-4 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe

LFRE-25Z-4

ECT

LFRE-25Z-4 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe

LFRE-25T-6

ECT

LFRE-25T-6 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Elevated 1.68 (48.00) - 7.00 (198.00) High Performance Bias Ball Probe

POGO-1Z1-7-S

ECT

POGO-1Z1-7-S - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Bias Ball Probe

POGO-1T24-6

ECT

POGO-1T24-6 - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Super 3.90 (111.00) - 16.00 (454.00) High Performance Lead Free Probe

LFRE-25UN-16

ECT

LFRE-25UN-16 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Light 0.48 (14.00) - 2.00 (57.00) High Performance Bias Ball Probe

POGO-62I8-2-S

ECT

POGO-62I8-2-S - ECT

Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe

LFRE-1L24-6

ECT

LFRE-1L24-6 - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02

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Standard 0.83 (23.50) - 2.85 (80.80) Battery Probe

CCA-004

ECT

CCA-004 - ECT

Current Rating (Amps): 10Average Probe Resistance (mOhm): 50Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 57Full Travel (mm): 1.45Recommended Travel (mil): 40Recommended Travel (mm): 1.02Overall Length (mil): 470Overall Length (mm): 11.94

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Light 0.75 (21.00) - 2.00 (57.00) High Performance Lead Free Probe

LFRE-25UN-2

ECT

LFRE-25UN-2 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Standard 0.62 (18.00) - 4.00 (114.00) High Performance Bias Ball Probe

POGO-1H-INS-4

ECT

POGO-1H-INS-4 - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Ultra High 1.77 (50.00) - 10.00 (283.00) High Performance Lead Free Probe

LFRE-25T36-10

ECT

LFRE-25T36-10 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Alternate 2.39 (68.00) - 6.00 (170.00) High Performance Lead Free Probe

LFRE-1I8-6

ECT

LFRE-1I8-6 - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Mechanical Life Remark: *Ultra High force products may observe slight decrease in cycle life.Overall Length (mil): 1,300Overall Length (mm): 33.02

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GSP-2B Test System Interface Probe

GSP-2B

ECT

GSP-2B - ECT

Current Rating (Amps): 5Average Probe Resistance (mOhm): 35Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 125Full Travel (mm): 3.18Recommended Travel (mil): 125Recommended Travel (mm): 3.18Overall Length (mil): 845Overall Length (mm): 21.46

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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe

POGO-1J-2-S

ECT

POGO-1J-2-S - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Standard 1.50 (43.00) - 4.00 (113.00) High Performance Lead Free Probe

LFRE-25T36-4

ECT

LFRE-25T36-4 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Alternate 0.66 (19.00) - 6.00 (170.00) High Performance Bias Ball Probe

POGO-62H-6-S

ECT

POGO-62H-6-S - ECT

Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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High 1.73 (49.00) - 8.00 (227.00) High Performance Bias Ball Probe

POGO-1T24-8-S

ECT

POGO-1T24-8-S - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Alternate 2.58 (73.00) - 6.00 (170.00) High Performance Lead Free Probe

LFRE-25T36-6

ECT

LFRE-25T36-6 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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High 1.80 (51.00) - 12.60 (357.00) Switch Probe

TSP138-F300-3

ECT

TSP138-F300-3 - ECT

Current Rating (Amps): 10Average DC Resistance lower than (mOhm): 20Test Center (mil): 138Test Center (mm): 3.50Full Travel (mil): 197Full Travel (mm): 5.00Recommended Travel (mil): 157Recommended Travel (mm): 4.00Overall Length (mil): 1,760Overall Length (mm): 44.70Switch Point (mil): 67Switch Point (mm): 1.70

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Premium 4.49 (127.00) - 12.00 (340.00) High Performance Lead Free Probe

LFRE-25I35-12

ECT

LFRE-25I35-12 - ECT

Current Rating (Amps): 8Average Probe Resistance (mOhm): 8Test Center (mil): 100Test Center (mm): 2.54Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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Elevated 2.67 (76.00) - 7.00 (198.00) High Performance Lead Free Probe

LFRE-72I-7

ECT

LFRE-72I-7 - ECT

Current Rating (Amps): 3Average Probe Resistance (mOhm): 15Test Center (mil): 50Test Center (mm): 1.27Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 500,000Overall Length (mil): 1,700Overall Length (mm): 43.18

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Light 0.83 (24.00) - 2.00 (57.00) High Performance Bias Ball Probe

POGO-1Z1-2-S

ECT

POGO-1Z1-2-S - ECT

Current Rating (Amps): 6Average Probe Resistance (mOhm): 10Test Center (mil): 75Test Center (mm): 1.91Full Travel (mil): 250Full Travel (mm): 6.35Recommended Travel (mil): 167Recommended Travel (mm): 4.24Mechanical Life (no of cycles): 1,000,000Overall Length (mil): 1,300Overall Length (mm): 33.02

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