Measuring Microscopes
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Microscopes
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Bruker's world-leading microscopy systems are helping scientists and engineers to make breakthrough discoveries and develop new applications and products that improve nearly all aspects of our world. Our microscopes enable scientists to explore life and materials at the molecular, cellular and microscopic levels.
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Scanning Electron Microscope
JSM-IT510
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Scanning electron microscopes (SEMs) are indispensable tools not only for research but also for quality assurance and manufacturing sites.At those scenes, the same observation processes need to be performed repeatedly and there has been a need to improve the efficiency of the process.
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Radiometer Spectral sensitivities precisely adapted to the measurement task
UVS-B-T
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Compared to the spectral response of the UVS-E, the UVS-B-T has a sharper cut-off at the transition from UV-B to UV-A. This feature reduces the UV-A contribution to the radiometer output and permits the highest possible correlation to atmospheric UV-B irradiance.
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Transmitters for Humidity Measurement
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Our humidity and temperature measurement transmitters with either an interchangeable probe input, or a fixed / integrated probe provide high precision measurements with analogue or digital outputs for process monitoring and control.
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Wafer Flatness Measurement System
FLA-200
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*Measures Thickness, TTV, Bow, Warp and site and global Flatness (ASTM compliance)*Measures all materials including Si, GaAs, Ge, InP, SiC*Full 500 micron thickness measurement range without re-*calibration2-D /3-D Mapping software
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Power Measurement And Calibration
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Portable, rugged and battery operated, Arbiter Systems® Power System Analyzers are revolutionizing measurements of instrumentation, relaying and metering circuits. Built with safety-first in mind, all products include multiple grounding technologies to protect against shock. Software and firmware is available to manage and analyze the data in real-time or post-analysis via computer.
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Temperature Measurement click board
Thermo J click
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Thermo J click is a temperature measurement click board™, which uses a thermocouple type-J probe, connected to a PPC-SMP-J onboard connector. The active part of the Thermo J click is MCP9600 by Microchip - a thermocouple EMF to temperature converter, with 1.5°C of maximum accuracy. The onboard PCC-SMP-J connector ensures the secure connection and accurate readings for the connected thermocouple.
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Product
ESR(EPR) Measurement System for Magnetic Property
esr05002061101-07
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This system is for the magnetic materials, especially the best for the research such as Spintoronics and Quantum dots technology. ･ It has the measurement sensitivity more than that of standard type X band ESR system, because it uses ferromagnetic resonance(FMR) .
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S-parameter Measurement System
DPS21
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Unlike a coaxial tube type or a wave guide tube type, this method does not make errors caused by air-gap as specimens are not put into a fixture. Practical data can be obtained even at the rough, uneven surfaces where the specimen is placed on.It enables compactness and measuring specimens by plane wave because of direct installment of lens with an antenna.It enables measurement by monitoring S21 and S11 parameter with connections of a test fixture to a vector network analyzer and PC.
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Spectroscopic Ellisopmeter for Simple Thin Film Measurement
Auto SE
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The Auto SE is a new thin film measurement tool that allows full automatic analysis of thin film samples with simple push button operation.Sample analysis takes only a few seconds and provides a complete report that fully describes the thin film stack – including film thicknesses, optical constants, surface roughness, and film inhomogeneities.
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Inside Diameter Measuring Tools
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Allows stable measurement of small-hole inside diameters with two or three contact points.
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Power Measurement
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Has the extensive measurement capabilities and unique features required to test today's sophisticated communications systems faster and more accurately.
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Product
3D Roughness Measurement System
IF-Profiler
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The If-Profiler is a handheld 3D roughness measurement system for high resolution measurement of surface finish. You measure roughness of flat and curved components with only one system. Measurements are performed both profile based (ISO 4287) and areal based (ISO 25178). The measurement system achieves flexible measurements and applications at high measurement speed. Various positions and measurement fields are traceably and intuitively measured. The IF-Profiler is also used to measure geometries with steep flanks and various coatings.
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Scattered Light Dust Measuring Devices
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The reliable way to detect low dust concentrationsLight scattering by dust particles is a measurement principle that allows even very low concentrations of dust to be detected. Depending on the system-specific requirements, either forward scattering or backward scattering can be used in this context. Both measurement principles return stable and reproducible measurement results, regardless of the gas velocity, humidity, or dust particle charges.
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Temperature Measurement IR Sensors & Detectors
DR34 Compensated
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A one-channel compensated thin-film thermopile in a TO-5 package. The active area and compensating element area are 3.16mm x 0.4mm each. Internal aperture minimizes channel-to-channel crosstalk and thus increasing sensitivity.
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Portable Measurement Solution
MOSS model
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Its pragmatic design means it is practical and simple to use, its adaptable multi-sensor functionality gives you the freedom to develop your own Marine Operation Survey and Monitoring solutions.Some basic examples are:Inclining experimentsFreeboard measurementSalvage survey and monitoringDry docking operationsField pressure testingAny field operations...
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Manual / Laboratory Measurement
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Without exception, PV industries around the world are closely connected to laboratories. This is hardly surprising since accurate and reliable measurement data are the key to effective R&D and quality control.
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Test & Measurement
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High-quality connection solutions for precise measuring, testing and examination. Whether low or medium voltage range, whether precise test runs or preventive measuring and testing: With an extensive portfolio of specific components and cables, Stäubli always ensures perfect and reliable contact between the measuring instrument and the points, objects and systems to be tested. In addition, we are a proven partner of leading manufacturers of measuring instruments in this field, for example for equipping them with high-quality sockets. Every product meets all quality and safety standards.
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Clamp type DC Current Sensor／for DC Leakage Current Measurements
DCZCT-110S
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MULTI MEASURING INSTRUMENTS Co., Ltd.
*Compact size, General purpose*DC leakage current measurements
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Level Measurement
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HighReach Measuring & Controlling System Co.,Ltd
The process of measuring the level of a liquid or solid material inside a vessel for monitoring and process control.
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Atomic Force Microscope
FlexAFM
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For success in research, scientists depend on professional tools that can readily provide the information needed, regardless of the tasks at hand.
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Product
Through Hole type DC Current Sensor／for DC Leakage Current Measurements
DCZCT-45NK
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MULTI MEASURING INSTRUMENTS Co., Ltd.
*DC earth fault measurement*DC leakage current measurement*Least affection from the magnetization of core and temperature fluctuation*Convenient ＋24V single polarity power supply
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Quick I/V Measurement Software For PXIe SMU
PX0109A
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The PX0109A is an essential and powerful software tool to control the PXIe Precision SMU which makes it easy to quickly setup and perform current-voltage (IV) measurements and to display the measurement data in tables and graphs without the need to program.
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Sag Measurement Instrument
DUMES
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F. W. Breithaupt & Sohn GmbH & Co.KG
*Mounting on the lattice mast*Adjustable angle elements with 5/8‘‘ tapped hole*Tubular level for levelling instrument*Three axis precision scope with wide angle eyepiece*Magnification 30-x*Made in Germany
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Modulation Measurement System
MMC
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This connector panel is used to bring test signals from the rear side of a rack up to the front side of the rack so that measurements can be made without climbing in behind the rack.
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Product
Phasor Measurement Unit Calibration System
6135A/PMUCAL
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The 6135A/PMUCAL system is the only fully automated and traceable PMU calibration system available today. It fully complies to the IEEE C37.118.1™-2011 and section 7 of IEEE C37.242:2013 standards for PMU operation and verification.
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Clamp type AC Current Sensor／for Low Leakage Current Measurements(ZCT Series)
ALCL-40D
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MULTI MEASURING INSTRUMENTS Co., Ltd.
*Best sensor for micro ampere current measurements.*Super high accurate sprit type ZCT sensor.*High sensitivity and least affection from external magnetic field. (less than 10μA for 400A nearby conductor)*For leakage current measurements of arrester.*Stable measurements under high electric field and strong magnetic field.
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3D Measurement
PSD-Array
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The PSD array consists of 16 parallel one-dimensional PSD elements on the same chip. By utilizing the triangulation technique the reflection of a laser line or multiple laser spots onto the PSD array will provide information about the contour of the illuminated object. The possibility for simultaneous readout of the 16 elements together with the fast response of each element makes the PSD array suitable for applications like high speed 3D contour measurements and measurements of parallel, moving objects such as cantilevers.
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Film Thickness Measurement
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Film thickness measurement can be measured using a number of different techniques depending on the thickness and number of layers. In its simplest form a simple measurement can be made of a single layer with a reflective lower surface using interference fringes. For more complex materials with multiple layers interference measurement is still made, but the mathematical deconvolution becomes increasingly important as does the refractive index of each layer.
