Showing results: 886 - 900 of 1060 items found.
-
imc Test & Measurement GmbH
Whether it’s in a vehicle, on a test stand or monitoring equipment and machinery - imc data acquisition systems are easy to operate and will help you become more productive and profitable. Our products are suited for work in mechanical and mechatronic applications. They handle up to 100 kHz per channel, are compatible with almost all signal sources and sensors, and can measure nearly all physical quantities such as pressure, force, speed, vibration, noise, temperature, voltage and current. The spectrum of imc data acquisition systems ranges from simple data acquisition via integrated real-time calculations, to the integration of models and complete automation of test stands.
-
DP7000 -
Guzik Technical Enterprises
The DP 7000 Digital Processor with 40/100G Ethernet or 169G Interlaken protocol compatible MPO/MTP® Optics, designed for evolving markets such as Real-Time Stream Processing for High-speed Data-acquisition (DAQ), High Performance Computing (HPC), Machine Learning, Data Center Infrastructure, AI Processing and Network applications. The board is 8U form factor, 322.25 mm x 280 mm x 6 HP (L x W x H), single slot AXIe or AdvancedTCA® blade, ideal for multi-slot 19″ rack mount system integration. In AXIe form factor it provides up-to Gen3 PCIe® backplane connectivity.
-
ScanDIMM -
Corelis, Inc.
Maximizing test coverage is an important piece in test procedure development. Unfortunately, not all designs have the necessary requirements in place to accommodate boundary-scan test methods on memory devices. ScanDIMM digital socket test modules are designed to overcome such limitations when testing DIMM sockets utilizing boundary-scan test techniques.ScanDIMM modules provide the capability to instantly turn any DIMM socket into a fully compliant IEEE-1149.1 device. Integration is as simple as assigning the included BSDL file to the reference designator of the target socket and compiling test vectors.In multi-socket systems, multiple ScanDIMM modules can be linked to provide even greater boundary-scan test depth.
-
326 -
STAR-Dundee
The SpaceWire Brick Mk3 is a USB 3.0 (also works with USB 2.0 and USB 1.1) to SpaceWire interface device that is suitable for use in all stages of SpaceWire equipment development: initial SpaceWire evaluation, instrument simulation, control system simulation, unit testing, integration support, and EGSE. The SpaceWire Brick Mk3 provides two SpaceWire interfaces, support for high speed data transfer, the capability to inject various types of errors on demand, the ability to transmit and receive time-codes and act as a time-code master, and comes complete with highly optimised host software for low latency transmission of SpaceWire packets directly to and from the host PC.
-
S930707B -
Keysight Technologies
S930707B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 70 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930707B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
S930700B -
Keysight Technologies
S930700B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 8.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930700B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
S930702B -
Keysight Technologies
S930702B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 26.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930702B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
S930705B -
Keysight Technologies
S930705B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 50 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
S930709B -
Keysight Technologies
S930709B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 90 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930709B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
S930701B -
Keysight Technologies
S930701B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 13.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930701B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
S930712B -
Keysight Technologies
S930712B enables fast and accurate active device modulation distortion characterization under modulated stimulus conditions up to 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S93072B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
S930704B -
Keysight Technologies
S930704B enables fast and accurate active-device modulation distortion characterization under modulated stimulus condition up to 43.5 GHz. The wide dynamic range and vector error correction of the PNA-X result in an extremely low residual EVM of the test setup, so you can get a complete picture of your device’s performance without test system interference. S930704B can measure EVM, NPR, ACPR, and can decompose nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
S930713B -
Keysight Technologies
S930713B enables fast and accurate active-device modulation distortion characterization under modulated stimulus conditions up to and beyond 125 GHz. The wide dynamic range and vector error correction of the PNA-X results in an extremely low residual EVM of the test setup, delivering you a complete picture of your device’s performance without test system interference. S930713B measures EVM, NPR, ACPR, and decomposes nonlinear signals and linear signals with the spectral correlation between input and output spectrum without doing demodulation. Integration with the PNA-X SCCM provides quick modulation distortion measurements while making other VNA measurements.
-
X1-1-RCH-116-4 -
Gigahertz-Optik GmbH
The X1-1 radiometer from Gigahertz-Optik features an RCH-116-4 detector and is ideal for measurement of the irradiance of high power LEDs in the UV-A and blue light range. The device can accurately measure irradiance levels of up to 40,000 mW/cm². One of the outstanding features of the RCH-116-4 detector is its proven concept of a passive radiation absorber coupled to a UV sensor. This provides stability even in high temperature and intense UV radiation environments. In addition to the passive radiation absorber, the device also has a cosine-corrected field of view. The sensor’s housing also serves as a handle. The battery-powered X1-1 optometer supports a usable dynamic range from less than 1 mW/cm² to 40,000 mW/cm² thanks to its high-end signal amplifier. It can be used to perform precise measurements of up to 5 standard LED wavelengths for which the detector was calibrated for active irradiance. In addition to the CW measurement function, the device also has a dose measurement function. The radiometer can be used with other detectors from the RCH series. e.g. for gas discharge lamps. Remote control of the device is possible via its user software and a software development kit is offered for integration of the device in the user’s own software.
-
Model 6350S -
Pentek, Inc.
- Now available in RFSoC Gen 3 with the Model 6353S- Small form factor rugged enclosure- Conduction-cooled- Ideal for integration into custom enclosures- Incorporates Xilinx® Zynq® UltraScale+™ RFSoC- 16 GB of DDR4 SDRAM- Navigator® BSP for software development- Navigator® FDK for custom IP development- Pentek's Quartz Family of Xilinx Zynq UltraScale+ RFSoC FPGA Products Video- Live Signal Acquisition Video: Quartz Model 5950 and Model 6001 RFSoC boards- Pipeline Newsletter: Strategies for Deploying Xilinx's Zync UltraScale+ RFSoC- Please refer to the product datasheet for Installed FPGA IP Module details