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Showing results: 3181 - 3195 of 3407 items found.

  • Clock Drivers

    Pulse Instruments

    Multiple timing signals ("clocks") are required by CCDs, IR FPAs, and some CMOS image sensors to transport electrical charge across the array to a sense amplifier for conversion into image data. Pulse Instruments offers a line of "clock drivers" for generating these timing signals. The parameters of these clocks (clock rate, pulse width, pulse amplitude, rise- and fall-times, etc.) greatly influence the behavior and performance of the imaging device. Our products take logic-level inputs from a pattern generator and allow the user to adjust the output parameters to suit their device and testing requirements. Clocks can be "tweaked" in real-time to determine optimal operating parameters for a particular device, or else programmed in accordance with a test plan for automated production test.

  • PC Based Comprehensive Test Setup for Luminaires

    SCR ELEKTRONIKS

    Our zest for innovation has resulted in continuous upgrades in the existing line of products. Till now we used to manufacture 3 different equipments for Driver, MCPCB and Luminaires Component testing. We at SCR Elektroniks have developed our comprehensive tester to incorporate all the 3 systems in a single bench. Here in this tester one can test all the three DUT in a single bench. Since all the 3 testing procedures have many tests in common, we have incorporated all the tests in a single bench such that testing of Luminaire driver, Luminaire PCB and Final Luminaire set is performed in single test bench. Only these tests are performed over the DUT else other are disabled for them.

  • [5kV AC] Hipot Tester, Rise/Fall-Time Control Function Equipped

    TOS5200 - Kikusui Electronics Corp.

    TOS5200 is designed for AC Hipot Test with 500 VA capacity and 200 mA short circuit current output capability. Equipped with the PWM amplifier, the TOS5200 can provide a stable & reliable output without being affected by ACpower line. Therefore, it is a perfect solution for electronic equipment or devices complied to IEC, EN, UL, VDE andJIS etc. requirement.As TOS5200 covers most of features of our upper class model for AC Hipot Test, it achieves thesuperb cost / performance ratio for those who need 200 VA or 500 VA capacity, or both. Also, as it equips the Interlockfunction together with other safety features, operator can carry out the test with higher current value in safe.

  • Power Supply Testers

    Qmax Test Technologies Pvt. Ltd.

    Power Supply Tester is an integrated package of hardware such as AC/DC Power Sources, DC Loads, Noise Measurement Unit, and DMM etc configured as per user applications, which makes it suitable for testing wide range of Power Supplies and provide economic solution for testing AC/ DC and DC/DC power supplies and converters. The Power Supply Boards that passed in the first level of screening for Go-No Go tests will undergo a second level testing. The second level of testing measures all the key parameters of the power supply such as line regulation, load regulation, efficiency etc and check whether the results are within the mentioned limit, if not declare the UUT (Power Supply Board Under Test) as a failed one.

  • Broadband Power Amplifier

    Panda Microwave Limited

    Panda Microwave design, manufacture, and support a wide variety of Power Amplifier. RF amplifiers product line from Panda Microwave consists of low noise amplifiers, Power Amplifier Module and Solid State High Power Amplifier. Our Power amplifiers cover frequency range from 100MHz to 50GHz and used Thin-film Technology. Our low noise amplifiers have superior noise figure numbers and a variety of models. Gain block low noise amplifiers provide all around gain where noise is not critical. High power amplifiers system equipment is available with either manual or digital control interfaces, power capacities up to 100W pulse power.

  • MicroLite USB Data Loggers

    Fourier Systems

    The family of MicroLite USB data loggers includes six models covering temperature, humidity, current and voltage measurements, providing the ideal solution for a wide range of industrial applications. Combining innovation with simplicity, the MicroLite product line offers cost effective logging, with rich functionality in a compact design, direct USB connection, multi-trip usage, and high measurement accuracy and resolution. Real-time sensor readings with a corresponding time stamp are clearly displayed on the logger’s LCD screen, incorporating alarm thresholds. The logger is designed for low power consumption to extend battery life and reduce the time between battery replacements. The comprehensive MicroLite range allows you to select the device most appropriate to your mission-critical application.

  • PXI-6723, 13-Bit, 32-Channel, 800 kS/s PXI Analog Output Module

    778998-01 - NI

    13-Bit, 32-Channel, 800 kS/s PXI Analog Output Module—The PXI‑6723 delivers low-cost, high-density analog outputs to meet a wide range of applications, such as stimulus-response, signal simulation, waveform generation, and actuator stimulation. In addition, the device provides eight 5 V TTL/CMOS digital I/O lines; two 24‑bit, 20 MHz counter/timers; and digital triggering and external clocking capabilities. The PXI‑6723 can replace several kinds of instruments, including stand-alone proportional integral derivative (PID) controllers, low-speed arbitrary waveform generators, and function generators. You can control each data point for each channel to define common waveforms, such as square, sine, or sawtooth, as well as complex waveforms.

  • Imbedded A5 Processor Test Interface

    Advanced Microtechnology, Inc.

    Advanced Microtechnology has extended the application of its Optimum product line with theintegration of ARC5 imbedded test functions. Up to 40 controllers may be independently powered and monitored for functionality using the process test interface of the Optimum WinAOS application. Each part may have 2 separate biases featuring both current and voltage monitoring. Independent test is implemented through a standard JTAG interface. A separate serial clock and command interface may be used if required to provide device initialization sequences. JTAG control is muxed to each part through the use of an independent clock for each part. All of the ARC processor registers and memory space may be tested through the JTAG I/O.

  • Analogue (1kV below) Insulation Tester

    2132 IN - Standard Electric Works Co., Ltd

    ● High quality Taut Band movement.● Three insulation test voltages(DC) : 250V, 500V, 1000V.● Two continuity test on low ohms : 3Ω & 500Ω.● Compact and lightweight.● 200mA continuity short circuit current.● 1mA test current on insulation test at nominal voltage.● Automatic discharge of capacitive and inductive circuit with charge stored in the circuit under test. ● Live warning and display or external voltage presence.● Fuse, air gap, crowbar and overload protected.● On line battery monitoring shows if battery is ok.● Manual zero ohm adjustment.● Low battery consumption.● Mirror scale.● Push and turn locking switch for continuous and hand free testing.● BS 16 edition.

  • Analogue (1kV below) Insulation Tester

    1832 IN - Standard Electric Works Co., Ltd

    ● High quality Taut Band movement.● Three insulation test voltages(DC) : 250V, 500V, 1000V.● Two continuity test on low ohms : 3Ω & 500Ω.● Compact and lightweight.● 200mA continuity short circuit current.● 1mA test current on insulation test at nominal voltage.● Automatic discharge of capacitive and inductive circuit with charge stored in the circuit under test.● Live warning and display or external voltage presence.● Fuse, air gap, crowbar and overload protected.● On line battery monitoring shows if battery is ok.● Manual zero ohm adjustment.● Low battery consumption.● Mirror scale.● Push and turn locking switch for continuous and hand free testing.● BS 16 edition.

  • Low pin and internal configurable analog MCU

    RL78/G11 - Renesas Electronics Corp.

    The RL78/G11 microcontroller line-up concept is based on small packages like 20 to 25pin, in small 16KB flash memory and rich analog peripherals such as A/D converters, D/A converters, comparators and PGA and these are configurable as PGA+ADC+VBGR, PGA+CMP, CMP+DAC/VBGR, or PGA+CMP+DAC/VBGR. Using the smart features like DTC and ELC a lot of peripherals can be connected internally to reduce CPU workload and can save overall power consumption. It also supports very low power operation (100 uA @ 1 MHz ) and a high speed 4µs wake up. Available in small 3x3mm² WFLGA , 4x4mm² HWQFN and standard 20pin LSSOP, this MCU line is suitable for sensor application, Lighting/power sources and many small appliances.

  • Pulse AC Method Area Ionizers

    ER-X Series - Panasonic Industrial Devices Sales Company of America

    The ER-X Series Area Ionizers utilize the pulse AC ionization design to achieve high-speed charge removal of wide surface areas for high-volume production lines. In addition to supporting compressed air ionization, the ER-X also features both airless and low-pressure ionization modes for applications where tiny workpieces can be easily blown away. Additional features include automatic ion balance and discharge frequency control (manual control is also possible), flat discharge surface for easy cleaning, discharge needle air barrier design to reduce contamination of the needles, replaceable discharge needle unit for easy maintenance, and a dual head configuration for enhanced charge area and layout (2 different ionizer heads can be connected to a single controller).

  • 5KV Digital Insulation Tester

    Neutronics Manufacturing Co.

    *Display : 75 X 35 min Backlit LCD with Annunciator*Max. Reading : 1999 Counts *Over the limited range indicator : LCD show "1'*Power supply : Six AA batteries to supply the power, OR 2300, 50Hz AC*Lou voltage indicator :The symbol lft appea.*Power consumption : Static Short circuit current : >2mA (250V-1000V), >1mA (2500V)*Work condition : Temperature 0°C - 40°C, relative humidity: 30%-85% RIO*Storage condition : -10°C - 40°C, relative humidity Dimmenslon : 95x148x85mm*Weight : Approx. 850g (induding battenes)*Accessories : Manuai, one pair of test lines, one pair of crocodile clips. six battenes, Mains Adaptor

  • Air Data Test Set

    ADTS-2000 - TestVonics, Inc.

    TestVonics ADTS-2000 Test Set is a portable, high precision, dual channel air data pitot static test system. This tester is designed to calibrate, test and troubleshoot air data instrumentation and aircraft pitot-static systems. The ADTS-2000 meets all requirements of the KTS-2000 , P/N: 18910920000, P/N: 18910920001, P/N: 18910920002, or having NSN: 4920-01-588-4428 and NSN: 4920-01-554-4549 . The test set has been designed with functional and reliability features highly suited to withstand the harsh environmental and demanding conditions of the flight line environment. The test set is designed for testing a wide range of commercial and military aircraft, both rotary and fixed wing. The ADTS-2000 accuracy complies with standards for RVSM and is designed to replace the TTU-205 test set.

  • In-Process Test OTDR

    8000i - Photon Kinetics

    The 8000i In-Process Test OTDR is the most recent addition to Photon Kinetics' family of innovative solutions for optical fiber cable testing. The 8000i's "cable test optimization" provides the balance of OTDR dynamic range and dead zone performance that's proven to be most effective for accurate characterization of typical fiber cable lengths. Dynamic range has been maximized to reduce measurement time, while resolution has been tuned to ensure that typical cabled fiber defects are detected. The 8000i delivers this optimized measurement capability at a more economical price than our full featured, final QC 8000 OTDR, which makes it a perfect fit for "in-process" testing on ribbonizing or loose tube production lines.

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