Showing results: 3106 - 3120 of 3349 items found.
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40-320-101 -
Pickering Interfaces Ltd.
The 40-310/320 Range of High Voltage Switching Modules will hot switch up to 750V peak and cold switch up to 1000V peak in either general purpose relay (40-310) or multiplexer (40-320) configurations. These modules contain high-quality reed relays with switching ratings comfortably higher than the 40-310/320 specification. Applications for the 40-310/320 series modules include; circuit board isolation testing, relay testing, semiconductor breakdown monitoring and cable harness insulation testing.
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Smiths Interconnect
Spring probes are designed to optimize performance in high reliability, multicycle applications. Smiths Interconnect's spring probes, featuring IDI contact technology, are compliant which makes them ideal for blind mate applications as they self correct for x, y, z, rotational and angular misalignment of the target. Offered in compressed heights less than 2 mm and utilized on pitches as tight as 0.4 mm, they are well suited for high density, board-to-board, battery contact and high frequency applications.
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igentic® 421t -
Sterner Automation Limited
Electronics customers require greater test flexibility to address the growing trend towards high-mix, low-volume printed circuit board (PCB) production. Sterner Automation is pleased to introduce the igentic® 421t, the next generation of automated test solution specially engineered to address these challenges. The igentic® 421t provides the flexibility, reliability and efficiency needed in one standard platform, allowing our customers to test multiple PCB's and significantly reduce individual product testing costs.
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SKU-015-01-PCIe -
Amfeltec Corp.
PCI Express Backplane was designed to support a variety of modern PCI Express board’s production testing and debugging. The backplane expands the Host computer into four x16 PCI Express slots via 10 ft. CAT7 data and 10-pin flat Power control cables. PCI Express Backplane and UUTs (unit under test – add-in PCI Express board) are powered by a standard ATX power supply connected to the backplane via 24 and 8 pin power connectors located on the backplane.
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OP-SB85L -
LINEEYE Co., Ltd.
OP-SB85L is the interface expansion kit that has a port to measure TTL / CMOS signal level communications, and the one to measure the voltage of high-speed analog input. The port for TTL / CMOS supports the measurement of TTL / CMOS level communications that power supply system is from 1.8V to 5V. It is suitable for monitoring the communication between the LSI and the interface IC on the printed circuit board by directly probing into the lines. It supports the protocol of not only UART and HDLC but also I2C and SPI on monitoring and simulating.
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Macom Technology Solutions Holdings Inc.
MACOM’s High-Power Switch and Bias modules are extensively used in 4G and 5G TDD base stations as well as aerospace and defense applications. The PIN Diode Switch features high power handling, low insertion loss, and super board band performance. The integrated bias controller utilizes a boost circuit and provide the driver circuitry to the switch. The modules require only a single 5 V supply, and a single TX / RX control signal which greatly reduced the customer design complexity.
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CAEN S.p.A.
VME solutions are an integral part of CAEN’s design history. CAEN VME solutions for Data Acquisition and Front End applications have been part of were first developed decades ago. These solutions have been upgraded and modernized multiple times, and were recently joined by CAEN VME programmable High Voltage Boards. Thanks to the innovative GECO2020 Control Software, and the multi-master capability of CAEN VME Bridges, it is now possible to accommodate and independently control an integrated VME DAQ/HV System.
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MS121 -
MSG Equipment
MS121 is a professional tester, a multifunctional device which successfully combines two functions: testing of electromagnetic clutches and control valves of vehicle air conditioners. Thanks to the color 4.3" TFT display and convenient menu, the device is user-friendly and possesses high-accuracy measurements. Testing can be performed either separately on the compressor or directly on the car. The tester has a metal case and is resistant to the effects of lubricants. The original topology of the tester board increases its reliability, the color marking of the diagnostic contacts minimizes the possibility of incorrect connection.
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MX63 / MX63L -
Olympus Corp.
The MX63 and MX63L microscope systems are optimized for high-quality inspections of wafers as large as 300 mm, flat panel displays, circuit boards, and other large samples. Their modular design enables you to choose the components you need to tailor the system to your application. These ergonomic and user-friendly microscopes help increase throughput while keeping inspectors comfortable while they do their work. Combined with OLYMPUS Stream image analysis software, your entire workflow, from observation to report creation, can be simplified.
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SI-C667xDSP -
Sheldon Instruments
Sheldon Instruments offers a complete portfolio of hardware products for a wide spectrum of real time applications in measurement and digital control systems. Our hardware range includes carrier boards that combine DSPs and FPGAs for various PCI/PCIExpress form factors such as slotted/desktop PCI/PCIe, PCI-104/PCIe-104, PMC/XMC, CompactPCI, as well as stand-alone embedded solutions. The DSP-FPGA carrier hardware is complemented by high performance analog and digital I/O modules as well as all necessary accessories like cables and terminal blocks.
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ITC57300 -
Integrated Technology Corp.
The ITC57300 Dynamic Parametric Test System mainframe accepts Test Heads that perform nondestructive transient measurements on semiconductor devices such as Insulated Gate Bipolar Transistors (IGBT), power MOSFETs, diodes, and other bipolar devices(requires additional optional bias power supplies and custom personality boards). Included in the mainframe are all test equipment and software necessary to analyze and perform resistive and inductive switching time, switching losses, gate charge, Trr/Qrr, and other transient tests.
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Xeltek Inc.
Xeltek in-system programming tools provide a convenient method for configuring microcontrollers and various serial devices. Users could simply program microcontrollers, Flash memories, PLDs, and FPGAs via the ISP cable. Devices are programmed in the target system or target hardware, making field applications more convenient than ever. Typically, a jumper/DIP switch enables in-system programming and a set of serial programming connector (such as an IDC connector) connects the target board(s) to the ISP programmer(s).
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TS8997 -
Rohde & Schwarz GmbH & Co. KG
The R&S®OSP-B157W8 PLUS 7.5 GHz module with up to eight channels is the core of the system and uses a printed RF switch board in solid-state relay (SSR) architecture. It allows flexible operation of the connected DUT (up to eight ports) for power measurements, signal conditioning via the integrated attenuators, couplers and combiners, RF switching to the measuring instruments in combination with the R&S®OSP-B157WX up to 40 GHz and is controlled by R&S®WMS32 software.
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JT 2149/DAF -
JTAG Technologies Inc.
The JT 2149/DAF is a compact, mixed-signal (Digital/Analog/Frequency) measurement module for use in JTAG Technologies’ widely-used JT 2147 (QuadPod) signal conditioning interface. The DAF module has been designed to replace a regular TAP Pod and provides 28 measurement channels plus a clock generator. When connected to a circuit board via edge connector or test fixture/jig test pins, the module enhances standard digital boundary-scan tests by enabling a series of analog and frequency measurements to be made.
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JTAG Technologies Inc.
Want to improve the overall test coverage of your assembled boards? It’s easy. Simply combine or integrate your JTAG Technologies boundary-scan tools with your existing automatic test equipment (ATE). We work with any vendor of in-circuit testers (ICT), flying probes (FPT) or functional testers (FT).We offer solutions for most of the available automatic test equipment systems, in addition we can support you with customized integrations for your existing automatic test equipment (ATE).
