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Atomic Force Microscope
HDM Series
The task of identifying nanoscale defects is a very time consuming process for engineers working with media and flat substrates. Park NX-HDM is an atomic force microscopy system that speeds up the defect review process by an order of magnitude through automated defect identification, scanning and analysis. Park NX-HDM links directly with a wide range of optical inspection tools, thus significantly increasing the automatic defect review throughput. In addition, Park NX-HDM provides accurate sub-a...show more -
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2 Channel IV Analyzer / Source Monitor Unit
E5263A
Keysight E5262A and E5263A 2ch IV Analyzers are the low cost solution for current-voltage characterization. The E5262A and E5263A support two channels of SMUs (Source/Monitor Units) for voltage/current sourcing and voltage/current measurement with the best in the class current measurement performance as low as 5 pA. The Easy EXPERT group+ GUI based characterization software is furnished and available on your PC to support all the tasks required in the characterization from the measurement setup ...show more -
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PXIe-5122, 100 MHz, 100 MS/s, 14-Bit PXI Oscilloscope
779967-03
PXIe, 100 MHz, 100 MS/s, 14-Bit PXI Oscilloscope—The PXIe‑5122 high-resolution PXI oscilloscope has two channels with greater than 75 dBc spurious‑free dynamic range (SFDR) and flexible settings for coupling, impedance, voltage range, and filtering. PXI oscilloscopes also feature a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. This device is ideal for both time-domain and frequency-domain applications that require high-resolution, low-noise measurements with up to 100 MS/s and 100 MHz of analog bandwidth. The PXIe‑5122 also features advanced PXI synchronization and data streaming capabilities.
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Universal Software Solution
ArtemiS Suite
ArtemiS SUITE is a universal software solution that allows you to perform virtually any task in the area of sound and vibration analysis.
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GCMS-QP2010 Series Workstation Optional Software
Compound Composer Database Software
"Compound Composer Database Software for Simultaneous Analysis" is an optional software of Workstation "GCMSsolution" for GCMS-QP2020 Series, GCMS-QP2010 Series. * This system was jointly developed by Shimadzu and Kitakyushu City Institute of Environmental Sciences in Japan.
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Thermal Analysis
Thermal Analysis is important to a wide variety of industries, including polymers, composites, pharmaceuticals, foods, petroleum, inorganic and organic chemicals, and many others. These instruments typically measure heat flow, weight loss, dimension change, or mechanical properties as a function of temperature. Properties characterized include melting, crystallization, glass transitions, cross-linking, oxidation, decomposition, volatilization, coefficient of thermal expansion, and modulus. These experiments allow the user to examine end-use performance, composition, processing, stability, and molecular structure and mobility.
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Barometers
Ideal for recording ambient changes in lab, monitoring conditions affecting sample analysis, and assisting in prediction of weather changesUnit includes a barometer, thermometer, clock, altitude adjustment, and weather symbol forecasting symbolsAdjustable altitude compensation from –900 to 3600 feet (–300 to 1200 meters)Barometric trend shows current reading, previous 1, 3, 6, and 12-hour readings in bar chart f
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Condition Monitoring Solutions
VibroLine
The VibroLine devices are stationary analysis modules for continuous condition monitoring on machines and systems. The VibroLine condition monitoring system can be used to monitor vibration acceleration, speed or displacement with freely adjustable frequency filtering for different applications. Permanent vibration monitoring of your machines not only brings competitive advantages through the increased efficiency of your systems, but also protects against unwanted machine failures. With the Vibr...show more -
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Advanced Measurement Package For M8000 Series Of BERT Test Solutions
M8070ADVB
The M8070B system software for the M8000 Series of BER Test Solutions can be enhanced by additional software packages, such as M8070ADVB or M8070EDAB to get the best out of the M8040A, M8020A and M8030A J-BERT platforms.The M8070ADVB Advanced Measurement package offers advanced features like automated jitter tolerance test and parameter sweeps, eye diagram measurement or the integration of external equipment such as electrical and optical clock recovery or error analysis using a real-time scope.
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Easycheck Fiber Endface Inspector
CA3002
The integrated style design makes the size compact and operation easy. You are no longer to worry about so many cables between monitor and microscope, greatly saving the time for operation and worktable space, thus creating more productivity. Easycheck have a series different model according to different application, it has photo capture function; for transceiver checking; X、Y adjustable; image auto analysis and judgement, etc. The user can choose the desired model per the requirement.
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High Resolution Fiber Grating Sensor Interrogation System
GM8037
UC INSTRUMENTS’ GM8037 portable high resolution fiber grating sensor instrument is ahigh power with high accuracy and wide dynamic range for fiber Bragg grating (FBG)sensors, and compact PC-based interrogation system, and is also a high accurate opticalspectral analysis system. It includes an external device, PC-based application software andoptional high performance laptop.
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Process Percent Oxygen Analyzer
Model 3000PA
Teledyne Analytical Instruments
The Model 3000PA brings percent oxygen analysis to new heights of precision. Using advanced microprocessor technology, this model makes the task of percent oxygen analysis easier, faster and more accurate than ever before. Simple menu choices, membrane command switches and a large LED display make setup and operation clear and quick.
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DR software, for use with CT100 Series TDRs
CT Viewer™
CT Viewer™ is a full-featured TDR waveform analysis software package for Microsoft® Windows® XP / Vista PCs that lets you archive, manipulate, analyze, and compare TDR data acquired with CT100 Series Automated Metallic TDRs or any other TDR instrument, now with live internet streaming and remote control of CT100 Series TDRs. CT Viewer™ is included with CT100 Series TDRs. Read on to discover how CT Viewer™ will change the way you test cables.
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PCI-5922, 24-Bit, Flexible Resolution PCI Oscilloscope Device
779659-03
24-Bit, Flexible Resolution PCI Oscilloscope Device - The PCI‑5922 high resolution oscilloscope device features a flexible measurement resolution range up to 24 bits and up to 15 MS/s rates. This oscilloscope device has flexible settings for coupling, and voltage range, as well as a number of triggering modes, deep onboard memory, and an instrument driver that includes data streaming and analysis functions. The PCI‑5922 is capable of taking extremely resolute and accurate analog measurements. It is ideal for audio signals, spectrum analysis, and any other small, accurate signal measurements.
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Detailed Stereo Image Analysis with 3D Visualization
StereoScope Pro
StereoScope Pro is a real time stereo field analyzer with multiple views and MIDI/automation output capabilities. It is a powerful help to analyze how the audio signal is spread in the stereo field, and you can easily detect potential phase and mono compatibilities issues.
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Application Specific LC Systems
UF-Amino Station
Two major problems exist with traditional amino acid analysis techniques. The first technique (ion-exchange chromatography with postcolumn derivatization) allows many components to be analyzed at once but the method run times are long. The second technique (reverse-phase HPLC with pre-column derivatization) enables faster analysis but the number of analyzed components is limited. As a result, chemists are forced to make a decision to either analyze a large number of components or have a fast method.
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Continuous Particulate Monitor with X-ray Fluorescence
PX-375
There has been a growing concern regarding particulate matter (PM) pollution and its effects on health. For effective preventative measures, the determination of source PM concentration is extremely important. Therefore, indication of PM and elemental concentrations is critical. The PX-375 analyzer employs automatic sampling, continuous on-line PM quantitative and qualitative analysis for rapid air pollution measurements.
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Battery Test Packages
Explorer Technology Group (ETG)
ETG offers a full range of battery test kits which speed and simplify the process of collecting battery test data . This data can then be downloaded and analyzed with the included Winmeter 5.1 Battery Analysis Software, enabling the user to quickly identify batteries that are likely to require preventative maintenance.
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VB-8034, 4-Channel, 350 MHz Bandwidth VirtualBench All-in-One Instrument
784343-01
4-Channel, 350 MHz Bandwidth VirtualBench All-in-One Instrument—The VB‑8034 combines a four‑channel, 350 MHz mixed-signal oscilloscope with protocol analysis, an arbitrary waveform generator, a digital multimeter, a programmable DC power supply, and digital I/O into a single device that integrates with your PC or iPad. The VirtualBench all‑in‑one instrument is simple and convenient and results in more efficient circuit design, debugging, and validation. The included software provides an interact...show more -
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Zero-footprint Coverage Analysis For Critical Software
RapiCoverZero
*Collect coverage from systems that produce branch traces*Save time with efficient merge and mark verification workflow*Simplify verification through integration with your CI tool*Collect coverage for libraries without source code
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Telecommunication Analysis
Software-Defined WAN for the Enterprise Securely connect users and applications while radically reducing hardware.
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Device Parameter Analysis
bsw TestSystems & Consulting AG
The complexity of DC Parametric Characterisations has significantly increased with the level of miniaturisation in the semiconductor industry. The demand is not only on the precision of the measurements. New measurement methods have emerged to gain insight into phenomena previously unknown or only of marginal relevance. One example is "Pulsed IV" which is now widely in use. The modular concept of the Keysight B1500A allows users to tailor their instrument exactly to their needs. Flexible upgrade...show more -
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PH350 Waterproof Single-Channel pH and ORP Smart Handheld Meter Kit
Get easy-to-read and accurate readings with auto-hold, auto-stable, and real-time measurements with stability indicators. The Environmental Express® Oakton® 300 series multiparameter meters utilize smart sensor technology with sensor heads that feature a built-in digital circuit for automatic sensor recognition. Sensor information including sensor ID, calibration data, and measurement setup is stored in sensor head and viewable on the meter display when sensor is connected. Sensor heads are eas...show more -
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System to Handle Wafer Levels
AMI AW Series
Operator-Free Wafer Inspection, Analysis and Sorting The AW Series are advanced high-capacity, high throughput automated wafer C-SAM® instruments specialized to deliver maximum sensitivity for the evaluation of wafer and device level applications.
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JTAG (and IJTAG) Environment Tool Suite
SAJE
SAJE is the SiliconAid Suite of JTAG related standards focused tools for chip development, verification, validation and patterns generation of ATE, Board, and System Test. Each tool can be used as a point tool by itself to compliment other tools in your flow. However, the SAJE Tool Suite used together in a flow can provide a total solution that also leveraging previous steps for debug and analysis.
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Temperature Controlled Microscope Stage
Linkham Scientific Instruments
Specialists in temperature controlled microscopy, Linkam Scientific Instruments, announce the launch of their Optical DSC450 which enables simultaneous visualization of thermal processes for improved materials characterisation. The Optical DSC450 enables the user to measure glass transitions and melting behaviour of a wide range of substances whilst accurately controlling temperature from -196 °C to 450 °C. The atmosphere of the stage can also be purged with gas as required by the user. A new fe...show more -
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AC Magnetic Measuring Equipment
Is used for measurement analysis of magnetic characteristics in high frequency by commercial frequency of soft material sample
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Camera Endpoint Monitor based on Real Time Laser Interferometry
LEM Series
Our Real Time Interferometric Process Monitor provides high precision detection of film thickness and trench depth during the etching/deposition process.Depending on applications, LEM camera includes a 670 or 905 or 980 nm laser and when mounted on any dry etch/deposition process chamber with a direct top view of the wafer this generates a small laser spot on the sample surface.Interference occurs when monochromatic light hits the sample surface, resulting in different optical path lengths due t...show more -
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SignalScope Pro for iOS
SignalScope Pro
SignalScope Pro for iOS devices is a real-time analysis toolset, suitable for use in areas such as acoustics, audio, electronics, and vibration. SignalScope Pro includes 4 tools for dynamic signal analysis, as well as a signal generator for producing test signals. See YouTube for video demos.SignalScope Pro also turns your iOS device into a platform for data acquisition, storing acquired data in CSV or TXT files, MAT-files, or PDF or JPEG images for later retrieval from your device.
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200 MS/sec RF/IF Rugged Portable Recorder
Talon RTR 2726A
- Designed to operate under conditions of shock and vibration- Portable system measuring 16.0" W x 6.9" D x 13.0" H- Lightweight: just less than 30 pounds- Shock-and-vibration resistant SSDs perform well in vehicles, ships and aircraft- 200 MHz 16-bit A/Ds- 800 MHz 16-bit D/As- 80 MHz record and playback signal bandwidths- Recording & playback of IF signals up to 700 MHz- Real-time sustained recording rates of up to 3.2 GB/sec- Windows® workstation with high-performance Intel® processor- Up ...show more
