Showing results: 1351 - 1365 of 3728 items found.
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Verix PhyCDC -
Real Intent, Inc.
Verix PhyCDC is the only solution that delivers precise netlist CDC sign-off including glitch checking. RTL CDC sign-off assumptions may become invalid because of logic synthesis and power optimizations. Verix PhyCDC performs comprehensive structural and functional analysis to ensure that signals crossing asynchronous clock domains are CDC-safe at the gate level. Complementing Real Intent’s Verix CDC solution that provides comprehensive analysis for RTL sign-off, Verix PhyCDC delivers the most advanced netlist sign-off for giga-gate designs.
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XEPOS -
SPECTRO Analytical Instruments GmbH
The new SPECTRO XEPOS spectrometer represents a quantum leap in energy dispersive X-ray fluorescence technology. It provides breakthrough advances in multi-elemental analysis of major, minor, and trace element concentrations. New developments in excitation and detection deliver outstanding sensitivity and detection limits yielding remarkable gains in precision and accuracy. The amazing SPECTRO XEPOS excels at critical tasks from rapid screening analysis to precise product quality control. Apply it for at-line processing in a variety of industries, for geology and mining, for environmental and waste monitoring, and for research and academia.
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MPI Photonics Automation
Since 2008, MPI’s LED tester has provided optical and electrical measurements. With mass production experience, tester functions include flexible recipe management, accurate calibration, and statistical analysis. Flexible configurations allow the customer to choose test equipment configurations from the spectrum meter, photo detector and source measurement unit in accordance with your specific requirements. With accurate controlling of each instrument and intelligent data analysis, our testers offer the most accurate measurement result for a wide variety of optical devices.
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AD-3651 -
A&D Company, Ltd.
Noise & vibration analyzer, from in-vehicle order tracking to MIMO analysis. Compact WCA for analysis of noise and vibration for in-vehicle order tracking analysis.The long time experience and know-how of A&D in the automobile field of instrumentation and listening to user suggestions are what gives the A&D model the lead with its unmatched specification and functions. Best of all is its compact size and light weight. At the same time, all the functions you would expect to find in multi channel noise and vibration analyzers are included, plus more enhanced features.
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781 MCA Family -
CAEN S.p.A.
The 781 MCA family integrates advanced firmware algorithms operating Digital Pulse Processing for Pulse Height Analysis (PHA). The processing algorithms can be easily adapted to different detectors and application ensuring effective data analysis even at high count rates. It provides advanced tools for configuring baseline restoration and pile-up rejection. Thanks to the multiple input simultaneous acquisition, the module is able to manage coincidence and anti-coincidence logic between detectors, allowing the user, for example, to easily take advantage of background rejection or anti-Compton techniques.
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VICAM
Aflatoxins, Fumonisins, Vomitoxin (DON), Ochratoxin A, Zearalenone, Nivalenol, T-2 and HT-2 are the primary targets for mycotoxin analysis for food and agricultural analytical testing laboratories. Global awareness, prevention based initiatives and strict regulatory limits require a deeper understanding of both the occurrence and contamination levels present in our raw materials, processes and finished product value streams. Simultaneous sample prep enables more efficient use of laboratory resources while reducing time to result for up to 13 mycotoxins in a single LC or LC/MS/MS analysis.
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KLA-Tencor Corp
KLA’s data analytics systems centralize and analyze the data produced by inspection, metrology and process systems. Using advanced data analysis, modeling and visualization capabilities, our comprehensive suite of data analytics products support applications such as run-time process control, defect excursion identification, wafer and reticle dispositioning, scanner and process corrections, and defect classification. By providing chip and wafer manufacturers with relevant root cause information, our data management and analysis systems accelerate yield learning rates and reduce production risk.
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AP-G Series -
Applied Image, Inc.
Ensuring precise motion and positional accuracy is critical for a number of video analysis systems and automated measuring instruments. The AP-G series is ideally suited for calibrating such elements, in addition to its uses in determining stage squareness, and travel distance image analysis and visual inspection systems where precise motion must be calibrated and measured. All AP-G targets have number/letter indexed columns and rows for easy calibration and are offered on four standard materials; Glass (CG) Opal (OP) Photopaper (RM) and Film (TM).
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Series 7 -
GOM GmbH
The ATOS ScanBox Series 7 is mainly used in car manufacturing, in try-out toolmaking and in press shops. The optical 3D measuring system performs complete analysis measurements for comparison in the introductory phase or is used for quality control in production. Large parts such as automobile side panels and attached parts of up to 6 m in size can be measured. The full- field measuring data enable the analysis of hole pattern, trimming and character lines. Even heavy and large parts for other applications can be measured and inspected with the ATOS ScanBox Series 7.
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SCL-3412 -
Shoghi Communications Ltd.
C/Ku Satellite Monitoring System (SCL-3412) is designed to intercept International/national telecom carriers, GSM A/Abis links and IP Carriers over satellite which are using C, Ku, X or Ka-Band. In order to reduce the manual effort and time consumed in the analysis of the carriers, system is integrated with Satellite Carrier Analysis module, which automatically performs the scanning on the selected spectrum and provide the list of carriers along with their payload type (i.e DCME, GSM or IP) and characteristics parameters. This provides great help to take decision for monitoring of the carriers of interest.
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Brüel & Kjær Sound & Vibration A/S
Sonoscout is a system that uses an app on an iPad to control a wireless data acquisition unit. This rugged front-end can connect up to 12 transducers, such as a binaural headset for in-vehicle recording at the user's ear positions. The front-end is battery-powered and transmits data to the iPad for recording or records directly to SD card inside the front-end, avoiding the need to use Wi-Fi. The intuitive app makes it simple to either perform basic analysis, or to replay and listen to files in order to validate recordings before exporting them for further analysis and archiving in PULSE Reflex.
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PerkinElmer Inc.
Evolved Gas Analysis (EGA) solutions couple two or more analytical technologies to greatly increase the power of analyses and save precious time by acquiring more information from a single run, creating a powerful and easy-to-use platform for materials characterization. EGA Hyphenation is a powerful tool in the analysis and identification of complex mixtures, both known and unknown, including identifying harmful chemicals in soil, quantitating components in polymers, determining leachables that may contaminate a product's packaging, identifying phthalates in PVC samples and more.
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Anton Paar GmbH
Surface analysis is a vital method for qualifying new materials in technical and biological applications. Surface charge analysis empowers users to closely monitor the surface chemistry from small particles in the nanometer range up to large wafers. Gain insights into modifications resulting from surface treatment and surface interactions with natural environments under near-ambient conditions. Get a competitive edge in optimizing existing products and developing new ones using the Anton Paar instruments which offer zeta potential measurement for a wide range of applications.
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yieldWerx Semiconductor
Gauge R&R provides an analysis technique for engineers to determine the amount of variability caused by a measurement system. For semiconductor devices to ensure that specifications can be guaranteed the repeatability and reproducibility of measurements need to be small relative to the measured specification tolerances. Primarily product and test engineers use this to assess test equipment. Yet with advanced design-for-test (DFT) based test methods which rely upon on-die circuitry to take a parametric measurement, design engineers should perform a Gauge R & R analysis to understand their on-die measurement variability.
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RAMANview -
Nanophoton Corp.
RAMANview has a dedicated optical system, which substantially expand the field-of-view. Even large samples – bigger than 800 mm2 – can be analyzed without moving the sample. Just select with the mouse of your computer the area of interest and the ultra-fast laser scanning system will do the requested analysis. Regular mapping systems take a long time; have the risk of moving the sample out of area or ? working with solutions ? even slopping it. RAMANview saves your time and provides a secure analysis of any area of interest.
